GB2317990A - Mounting components in hybrid integrated circuit modules - Google Patents

Mounting components in hybrid integrated circuit modules Download PDF

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Publication number
GB2317990A
GB2317990A GB9800491A GB9800491A GB2317990A GB 2317990 A GB2317990 A GB 2317990A GB 9800491 A GB9800491 A GB 9800491A GB 9800491 A GB9800491 A GB 9800491A GB 2317990 A GB2317990 A GB 2317990A
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United Kingdom
Prior art keywords
integrated circuit
hybrid integrated
chip component
circuit module
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB9800491A
Other versions
GB2317990B (en
GB9800491D0 (en
Inventor
Nagahisa Furutani
Nobutoshi Fukuden
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
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Filing date
Publication date
Priority claimed from JP6001549A external-priority patent/JPH07211856A/en
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Publication of GB9800491D0 publication Critical patent/GB9800491D0/en
Publication of GB2317990A publication Critical patent/GB2317990A/en
Application granted granted Critical
Publication of GB2317990B publication Critical patent/GB2317990B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • H05K3/3494—Heating methods for reflowing of solder

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)

Abstract

A hybrid integrated circuit module in which circuit components, including semiconductor devices and chip components, are integrated on an integrated circuit substrate, and wherein: at least one electrode (31) on which a particular chip component (30) is mounted is formed to have a projecting electrode portion (32) extending towards another electrode (31) on which the same chip component (30) is mounted. The chip component (30) can be removed from the electrodes (31) by applying a single source of heat such as a soldering iron to the projecting electrode portions (32).

Description

HYBRID INTEGRATED CIRCUIT MODULE The present invention relates to a hybrid integrated circuit module.
In recent years, various types of hybrid integrated circuits have been developed and commercialized for applications ranging from lowfrequency to microwave ranges, as can be found in 50 XHz to 1000 Hz bands CATV amplifiers, portable 800 MHz to 1000 MHz band telephone transmitter amplifiers, 1 GHz or higher microwave amplifiers, etc.
To achieve general use of such hybrid integrated circuits, it is imperative to improve the reliability of the hybrid integrated circuit modules in which the hybrid integrated circuits are contained.
According to prior art hybrid integrated circuit modules, such as the one disclosed in U.S.
Patent 4,965,526, an alumina substrate is used as the hybrid integrated circuit substrate, on which semiconductor devices, such as Si transistors or GaAs FETs, chip resistors, thin-film resistors, chip capacitors, chip inductors, transformers, etc. are mounted.
Further, for enhanced reliability, the entire hybrid integrated circuit is covered with plastic, whic is tilen sealed with a resin.
Furthermore, in the prior art hybrid integrated circuit module, electrodes, on which circuit components are soldered, are @@rl@d in the shapes tha @@@@ @@ shapes of the @nd @@ @@@t component@ This construction that involves forming the electrodes, to which the circuit components are attached, in the shapes that match the shapes of the individual circuit components, has the problem that mass production efficiency is reduced since, of the circuit components, chip components are the most difficult to remove.
That is, when it becomes necessary to replace a resistance-adjusting chip component, etc. after mounting because it does not provide the prescribed resistance value, etc., for example, the mounting portions of the chip component are heated and unsoldered using a soldering iron. The problem here is that heating the two ends at the same time is not an easy job, hence the difficulty in removing the chip component.
In such cases, previous methods for removing the chip component have been by heating the two portions at the same time by using two soldering irons or a special soldering iron having a bifurcated soldering head.
In accordance with a first aspect of the present invention there is provided a hybrid integrated circuit module in which circuit components, including semiconductor devices and chip components, are integrated on an integrated circuit substrate, and wherein: at least one electrode on which a particular chip component is mounted is formed to have a projecting electrode portion to approach another electrode on which the chip component is mounted.
Preferably, an electrode on which a chip component for adjustment is mounted is formed to have a projecting electrode portion, other than a component mounting portion, projecting in such a manner as to approach the other electrode on which the chip component is mounted.
Thus in integrated circuit modules of particular embodiments of the present invention, the electrodes on which chip components provided for bias current adjustment for semiconductor devices are mounted, and the electrodes on which chip components provided for impedance matching adjustment are mounted, are each formed to have a projecting electrode portion, other than a component mounting portion, projecting in such manner as to approach the other electrode on which the same chip component is mounted; therefore, when there arises a need to replace any of these chip components, the projecting electrode portion can be heated simultaneously with the other electrode using an ordinary soldering iron, which greatly facilitates chip component replacement and thus serves to increase the mass production efficiency.
As described, according to embodiments of the present invention, a novel integrated circuit module which has high reliability, is well suited for mass production and is inexpensive to manufacture, can be realised.
According to a second aspect of the present invention there is provided a method of removing the particular chip component of the first aspect of the invention from the electrodes on which it is mounted, comprising applying a single source of heat to the projecting portion of said at least one electrode and to the adjacent part of the other electrode.
For a better understanding of the invention and to show how the same may be carried into effect, reference will now be made, purely by way of example, to the accompanying drawings, in which: Fig. 1A is an exploded perspective view showing the construction of a prior art hybrid integrated circuit module; Fig. 1B is a vertical sectional view showing the construction of a prior art hybrid integrated circuit module; Fig. 2 is a top plan view illustrating electrical parts on a circuit board of the prior art; Fig. 3A is a side elevational view, partly in cross section, showing the basic construction of a hybrid integrated circuit module to which the present invention may be applied. This particular basic construction is described and claimed in parent patent application 9425843.1 (2285709) from which the present patent application is divided; Fig. 3B is a plan view of the hybrid integrated circuit module shown in Fig. 3A; Fig. 3C is a side elevational view, partly in cross section, showing a modified construction of the hybrid integrated circuit module of Fig. 3A; Fig. 4 is an exploded perspective view showing the construction of one example of a hybrid integrated circuit module to which the present invention may be applied; Fig. 5A is a perspective view showing the construction of the hybrid integrated circuit module of Fig. 4 with certain parts omitted; Fig. 5B is a vertical sectional view taken in the direction of the arrows substantially along the line v-V of Fig. SA; Fig. 6 is a plan view showing one embodiment of a