GB2328782A

GB2328782A - System for testing hard disk drives

Info

Publication number: GB2328782A
Application number: GB9822724A
Authority: GB
Inventors: Woon-Juk Paek; Jeong-Min Kang; Dae-Geun Ryoo; Young-Bok Sung; Chang-Woo Nam
Original assignee: Samsung Electronics Co Ltd
Current assignee: Samsung Electronics Co Ltd
Priority date: 1996-05-11
Filing date: 1997-05-12
Publication date: 1999-03-03
Anticipated expiration: 2017-05-12
Also published as: GB9822724D0; GB2328782B

Abstract

A multi-testing system for a number of hard disk drives (HDDs) is described. The system includes a high temperature burn-in chamber 620 for the HDDs 644-652 and a control chamber 610, isolated from the burn-in chamber 620 by a partition wall 80, for a plurality of HDD test computers 612-618 electrically connected with the HDDs. Each test computer has a plurality of adapters 622-626 connected to it to allow data transfer between a plurality of the HDDs and the HDD test computer. A host computer 600 controls the internal environment of the burn-in chamber 620 and the HDD test computers 612-618.

Description

SYSTEM FOR TESTING HARD DISK DRIVES Background to the Invention The present invention concerns a system for testing hard disk drives (HDDs).

In the last few decades, rapid innovation in hard disk drive technology has, along with rapid progress in VLSI and software techniques, has played an important roll in the development of the modern information industry. HDD technology tends towards continual miniaturization, and the capacity of HDDs has been increased almost tenfold in terms of recording density for each decade.

To test the performance of completed HDDs in the assembly process, the manufacturing process of HDDs includes post-processes before shipping such as servo-writing, functional testing, burn-in testing and final testing to check whether the tested sets of HDDs have passed the burn-in process by being subjected to a precise defect identification and neutralization process. The burn-in process requires the longest time (usually 8 - 16 hours) in the course of manufacturing HDDs and the burn-in test is performed on racks in the burn-in room by self-diagnosis without a separate test system. Also, the burn-in process is intended to identify defects on the disks and to prearrange for them to be skipped in operation.

In conventional HDD test systems, a single HDD 20 is connected to a single test computer 10 as shown in Fig. 1 to perform various tests. When performing tests by connecting two HDDs 20 with a single test computer 10, one of two HDDs is connected as master and another HDD as slave to the test computer, whereby only one HDD is tested at a time. Besides, the construction of the HDD test system is designed so that a HDD test computer and a HDD are arranged to be incorporated together into a test chamber and a plurality of test chambers are stacked in rows and columns, so that the test chambers are positioned and properly spaced to facilitate the mounting and dismounting of HDDs.

The conventional system structure for testing HDDs is set up in a single high temperature test chamber.

However, this conventional HDD testing system has the drawback that it requires as many test computers as there are HDDs to be tested at one time, because of its one-toone connection structure between test computers and HDDs.

This gives rise to unnecessarily high production costs. In addition, the number of HDDs capable of being tested at one time is limited, resulting in a bottleneck in production.

It is a further drawback of the conventional HDD testing system that the HDD test computers are installed in the same single high temperature test chamber as the HDDs, resulting in malfunctions of the HDD test computers because of damage to their component parts.

It is an object of the present invention to provide an improved system for testing a number of HDDs.

Summary of the Invention Accordingly, one aspect of the present invention provides a multi-testing system for a number of hard disk drives (HDDs), comprising: a high temperature burn-in chamber for the HDDs; a control chamber isolated from the burn-in chamber for a plurality of HDD test computers, to be electrically connected with the HDDs; and means for controlling the internal environment of the burn-in chamber and the HDD test computers.

Preferably, the burn-in chamber is adapted to receive the HDDs stacked in orderly rows and columns.

The control chamber may be isolated from the burn-in chamber by a partition wall. Preferably, each of the HDD test computers has a plurality of test connectors for electrically connection with respective HDDs and the partition wall has a plurality of slots for connecting the burn-in chamber with the control chamber to allow the electrical connection. The test connectors may be adapted for electrical connection with their respective HDDs by means of corresponding intermediate connectors and the slots adapted to pass the intermediate connectors.

