GB2253277B - Programmable logic device decoder - Google Patents

Programmable logic device decoder

Info

Publication number
GB2253277B
GB2253277B GB9103112A GB9103112A GB2253277B GB 2253277 B GB2253277 B GB 2253277B GB 9103112 A GB9103112 A GB 9103112A GB 9103112 A GB9103112 A GB 9103112A GB 2253277 B GB2253277 B GB 2253277B
Authority
GB
United Kingdom
Prior art keywords
programmable logic
logic device
device decoder
decoder
programmable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9103112A
Other versions
GB2253277A (en
GB9103112D0 (en
Inventor
Peter Hor-Richardson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UK Secretary of State for Defence
Original Assignee
UK Secretary of State for Defence
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UK Secretary of State for Defence filed Critical UK Secretary of State for Defence
Priority to GB9103112A priority Critical patent/GB2253277B/en
Publication of GB9103112D0 publication Critical patent/GB9103112D0/en
Publication of GB2253277A publication Critical patent/GB2253277A/en
Application granted granted Critical
Publication of GB2253277B publication Critical patent/GB2253277B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
GB9103112A 1991-02-14 1991-02-14 Programmable logic device decoder Expired - Fee Related GB2253277B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB9103112A GB2253277B (en) 1991-02-14 1991-02-14 Programmable logic device decoder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9103112A GB2253277B (en) 1991-02-14 1991-02-14 Programmable logic device decoder

Publications (3)

Publication Number Publication Date
GB9103112D0 GB9103112D0 (en) 1991-04-03
GB2253277A GB2253277A (en) 1992-09-02
GB2253277B true GB2253277B (en) 1995-05-10

Family

ID=10690008

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9103112A Expired - Fee Related GB2253277B (en) 1991-02-14 1991-02-14 Programmable logic device decoder

Country Status (1)

Country Link
GB (1) GB2253277B (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4539517A (en) * 1982-12-07 1985-09-03 Burroughs Corporation Method for testing an integrated circuit chip without concern as to which of the chip's terminals are inputs or outputs
US4544882A (en) * 1982-12-07 1985-10-01 Burroughs Corporation Apparatus for testing an integrated circuit chip without concern as to which of the chip's terminals are inputs or outputs
US4571724A (en) * 1983-03-23 1986-02-18 Data I/O Corporation System for testing digital logic devices

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4539517A (en) * 1982-12-07 1985-09-03 Burroughs Corporation Method for testing an integrated circuit chip without concern as to which of the chip's terminals are inputs or outputs
US4544882A (en) * 1982-12-07 1985-10-01 Burroughs Corporation Apparatus for testing an integrated circuit chip without concern as to which of the chip's terminals are inputs or outputs
US4571724A (en) * 1983-03-23 1986-02-18 Data I/O Corporation System for testing digital logic devices

Also Published As

Publication number Publication date
GB2253277A (en) 1992-09-02
GB9103112D0 (en) 1991-04-03

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19970214