component arrangement mounted on a substrate of the hybrid integrated circuit module of Fig. 5A; Fig. 7 is an enlarged partial plan view showing a modified embodiment of a component arrangement on the enclosure of Fig. 6; Fig. 8 is an enlarged partial plan view showing another modified embodiment of component arrangement on the enclosure of Fig. 6; Fig. 9A is a partial circuit diagram of the component mounted on the enclosure of Fig. 7; Fig. 9B is a partial circuit diagram of the component mounted on the enclosure of Fig. 8; Fig. 10A shows partial plan views showing a conventional electrode configuration and one example of an improved electrode configuration according to the present invention; Fig. 10B shows partial plan views showing a conventional electrode configuration and another example of an improved electrode configuration according to the present invention; Fig. llA is a partial plan view showing a replacement process for chip component mounted on the electrode of Fig. 10A; Fig. 11B is a partial plan view showing a replacement process for chip component mounted on the electrode of Fig. 10B; Fig. 12 is a partial plan view of the left side of the substrate of the hybrid integrated circuit module of Fig. 6 showing an improved electrode configuration according to the present invention; Fig. 13 is a partial plan view of the right side of the substrate of the hybrid integrated circuit module of Fig. 6 showing an improved electrode configuration according to the present invention; Fig. 14 is a plan view of the substrate of the hybrid integrated circuit module showing a conventional electrode configuration; Fig. 15A is a partial plan view of the left upper part of the substrate of Fig. 6 showing an improved electrode configuration according to the present invention; Fig. 15B is a partial plan view of the right upper part of the substrate of Fig. 6 showing an improved electrode configuration according to the present invention; and Fig. 15C is a partial plan view of the center lower part of the substrate of Fig. 6 showing an improved electrode configuration according to the present invention.
Before describing the preferred embodiments, an explanation will be given of the conventional hybrid integrated circuit module shown in Figs. 1A to 2.
Figure 1A is an exploded perspective view showing the construction of a prior art hybrid integrated circuit module. In Fig. 1A, reference 2 denotes a heatsinking body, 3A denotes a hybrid integrated circuit substrate made of alumina, 4A denotes a plastic cover of the hybrid integrated circuit substrate 3A, and 6 denotes a mounting hole. The hybrid integrated circuit substrate 3A made of alumina is mounted on the heatsinking body 2, and it is covered by the plastic cover 4A.
Figure 1B is a vertical sectional view showing the construction of a prior art hybrid integrated circuit module of Fig. 1A. Circuit components are mounted on the alumina substrate 3A, and the entire hybrid integrated circuit is covered with the plastic cover 4A, willcil is then sealed with i resln 9 for n 9 f 0 r e i h a n ce d I dhl 1 1 tV .
However, the construction that involves covering the entire hybrid integrated circuit with plastic cover 4A and sealing it with a resin 9, as in the prior art, has the problem of degradation of the semiconductor device reliability in the long term because of insufficient hermeticity.
Further, when the substrate of the hybrid integrated circuit is made of alumina which has a good thermal conductivity, it is surely advantageous for sinking the heat generated by the circuit components mounted on the substrate. However, not only is the alumina substrate itself expensive, but the interconnection pattern has to be formed by gold plating, thereby making the hybrid integrated circuit module very expensive to manufacture.
Figure 2 is a top plan view illustrating electrical parts on a substrate 3A of the prior art. In Fig. 2, C denotes chip capacitors, E denotes an electrode, S denotes semiconductor devices, such as Si transistors and GaAs FETs, T denotes transformers, and cross hatching denotes thin-film resistors. As shown in Fig. 2, in the prior art hybrid integrated circuit module, electrodes, to which circuit components are mounted, are formed in the shapes that match the shapes of the individual circuit components.
However, the construction that involves forming the electrodes, to which the circuit components are attached, in the shapes that match the shapes of the individual circuit components, as in the prior art, has the problem that mass production efficiency is reduced since chip components are then difficult to remove.
That is, when it becomes necessary to replace a mounted resistance-adjusting chip component, etc.
because it does not provide the prescribed resistance value, etc., for example, the mounting portions of the ch,p corll"onent are heated and the solder melted using a t;olderlnq Iron. 'I'hs problem he r e 1 5 that heatlnc, the too portions at the same time is not an easy job, hence the difficulty in removing the chip component.
Figures 3A and 3B show the basic construction of one type of hybrid integrated circuit module to which the present invention may be applied. Figure 3A is a side elevation view, partly in cross section, and Fig. 3B is a top plan view of the hybrid integrated circuit module shown in Fig.
3A; As shown in the Figs 3A and 3B, the hybrid integrated circuit module is comprised of a hybrid integrated circuit substrate 1, a heatsinking substrate 2, a base plate 3, and a cover 4, and the base plate 3 and the cover 4 together form an enclosure 5. The hybrid integrated circuit substrate 1 is made of a glass epoxy-based material and is bonded onto the heat-sinking substrate 2 made of aluminum or the like. A center portion of the hybrid integrated circuit substrate 1 is cut out to provide an opening 1A.
The base plate 3 made of a material having high thermal/electrical conductivity, such as a Kovar (Fe Ni-Cr-Co alloy), is bonded to the heat-sinking substrate 2 through the opening 1A. The cover 4 is made of the same material as the base plate and is bonded, by soldering, to seal the top space of the base plate 3 and to provide grounding.
In the above construction, the cover 4 and the base plate 3 are bonded together for sealing in a nitrogen atmosphere, and the base plate 3 and cover 4 together form an enclosure 5 in which a nitrogen gas is hermetically sealed. In the figure, the numeral 6 indicates a mounting hole formed through the heatsinking substrate 2.
Figure 3C shows a modified construction of the hybrid integrated circuit module of Fig. 3A. In this embodiment, a shallow ditch 3B is formed on the heat slnklng substrate 2.
Fi ccu re 4 is an exploded perspective view showing the construction of one example of a hybrid integrated circuit module to which the present invention may be applied. The hybrid integrated circuit module of this embodiment is comprised of a hybrid integrated circuit substrate 1 having an opening 1A at the center portion thereof, a heat-sinking substrate 2 having mounting holes 6, a base plate 3 made of a Kovar, a first enclosure wall 41, a second enclosure wall 42, and an enclosure lid 43. The hybrid integrated circuit substrate 1 is made of a glass epoxy-based material and is bonded onto the heatsinking substrate 2 made of aluminum or the like. The base plate 3 having high thermal and electrical conductivities is bonded to the heat-sinking substrate 2 through the opening 1A. The cover 4 is comprised of the first wall 41, the second wall 42, and the lid 43 which are made of the same material as the base plate. The first wall 41, the second wall 42, and the lid 43 are stacked on the base plate 3 and are connected by soldering to seal the top of the base plate 3 and to form an enclosure 5 therein.
Figure 5A is a perspective view showing the construction of the-hybrid integrated circuit module of Fig. 4 wherein the second wall 42 and the lid 43 are omitted, and Fig. 5B is a vertical sectional view taken in the direction of the arrows substantially along the line V-V of Fig. 5A. Interconnection leads 14 and 15 arc for electrically connecting the enclosure 5 and the outside thereof. Circuit components which generate heat are arranged on the base plate 3. Through holes 1B for attaching pins 1C are provided on an edge portion of the hybrid integrated circuit substrate 1.
Figure 6 shows one embodiment of component arrangement mounted on a substrate of the hybrid Integrated circuit module of Fig. 5A. In F19.6, the portion 7 indicates a joint face on the first wall 41 as l l lustrated i n Fig. 5A and SB.
According to this embodiment, all the semiconductor devices 10, 11, 12, 13 for the hybrid integrated circuit substrate 1 are accommodated inside the enclosure 5. A plurality of interconnection leads 14 are provided on the joint face 7 of the first wall 41 for signal transfer between the semiconductor devices 10, 11, 12, 13 and other circuit components mounted on the substrate 1, and a pair of interconnection leads 15 are also provided on the joint face 7 of the first wall 41 to enable test operating voltages from the semiconductor devices 10, 11, 12,13 to be tested from outside the enclosure 5. These interconnection leads 14 and 15 are electrically insulated from the enclosure 5.
Thus, the hybrid integrated circuit substrate 1 shown in Fig. 6 is shown to have all the semiconductor devices 10, 11, 12, 13 mounted on the hybrid integrated circuit substrate 1 ---- accommodated inside the enclosure 5, while other circuit components, such as a signal divider 16, a signal combiner 17, and impedance converters 18, 19, are mounted on the hybrid integrated circuit 1.
In accordance with the above construction, the hybrid integrated circuit module that that contains the hybrid integrated circuit substrate 1 shown in Fig. 6 is constructed to seal only the semiconductor devices 10, 11, 12, and 13. That is, the entire hybrid integrated circuit is not sealed.
Therefore, sufficient hermeticity can be accomplished by constructing the enclosure 5 from a metallic material or the like, thus making it possible to prevent degradation of the characteristics of the semiconductor devices 10, 11, 12, and 13, thereby attaining high reliability.
Further, since the hybrid integrated circuit substrate 1 is constructed US 1 using an Inexpensive glass epoxy-bttsed material that allows the interconnection pattern t. cc be wormed by copper plating, the construction is inexpensive to manufacture.
Figure 7 shows a modified embodiment of the component arrangement on the enclosure 5. The hybrid integrated circuit substrate 1 in this embodiment shown in Fig. 7 has a following features: (1) All the semiconductor devices 10, 11, 12, and 13 mounted on the hybrid integrated circuit substrate 1 are accommodated inside the enclosure 5; (2) A bias resistor 20 and a grounding capacitor 21 for the semiconductor device 10 are disposed inside the enclosure 5 in close proximity to the semiconductor device 10; and (3) A bias resistor 22 and a grounding capacitor 23 for the semiconductor device 12 are disposed inside the enclosure 5 in close proximity to the semiconductor device 12.
Figure 9A is a partial circuit diagram of the component mounted on the enclosure 5 of Fig. 7.
The above construction prevents the formation of parasitic capacitance and inductance, and therefore, ensures the proper performance of the semiconductor devices 10 and 12.