Preferably, the partition wall has a plurality of guide pins extending towards the control chamber and each test computer has corresponding guide holes adapted to engage the corresponding guide pins so that the test computer is correctly positioned against the partition wall.

The control chamber may be adapted to receive the HDD test computers in orderly rows and columns.

The means for controlling the internal environment of the burn-in chamber and the HDD test computers may comprise a host computer.

A second aspect of the present invention provides a multitesting system for a number of hard disk drives (HDDs), comprising: a host computer for controlling the testing of the HDDs; a plurality of HDD test computers for testing the HDDs and communicating the test results to the host computer; and a plurality of adapters connected to each of the HDD test computers to allow data transfer between a plurality of the HDDs and the HDD test computer, whereby each of the HDD test computers may test a plurality of said HDDs.

The said adapters may be IDE adapters.

In a system according to the second aspect of the invention, in which the said adapters are connected to HDDs, the present invention also provides a method of multi-testing the HDDs comprising: in the host computer, receiving a multi-test command, generating a test control signal and applying it to the HDD test computers; downloading a test program from the host computer to the HDD test computers so as to transfer a test command through the said adapters to the HDDs; transferring the test results through the said adapters to the HDD test computers; and reporting the test results to the host computer.

Preferably, the HDD test computers are booted up and the initial states of the HDD test computers are checked by the host computer.

The method may further include detecting a test end message from the host computer after finally reporting the test results and writing the results onto the maintenance cylinders of the HDDs tested.

Brief Description of the Drawings The present invention will now be described by way of example with reference to the accompanying drawings in which: Fig. 1 shows a conventional architecture of the HDD test system; Fig. 2 is a perspective front view of the system for testing HDDs according to the present invention; Fig. 3 is a perspective rear view of the system for testing HDDs according to the present invention; Fig. 4 is a side elevation view illustrating the internal construction of the system; Fig. 5 is an exploded perspective view illustrating a plurality of HDDs connected with a HDD test computer; Fig. 6 is a block diagram illustrating the HDD test system of Figs. 2 and 3; Fig. 7 is a block diagram illustrating the constituent routines of the internal device drivers within the HDD test computers; Fig. 8 is a block diagram illustrating the PCI (Peripheral Component Interconnect) IDE (Integrated Drive Electronics) bus master controller within the IDE adapter; Fig. 9 is a control flow chart for the host computer; and Fig. 10 is a control flow chart for a plurality of the HDD test computers.

Detailed Description of the Preferred Embodiment Referring to Figs. 2 and 3, a HDD test system 200 for multi-testing a number of HDDs of the present invention has in the front a high temperature burn-in chamber 30 in which a plurality of HDDs are stacked in rows and columns in order to efficiently test a plurality of HDDs within an optimum space, and in the rear a control chamber 40 in which a plurality of HDD test computers are arranged in rows and columns, whereby the high temperature burn-in chamber 30 and the control chamber 40 are integrally constructed, both chambers being isolated from each other by a partition wall 80.

Referring to Fig. 4, a host computer is positioned above the control chamber 40 in order to control the internal environment, i. e. temperature and humidity, of the burn-in chamber 30, and generate and apply start signals to the HDD test computers. Namely, a HDD test system of the present invention has an integral structure consisting of a burn-in chamber 30 in the front, a control chamber 40 in the rear, and a host computer above the control chamber 40. As shown in Fig. 2, an air intake 90 is provided on the lower part of the system's front door, and a plurality of air intakes with air filters and air outlets (not shown in the drawings) are provided on the system's rear door.

Referring to Fig. 4, in order to mount HDDs by arranging them in rows and columns, a plurality of HDD mounting jigs 70 are fixed in the burn-in chamber 30 by means of hollow supporting racks 31 and provided with front doors in the front. A monitor screen is installed on the upper part in front of the system, whereby the test results of the control chamber can be easily checked, and a keyboard for inputting instructions is arranged beside the monitor screen. Further, a voltage indicator is also provided on the upper part of the system, so that the operator can check the power supply.

Referring to Figs. 4 and 5, the burn-in chamber 30 and the control chamber 40 are divided by the partition wall 80.

The burn-in chamber 30 provides a test environment for testing the high temperature reliability of HDDs 60. The structure of the burn-in chamber 30 is designed to detachably mount HDDs when loading and unloading for reliability test. A plurality of HDDs 60 are stacked in rows and columns within the burn-in chamber 30 and connected with a single HDD test computer 50 in the control chamber 40. Likewise, all of the HDD test computers 50 in the control chamber 40 are each connected with a plurality of HDDs 60, so that a number of HDDs 60 can be simultaneously and efficiently tested within an optimum space.

Referring to Fig. 5, the HDDs 60 each are first placed onto the respective mounting jigs 70 which in turn are inserted together with HDDs 60 into the burn-in chamber 30 and electrically connected with the HDD test computers 50. As is apparent to those skilled in the art, the HDD mounting jigs 70 are provided internally with pogo pins 71 and outwardly with intermediate connectors 72, both being electrically connected with each other, whereby the pogo pins 71 are electrically connected with power pins and signal pins of the power connector of HDDs 60 when the HDDs are placed onto the HDD mounting jigs 70. Besides, the intermediate connectors 72 are passed through the slots 81 provided on the partition wall 80 to be connected with the test connectors 52.

Fig. 5 illustrates a HDD test unit in which a single HDD test computer 50 can test simultaneously six HDDs 60.

Namely, a HDD test computer 50'has six test connectors 52 stacked from top to bottom, and the corresponding six slots 81 are provided on the partition wall 80 for mounting and testing six HDDs 60 simultaneously. Additionally, the partition wall 80 is provided with a plurality of guide pins 82 formed on the side towards the control chamber 40, and the HDD test computer 50 is provided with corresponding guide holes 53 formed on the side toward the partition wall 80 so that the HDD test computer 50 is correctly positioned against the partition wall 80.

As shown in Fig. 4, the HDD test system 200 has heaters with blowers on the top and bottom respectively to provide the inside of the burn-in chamber 30 with high temperature environment for maintaining the proper temperature, and as mentioned above, a host computer is installed on the upper part of the control chamber 40 to control the internal environment of the burn-in chamber 30 and generate control signals for the HDD test computers 50 of the control chamber 40, and a DC power supply and a power distributor are provided under the host computer to efficiently supply power to the system.

Each HDD test computer 50 is detachably installed in the control chamber 40 and provided with a handle 51 for easily pulling out for the maintenance work. The HDD test computer 50 comprises a power supply, a main board, and a plurality of test connectors 52 arranged vertically to be connected with HDDs 60. Accordingly, the HDD test computers 50 can be efficiently and easily maintained, thereby repairing and replacing component parts.

As mentioned above, the HDDs 60 each are placed on the respective HDD mounting jigs 70 provided within the burn-in chamber 30, whereby the HDDs 60 are connected to the pogo pins 71 of the HDD mounting jigs 70 which are in turn connected to the test connectors 52 of the HDD test computer 50 by means of the intermediate connectors 72, whereby the intermediate connectors 72 passed through the slots 81 to be connected with the HDD test computer 50, which consequently guarantees the precise and convenient performance test of the HDDs 60.

Referring to Fig. 6, a host (or main) computer 600 is connected by means of first control bus 660 with a sub-computer consisting of twenty HDD test computers 612 618 each of which is in turn connected through second control bus 630 to three dual-channel IDE adapters 622, 624, 626. And the IDE adapters 622, 624, 626 each are connected with two HDDs 642 - 652 respectively. The collision detection of data transmissions between the HDD test computers 612 - 618 is controlled by the host computer 600, and the collision detection of data transmissions between three dual-channel IDE adapters 622, 624, 626 is controlled by the corresponding HDD test computers 612 618.

