GB2332949B - Method and apparatus for localized mechanothermal analysis combined with scanning probe microscopy - Google Patents

Method and apparatus for localized mechanothermal analysis combined with scanning probe microscopy

Info

Publication number
GB2332949B
GB2332949B GB9828879A GB9828879A GB2332949B GB 2332949 B GB2332949 B GB 2332949B GB 9828879 A GB9828879 A GB 9828879A GB 9828879 A GB9828879 A GB 9828879A GB 2332949 B GB2332949 B GB 2332949B
Authority
GB
United Kingdom
Prior art keywords
mechanothermal
localized
scanning probe
probe microscopy
analysis combined
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
GB9828879A
Other versions
GB2332949A (en
GB9828879D0 (en
Inventor
Azzedine Hammiche
Hubert Murray Montague-Pollock
Michael Reading
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MONTAGUE POLLOCK HUBERT MURRAY
Original Assignee
MONTAGUE POLLOCK HUBERT MURRAY
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/178,349 external-priority patent/US6260997B1/en
Application filed by MONTAGUE POLLOCK HUBERT MURRAY filed Critical MONTAGUE POLLOCK HUBERT MURRAY
Publication of GB9828879D0 publication Critical patent/GB9828879D0/en
Publication of GB2332949A publication Critical patent/GB2332949A/en
Application granted granted Critical
Publication of GB2332949B publication Critical patent/GB2332949B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/58—SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
    • G01N25/4806—Details not adapted to a particular type of sample
    • G01N25/4826—Details not adapted to a particular type of sample concerning the heating or cooling arrangements
    • G01N25/4833—Details not adapted to a particular type of sample concerning the heating or cooling arrangements specially adapted for temperature scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/60—Investigating resistance of materials, e.g. refractory materials, to rapid heat changes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/003—Generation of the force
    • G01N2203/005—Electromagnetic means
    • G01N2203/0051—Piezoelectric means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0286—Miniature specimen; Testing on microregions of a specimen

Landscapes

  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Combustion & Propulsion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
GB9828879A 1997-12-31 1998-12-31 Method and apparatus for localized mechanothermal analysis combined with scanning probe microscopy Expired - Lifetime GB2332949B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US7014297P 1997-12-31 1997-12-31
US09/178,349 US6260997B1 (en) 1997-10-28 1998-10-23 Method and apparatus for high spatial resolution spectroscopic microscopy

Publications (3)

Publication Number Publication Date
GB9828879D0 GB9828879D0 (en) 1999-02-17
GB2332949A GB2332949A (en) 1999-07-07
GB2332949B true GB2332949B (en) 2002-01-09

Family

ID=26750827

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9828879A Expired - Lifetime GB2332949B (en) 1997-12-31 1998-12-31 Method and apparatus for localized mechanothermal analysis combined with scanning probe microscopy

Country Status (1)

Country Link
GB (1) GB2332949B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2453558A (en) * 2007-10-10 2009-04-15 Triton Technology Ltd Sample holder for a thermo-mechanical analyser
US8177422B2 (en) * 2008-08-15 2012-05-15 Anasys Instruments Transition temperature microscopy

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5356218A (en) * 1993-05-04 1994-10-18 Motorola, Inc. Probe for providing surface images
US5441343A (en) * 1993-09-27 1995-08-15 Topometrix Corporation Thermal sensing scanning probe microscope and method for measurement of thermal parameters of a specimen

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5356218A (en) * 1993-05-04 1994-10-18 Motorola, Inc. Probe for providing surface images
US5441343A (en) * 1993-09-27 1995-08-15 Topometrix Corporation Thermal sensing scanning probe microscope and method for measurement of thermal parameters of a specimen

Also Published As

Publication number Publication date
GB2332949A (en) 1999-07-07
GB9828879D0 (en) 1999-02-17

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Legal Events

Date Code Title Description
PE20 Patent expired after termination of 20 years

Expiry date: 20181230