Figure 8 shows another modified embodiment of component arrangement mounted on the enclosure portion of Fig. 6. The hybrid integrated circuit substrate 1 in this embodiment shown in Fig. 8 has the following features: (1) All the semiconductor devices 10, 11, 12, and 13 mounted on the hybrid integrated circuit substrate 1 are accommodated inside the enclosure 5; (2) The bias resistors provided for the semiconductor device 11, including the bias resistor 24 of which a high voltage withstanding capability is required, are disposed inside the enclosure 5; (3) The trimming bias resistor 25 of which a high voltage-withstanding capability is not renju1red 1s disposed out.s Slde the enclosure 5; (4) The bias resistors provided for the semiconductor device 13, including the bias resistor 26 of which a high voltage withstanding capability is required, are disposed inside the enclosure 5; and (5) The trimming bias resistor 27 of which a high voltage withstanding capability is not required is disposed outside the enclosure 5.
In Fig. 8, reference 28 denotes a grounding capacitor for the semiconductor device 11, disposed inside the enclosure 5, and 29 denotes a grounding capacitor for the semiconductor device 13, also disposed inside the enclosure 5. Figure 9B is a partial circuit diagram of the components mounted on the enclosure 5 of Fig. 8.
This construction allows the large amount of heat generated by the bias resistors 24 and 26 to be conducted to the heat-sinking substrate 2 (not shown in Fig. 8) via the enclosure 5, thus achieving the cooling of the bias resistors 24 and 26, while permitting the adjustment of the bias current with the trimming bias resistors 25 and 27 disposed outside the enclosure 5.
In the hybrid integrated circuit module, as can be seen from the embodiment shown in Fig. 8, chip resistors, chip capacitors, or chip inductors, once soldered, may be removed for replacement for bias current or impedance matching adjustment.
In the present invention, to facilitate such replacement work, an electrode 31, on which a chip component 30 for adjustment is mounted, is formed to have a projecting electrode portion 32 as shown in Figs.
10A and 10B. The projecting electrode portion 32 is formed at least for one electrode 31 in such a manner as to approach the other electrode 31 on which the same chip component 30 is mounted. In Figs. 10A and 10B, a conventional electrode configuration is shown on the right side and an example of improved electrode configuration according to t the present Invention 1: shown on the left side.
According to this construction, when the chip component 30 for adjustment needs replacing, a pair of projecting electrode portion 32 (as shown in Fig. 11A) or the projecting electrode portion 32 and the nearest electrode 31 (as shown in Fig. 11B) are heated together by a soldering iron 33. As a result, the solder is melted by the heat conducted via the projecting electrode portion 32 and the chip component 30 can be easily removed.
In a specific example, if resistor R3, resistor R6, resistor R17, and resistor R18 are designated parts for adjustment in the substrate construction shown in Figs.12 and 13, for example, each of the electrodes 31 on which the resistor R3, resistor R6, resistor R17, and resistor R18 are mounted is formed to have a projecting electrode portion as shown by references 32A and 32B in Fig. 12 and by references 32C and 32D in Fig. 13. These projecting electrode portion 32A to 32D are formed in such a manner as to approach the other electrode 31 on which the same chip component 30 is mounted.
Figure 14 is a substrate of a hybrid integrated circuit module showing a prior art electrode configuration. In the prior art of Fig. 14, electrodes 31 are formed to match the shapes of chip components.
For example the electrode 31 around a chip inductance L2, chip resistors R54 and R58, and a chip capacitor C62 are formed in square shapes to match the shapes of the chip components.
Contrary to this, in the present invention, if the chip components L2, R54, R58, and C2 are the designated parts for adjustment, for example, one or each of the electrodes 31, on which the inductance L2, resistor R54, resistor R58, and capacitor C62 are mounted, is formed to have a projecting electrode portions 32E, 32F, 32C, and 32H, as shown In Figs . 1 SA , 15B, and 15C. The projecting electrode port ions 32E, 32E, 3 2G , crici - formed in such a manner as to approach the other electrode 31 on which the same chip component is mounted As described above, instead of sealing the entire hybrid integrated circuit, only the semiconductor devices to be integrated need be sealed; therefore, by forming the enclosure from a metallic material or the like7 sufficient hermeticity can be accomplished, thus making it possible to prevent degradation of the semiconductor device performance, thereby attaining high reliability.
In this construction, to cope with the large heat generation by the bias resistors provided for the semiconductor devices, the bias resistors that can generate a large amount of heat are mounted inside the enclosure formed in contact with the heat-sinking substrate, thereby accomplishing the dissipation of the heat; on the other hand, the bias resistors for adjustment that do not generate much heat are mounted on the hybrid integrated circuit substrate outside the enclosure, to permit the adjustment of the bias current.
The above construction also allows the use of a glass epoxy-based hybrid integrated circuit substrate that has low thermal conductivity which in turn improves the soldering performance and contributes to increased mass production efficiency. Furthermore, since the glass epoxy-based hybrid integrated circuit substrate is by itself inexpensive and allows the formation of the interconnection pattern by copper plating, the construction is inexpensive to manufacture.
Furthermore, according to the present invention, replacement of chip components for adjustment is extremely easy, which also contributes to increased volume production efficiency.
Thus, in accordance with the described cemodim-ccs, an integrated circuit module having high reliability, well suited for mass production, and I c)Cxpons ivo to nuictur cn be can be reallzed.