Therefore, the host computer 600 receives data of the test results through first control bus 660 from HDD test computers 612 - 618, and controls the temperature of both chambers 30, 40. The HDD test computers 612 - 618 are booted by receiving the booting program by means of first control bus 660 from the host computer 600, thereby controlling the IDE adapters 622, 624, 626 to output test instructions for the HDDs, and executes the inner device driver program (not shown in the drawing) to play a mediator roll executing instructions and transferring information for the tested HDDs. The IDE adapters 622, 624, 626 are a kind of bus master elements to perform data transfer operations independently of the control of the internal CPU. Accordingly, the data transfer between the HDD test computer 612 - 618 and the HDDs to be tested can be performed at high speed.

Referring to Fig. 7, now will be described in detail the internal constituent module of the device driver program which exists within the HDD test computer 612 - 618 and plays a mediator roll executing instructions and transferring information between the HDD test computer and the HDDs to be tested.

Referring to Fig. 7, the constituent routines of the internal device driver program consist of seven routines, i.e. a interrupt service routine 730, a driver branching routine 740, a driver initialization routine 750, a channel selection routine 760, a channel state check routine 770, a testing routine 780, and a channel reset routine 790.

These routines are stored in the HDD of the host computer and transferred to the memories of the HDD test computers when initializing the test program, and executed by the HDD test computers.

Accordingly, the driver initialization routine 750 initializes the drivers under the control of the CPU within the HDD test computer. After the interrupt service routine 730 receives an interrupt output from any one of the channels CH1 - CH6 corresponding to respective three IDE adapters 622, 624, 626, the interrupt service routine 730 is executed by the CPU of the HDD test computer. The driver branching routine 740 branches the test instructions transferred from the memory of the HDD test computer so as to transfer the corresponding instructions to the lower execution modules such as the channel selection routine 760, the channel state check routine 770, the testing routine 780, and the channel reset routine 790 respectively.

Besides, the lower execution routine, i.e. the channel selection routine 760, checks the HDD test computer when executing the driver initialization routine to inform the driver initialization routine 750 of the channel numbers of the mounted IDE adapters 622, 624, 626. Also, the channel state check routine 770 checks the state of the channel selected by the channel selection routine 760. The testing routine 780 is a module transferring the actual test instruction to any channel selected by the channel selection routine 760. Lastly, the channel reset module 790 is a routine for resetting the erroneous channel.

Consequently, the device driver play a mediator roll for executing instructions and transferring information between the HDD test computer and the HDDs to be tested.

Referring to Fig. 8, the PCI IDE bus master controller within the IDE adapter consists of read/write controller 830, 860, a PCI bus interface 800, a PCI configuration part 840, FIFO memories 810, 870, and an arbitration circuit 850, and HDD interfaces 820, 880.

The PCI bus interface 800 performs the interfacing of the PCI bus connecting between each of the HDD test computers 612 - 618 and the IDE adapter 626, thereby sending and receiving the selected transmission data corresponding to its own address. The PCI configuration part 840 initializes the internal configuration of the IDE adapter 626 at first when the HDD test computer loads the device driver 720 to execute the test program. The first and second FIFO memories 810, 870 each are intended for the HDDs to be tested respectively. The FIFO memories are the memories for compensating for the processing speed difference between the HDD test computers 612 - 618 and the testing HDDs. The first and second read/write controls 830, 860 each are intended for the HDDs to be tested respectively, and the initial configuration of the read/write controls 830, 860 is set by the PCI configuration part 840. The read/write controls 830, 860 control the first and second FIFO memories 810, 870 and check the state of the first and second HDD interface 820, 880.

The first and second HDD interfaces 820, 880 perform the interfacing through the bus between the IDE adapter 626 and the HDDs to be tested under the control of the first and second read/write controls 830, 860. And the HDD interfaces 820, 880 transfer the test instruction from the HDD test computers 612 - 618 to the HDDs to be tested, and the test results to the first and second FIFO memories 810, 870.

Lastly, the arbitration circuit 850 determines the priority of the first or second read/write controls 830, 860 in order to prevent the collision of data sent/received to and from the first and second interfaces.

Consequently, by designing IDE adapters having the same structure and operation as above mentioned, the IDE adapters can perform the above data transfer operation independently of the control of the internal CPU of the HDD test computer 612 - 618. Accordingly, the data transfer between the HDD test computer 612 - 618 and the HDDs to be tested can be performed in high speed.

The control flow of the HDD test system of the present invention will be now described in detail with reference to Figs. 6 - 8. Referring to Fig. 9, at first in steps 900 902, the host computer is booted, and the communication network is established. Thereafter in steps 904 - 906, the host computer boots up twenty HDD test computers 612 - 618 and execute its own host program. In steps 908 - 910, the host computer establishes communication channels with each of twenty HDD test computers 612 - 618 respectively and checks the initial state of each of the HDD test computers 612 - 618, i.e. the booting state and the loading state of the internal device drivers of each of the HDD test computers 612 - 618, and the operating state of three IDE adapters 622, 624, 626.

Thereafter in steps 912 - 914, the host computer 600 displays the checked initial status on the monitor, and has the operator select the model of the HDD to be tested. In step 916, the host computer 600 has the operator select the model selection key so that the HDD test computers 612 618 select corresponding test model respectively. In steps 918 - 920, the host computer 600 checks any specific message from the HDD test computers 612 - 618, and when detecting any specific message, checks whether it is the test end message. At this time, when detecting the test end message, the host computer 600 proceeds to step 928 to display the subsequent test results transferred from the HDD test computers 612 - 618 on the monitor.

Besides, in steps 918 - 920, when detecting any specific message other than the test end message transferred from the HDD test computers 612 - 618, the host computer 600 checks in step 922 whether it is error message. At this time, when an error message is detected then, in step 924, the host computer 600 checks and compares the number of error messages detected with the preset threshold value, and if the number of error messages detected so far exceeds the preset threshold value, the host computer 600 performs the steps 926 - 928.

However, if the specific message detected in step 922 is not an error message, or when checked in step 924, if the number of error messages is less than the preset threshold value, the host computer 600 returns to the step 918 after executing the operation corresponding to the specific message in step 930 and repeats the steps from 918 forth again. Referring to Fig. 10, the control flow chart concerned is intended for any one of the HDD test computers 612 - 618 because they follow the same control flow.

In steps 1000 - 1002, the host computer 600 boots up the HDD test computer and initializes the test program stored in the internal memory 710 (see Fig. 7) of the HDD test computer. Thereafter, in step 1004, the HDD test computer loads the interrupt service routine 730, the driver branching routine 740, and the driver initialization routine 750. And then in steps 1006 - 1008, the HDD test computer transfers the current loading state of its own device drivers in response to the state checking request from the host computer 600. In step 1010, the HDD test computer executes the actual HDD test mode and checks whether the test channels CH1 - CH6 each are loaded with respective HDDs to be tested.

In step 1012, when the test channels CH1 - CH6 are loaded with HDDs, the HDD test computer downloads the test program stored in the internal HDD of the host computer. In steps 1014 - 1016, the HDD test computer executes the channel selection routine760, the channel state check routine 770, the testing routine 780, and the channel reset routine 790 inside of the device driver 710 and then transfers the test result data to the host computer 600. At this time, the HDD test computer checks the state of the selected channel by means of the channel state check routine 770 and then selects one of the instruction codes within the testing routine 780 to execute the selected code. Accordingly, the instruction code to be executed is transferred through three IDE adapters 622, 624, 626 to the HDD to be tested under the control of the internal device driver of the HDD test computer.

Thereafter in step 1018, the HDD test computer checks whether the test end message is received from the host computer 600. When detecting the test end message, in step 1024 - 1026, the HDD test computer records the test result on the maintenance cylinder (storage area) of the tested HDD. Finally in step 1026, the HDD test computer checks whether the tested HDD is detached and returns to the step 1010 after ascertaining that the tested HDD is detached, thereby repeating the testing steps when another HDD is loaded.

