GB2258051B - Test system - Google Patents

Test system

Info

Publication number
GB2258051B
GB2258051B GB9115992A GB9115992A GB2258051B GB 2258051 B GB2258051 B GB 2258051B GB 9115992 A GB9115992 A GB 9115992A GB 9115992 A GB9115992 A GB 9115992A GB 2258051 B GB2258051 B GB 2258051B
Authority
GB
United Kingdom
Prior art keywords
test system
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9115992A
Other versions
GB9115992D0 (en
GB2258051A (en
Inventor
Richard Pye
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Diagnostic Solutions Ltd
Original Assignee
Genrad Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Genrad Ltd filed Critical Genrad Ltd
Priority to GB9115992A priority Critical patent/GB2258051B/en
Publication of GB9115992D0 publication Critical patent/GB9115992D0/en
Priority to JP4198260A priority patent/JPH06138181A/en
Publication of GB2258051A publication Critical patent/GB2258051A/en
Priority to US08/146,989 priority patent/US5471136A/en
Application granted granted Critical
Publication of GB2258051B publication Critical patent/GB2258051B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/3193Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937Timing aspects, e.g. measuring propagation delay
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2882Testing timing characteristics
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/31725Timing aspects, e.g. clock distribution, skew, propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
GB9115992A 1991-07-24 1991-07-24 Test system Expired - Fee Related GB2258051B (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
GB9115992A GB2258051B (en) 1991-07-24 1991-07-24 Test system
JP4198260A JPH06138181A (en) 1991-07-24 1992-07-24 Test system
US08/146,989 US5471136A (en) 1991-07-24 1993-11-02 Test system for calculating the propagation delays in signal paths leading to a plurality of pins associated with a circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9115992A GB2258051B (en) 1991-07-24 1991-07-24 Test system

Publications (3)

Publication Number Publication Date
GB9115992D0 GB9115992D0 (en) 1991-09-11
GB2258051A GB2258051A (en) 1993-01-27
GB2258051B true GB2258051B (en) 1995-04-05

Family

ID=10698907

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9115992A Expired - Fee Related GB2258051B (en) 1991-07-24 1991-07-24 Test system

Country Status (2)

Country Link
JP (1) JPH06138181A (en)
GB (1) GB2258051B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0622636A1 (en) * 1993-04-29 1994-11-02 International Business Machines Corporation Method for improving accuracy tester auto-calibration
JP4849016B2 (en) * 2007-06-19 2011-12-28 横河電機株式会社 Device test equipment

Also Published As

Publication number Publication date
GB9115992D0 (en) 1991-09-11
JPH06138181A (en) 1994-05-20
GB2258051A (en) 1993-01-27

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19990724