Claims (10)

CLAIMS:
1. A hybrid integrated circuit module in which circuit components, including semiconductor devices and chip components, are integrated on an integrated circuit substrate, and wherein: at least one electrode on which a particular chip component is mounted is formed to have a projecting electrode portion to approach another electrode on which the same chip component is mounted.
2. A hybrid integrated circuit module according to claim 1, wherein each of two electrodes on which said particular chip component is mounted is formed to have a projecting electrode portion as aforesaid, whereby the two projecting electrode portions approach one another.
3. A hybrid integrated circuit module according to claim 1 or 2, wherein said particular chip component is soldered to said electrodes on which it is mounted.
4. A hybrid integrated circuit module according to any one of the preceding claims, wherein said particular chip component has an adjustment function.
5. A hybrid integrated circuit module according to claim 4, whereIn said particular chip component has a bias current adjustment function for a semiconductor device.
6. A hybrid integrated circuit module according to claim 4, wherein said particular chip component has an impedance matching adjustment function.
7. A method of removing the particular chip component of any one of claims 1 to 6 from the electrodes on which it is mounted, comprising applying a single source of heat to the projecting portion of said at least one electrode and to the adjacent part of the other electrode.
8. A method according to claim 7, wherein said single source of heat is a single soldering iron.
9. A hybrid integrated circuit module according to claim 1, and wherein the or each projecting electrode portion is substantially as hereinbefore described with reference to the left-hand side of Figure lOA or lOB of the accompanying drawings.
10. A method of removing the particular chip component according to claim 7, and substantially as hereinbefore described with reference to Figure llA or llB of the accompanying drawings.
GB9800491A 1994-01-12 1994-12-21 Hybrid integrated circuit module Expired - Lifetime GB2317990B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP6001549A JPH07211856A (en) 1994-01-12 1994-01-12 Integrated circuit module
GB9425843A GB2285709B (en) 1994-01-12 1994-12-21 Hybrid integrated circuit module

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GB9800491D0 GB9800491D0 (en) 1998-03-04
GB2317990A true GB2317990A (en) 1998-04-08
GB2317990B GB2317990B (en) 1998-08-12

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2189934A (en) * 1986-03-04 1987-11-04 Seikosha Kk Circuit block
WO1994005038A1 (en) * 1992-08-21 1994-03-03 Olin Corporation Metal electronic package incorporating a multi-chip module

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2189934A (en) * 1986-03-04 1987-11-04 Seikosha Kk Circuit block
WO1994005038A1 (en) * 1992-08-21 1994-03-03 Olin Corporation Metal electronic package incorporating a multi-chip module

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GB9800491D0 (en) 1998-03-04

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