Besides in step 1018, when missing the test end message from the host computer 600, the HDD test computer proceeds to the step 1020, thereby selecting and executing another instruction code within the testing routine 780 and then returns to the step 1014 to repeat subsequent steps.

However in step 1020, when missing another instruction code to be selected for execution, the HDD test computer proceeds to the step 1022 to transfer the test termination message to the host computer 600 and then performs steps 1024 - 1026.

In conclusion, in the HDD test system of the present invention, a host computer 600 can accommodate twenty HDD test computers 612 -618 each of which in turn is connected with three IDE adapters 222, 224, 226, and each of three IDE adapters 222, 224, 226 is further connected with two HDDs for testing, so that a single host computer 600 can test 120 HDDs simultaneously. Accordingly, the HDD testing capacity of the present invention is greatly improved, comparing with the conventional method.

As mentioned above, the present invention has the advantages of considerably increased test efficiency and that a number of hard disk drives can be simultaneously tested in a minimum space and time. Accordingly, the present invention can provide a highly reliable and efficient HDD test system with low manufacturing costs.

Claims

CLAIMS:

1. A multi-testing system for a number of hard disk drives (HDDs), comprising: a host computer for controlling the testing of the HDDs; a plurality of HDD test computers for testing the HDDs and communicating the test results to the host computer; and a plurality of adapters connected to each of the HDD test computers to allow data transfer between a plurality of the HDDs and the HDD test computer, whereby each of the HDD test computers may test a plurality of said HDDs.

2. A system according to claim 1 in which the said adapters are IDE adapters.

3. A multi-testing system for a number of hard disk drives substantially as described with reference to and/or as illustrated in FIGs. 2 et seq. of the accompanying drawings.

4. In a system according to claim 1 or claim 2 in which the said adapters are connected to HDDs, a method of multitesting the HDDs comprising: in the host computer, receiving a multi-test command, generating a test control signal and applying it to the HDD test computers; downloading a test program from the host computer to the HDD test computers so as to transfer a test command through the said adapters to the HDDs; transferring the test results through the said adapters to the HDD test computers; and reporting the test results to the host computer.

5. A method according to claim 4 in which the HDD test computers are booted up and the initial states of the HDD test computers are checked by the host computer.

6. A method according to claim 5 further including detecting a test end message from the host computer after finally reporting the test results and writing the results onto the maintenance cylinders of the HDDs tested.

7. A multi-testing system for a number of hard disk drives (HDDs), comprising: a high temperature burn-in chamber for the HDDs; a control chamber isolated from the burn-in chamber for a plurality of HDD test computers, to be electrically connected with the HDDs; and means for controlling the internal environment of the burn-in chamber and the HDD test computers.

8. A system according to claim 7 in which the burn-in chamber is adapted to receive the HDDs stacked in orderly rows and columns.

9. A system according to claim 7 or claim 8 in which the control chamber is isolated from the burn-in chamber by a partition wall.

10. A system according to any of claims 7,8 or 9 in which each of the HDD test computers has a plurality of test connectors for electrically connection with respective HDDs and the partition wall has a plurality of slots for connecting the burn-in chamber with the control chamber to allow the electrical connection.

11. A system according to claim 10 in which the test connectors are adapted for electrical connection with their respective HDDs by means of corresponding intermediate connectors and the slots are adapted to pass the intermediate connectors.

12. A system according to any one of claims 9-11 in which the partition wall has a plurality of guide pins extending towards the control chamber and each test computer has corresponding guide holes adapted to engage the corresponding guide pins so that the test computer is correctly positioned against the partition wall.

13. A system according to any of claims 7 to 12 in which the control chamber is adapted to receive the HDD test computers in orderly rows and columns.

14. A system according to any of claims 8 to 13 in which the means for controlling the internal environment of the burn-in chamber and the HDD test computers comprises a host computer.

15. A method of multi-testing a number of hard disk drives substantially as described with reference to and/or as illustrated in FIGs. 2 et seq. of the accompanying drawings.