GB2276043A - Contact probe for testing electrical equipment - Google Patents
Contact probe for testing electrical equipment Download PDFInfo
- Publication number
- GB2276043A GB2276043A GB9304266A GB9304266A GB2276043A GB 2276043 A GB2276043 A GB 2276043A GB 9304266 A GB9304266 A GB 9304266A GB 9304266 A GB9304266 A GB 9304266A GB 2276043 A GB2276043 A GB 2276043A
- Authority
- GB
- United Kingdom
- Prior art keywords
- probe
- contact probe
- contact
- manufacturing
- probes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/0675—Needle-like
Abstract
A contact probe for use in testing apparatus for printed circuit boards and the like, wherein the probe is formed completely integrally. The probe has a milled tip 16, a turned shaft 14 and a shaped head 12 and is produced from a single piece of material eg. beryllium copper or mild steel with rhodium plated over nickel or gold plated over nickel. <IMAGE>
Description
IMPROVEMENTS IN AND RELATING TO CONTACT
PROBES FOR USE IN ELECTRICAL TESTING EOUIPMENT
This invention relates to rigid contact probes used for electrical testing requirements in a variety of applications.
In particular, such probes are used in testing bare or loaded printed circuit boards, wire-wrapped back-planes, and other circuitries where a number of contact points must be accessed.
Prior art contact probes are extremely complicated in design and construction, and involve complicated methods of manufacturing.
It is an object of the present invention to overcome one or more of the above problems.
In accordance with the invention, a contact probe for use in testing apparatus for printed circuit boards and the like is completely integral, and in particular formed from one piece of material.
In accordance with another aspect of the invention, a contact probe for use in testing apparatus for printed circuit boards and the like comprises firstly milling the tip of the probe, secondly turning the shaft of the probe, thirdly form generating the head of the probe, and finally cutting the probe to form the resultant product.
Such a probe made in accordance with the invention is relatively simple to make, and is of solid, rigid construction.
Suitably the pin is made from Beryllium Copper or mild steel, and preferably the probe is formed using a single spindle
Swiss type lathe.
Probes made in accordance with the invention can be made much quicker than prior art probes, and suitably such probes in accordance with the invention are produced approximately 100 per hour, and can be made upto 200 per hour.
The invention will now be described by way of example with reference to the accompanying drawings in which:
Figure 1 shows a side view of a contact probe in
accordance with the invention; and
Figure 2 shows an end view of the contact probe
shown in Figure 1.
The rigid contact probe 10 shown in the drawings is completely integral, and in particular, is made of a single material, preferably Beryllium Copper or mild steel.
Suitably the contact probe is rhodium plated over nickel (or gold plated over nickel).
The probe comprises a head portion 12, a shaft portion 14 and a tip portion 15. The head and shaft diameters vary in size from small to large to meet standard and surface mount requirements, whilst the tips can be either Dome, Tripoint, Cup, Waffle, Pyramid or Conical shape.
The probe is used for bare board testing as well as surface mount testing in testing apparatus for printed circuit boards and the like.
Suitably a probe made in accordance with the invention is made according to the following steps, namely milling the tip 16, turning the shaft portion 14, form generating the head 12, and cutting the probe 10 to effect the final product.
These four steps are very quick and compared to prior
art, it makes it more efficient and easier to produce such probes. In
particular, 100 probes hour can be made, and preferably upto 200
probes per hour can be made, since the probes are made from a
single material, and are thus integral, rigid and solid in construction.
Claims (9)
1. A contact probe for use in testing apparatus for printed circuit boards and the like, wherein the probe is formed completely integrally.
2. A contact probe as claimed in claim 1, wherein the probe is formed of a single piece of material.
3. A contact probe as claimed in claim 1 or claim 2, wherein the probe comprises a tip portion; a shaft portion; and a head portion.
4. A method of manufacturing a contact probe for use in testing apparatus for printed circuit boards and the like comprising the steps of : forming a tip in the probe by milling; forming a shaft in the probe by turning; and forming a head in the probe by form generating.
5. A method of manufacturing a contact probe as claimed in claim 4, further comprising the step of finishing the probe by cutting.
6. A method of manufacturing a contact probe as claimed in claim 4 or claim 5, wherein the probe is formed of a single piece of material.
7. A method of manufacturing a contact probe as claimed in any one of claims 4-6, wherein the probes are manufactured at a rate of between 100 and 200 per hour.
8. A contact probe substantially as herein described with reference to the accompanying drawings.
9. A method of manufacturing a contact probe substantially as herein described with reference to the accompanying drawings.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB9304266A GB2276043A (en) | 1993-03-03 | 1993-03-03 | Contact probe for testing electrical equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB9304266A GB2276043A (en) | 1993-03-03 | 1993-03-03 | Contact probe for testing electrical equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| GB9304266D0 GB9304266D0 (en) | 1993-04-21 |
| GB2276043A true GB2276043A (en) | 1994-09-14 |
Family
ID=10731348
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB9304266A Withdrawn GB2276043A (en) | 1993-03-03 | 1993-03-03 | Contact probe for testing electrical equipment |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB2276043A (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3562643A (en) * | 1969-01-21 | 1971-02-09 | Ostby & Barton Co | Spring loaded test probe assembly |
| GB1568166A (en) * | 1976-06-21 | 1980-05-29 | Ibm | Electrical contactor |
| EP0127005A2 (en) * | 1983-05-03 | 1984-12-05 | Siemens Nixdorf Informationssysteme Aktiengesellschaft | Test-lead point for a testing apparatus for examining printed-circuit boards |
| EP0256541A2 (en) * | 1986-08-19 | 1988-02-24 | Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung | Contacting device |
| US4897043A (en) * | 1986-06-23 | 1990-01-30 | Feinmetall Gmbh | Resilient contact pin |
| US4980638A (en) * | 1989-05-26 | 1990-12-25 | Dermon John A | Microcircuit probe and method for manufacturing same |
| US5134364A (en) * | 1990-06-19 | 1992-07-28 | Prime Computer, Inc. | Elastomeric test probe |
| US5171290A (en) * | 1991-09-03 | 1992-12-15 | Microelectronics And Computer Technology Corporation | Testing socket for tab tape |
-
1993
- 1993-03-03 GB GB9304266A patent/GB2276043A/en not_active Withdrawn
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3562643A (en) * | 1969-01-21 | 1971-02-09 | Ostby & Barton Co | Spring loaded test probe assembly |
| GB1568166A (en) * | 1976-06-21 | 1980-05-29 | Ibm | Electrical contactor |
| EP0127005A2 (en) * | 1983-05-03 | 1984-12-05 | Siemens Nixdorf Informationssysteme Aktiengesellschaft | Test-lead point for a testing apparatus for examining printed-circuit boards |
| US4897043A (en) * | 1986-06-23 | 1990-01-30 | Feinmetall Gmbh | Resilient contact pin |
| EP0256541A2 (en) * | 1986-08-19 | 1988-02-24 | Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung | Contacting device |
| US4980638A (en) * | 1989-05-26 | 1990-12-25 | Dermon John A | Microcircuit probe and method for manufacturing same |
| US5134364A (en) * | 1990-06-19 | 1992-07-28 | Prime Computer, Inc. | Elastomeric test probe |
| US5171290A (en) * | 1991-09-03 | 1992-12-15 | Microelectronics And Computer Technology Corporation | Testing socket for tab tape |
Also Published As
| Publication number | Publication date |
|---|---|
| GB9304266D0 (en) | 1993-04-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |