GB2226643B - Device testing apparatus and method - Google Patents

Device testing apparatus and method

Info

Publication number
GB2226643B
GB2226643B GB8829921A GB8829921A GB2226643B GB 2226643 B GB2226643 B GB 2226643B GB 8829921 A GB8829921 A GB 8829921A GB 8829921 A GB8829921 A GB 8829921A GB 2226643 B GB2226643 B GB 2226643B
Authority
GB
United Kingdom
Prior art keywords
testing apparatus
device testing
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
GB8829921A
Other versions
GB8829921D0 (en
GB2226643A (en
Inventor
Roger James Williamson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STC PLC
Nortel Networks Optical Components Ltd
Original Assignee
STC PLC
Northern Telecom Europe Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STC PLC, Northern Telecom Europe Ltd filed Critical STC PLC
Priority to GB8829921A priority Critical patent/GB2226643B/en
Publication of GB8829921D0 publication Critical patent/GB8829921D0/en
Priority to FR8916569A priority patent/FR2641145A1/fr
Publication of GB2226643A publication Critical patent/GB2226643A/en
Application granted granted Critical
Publication of GB2226643B publication Critical patent/GB2226643B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/22Measuring piezoelectric properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01HMEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H9/00Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
GB8829921A 1988-12-22 1988-12-22 Device testing apparatus and method Expired - Lifetime GB2226643B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB8829921A GB2226643B (en) 1988-12-22 1988-12-22 Device testing apparatus and method
FR8916569A FR2641145A1 (en) 1988-12-22 1989-12-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8829921A GB2226643B (en) 1988-12-22 1988-12-22 Device testing apparatus and method

Publications (3)

Publication Number Publication Date
GB8829921D0 GB8829921D0 (en) 1989-02-15
GB2226643A GB2226643A (en) 1990-07-04
GB2226643B true GB2226643B (en) 1992-11-18

Family

ID=10648935

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8829921A Expired - Lifetime GB2226643B (en) 1988-12-22 1988-12-22 Device testing apparatus and method

Country Status (2)

Country Link
FR (1) FR2641145A1 (en)
GB (1) GB2226643B (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2069152A (en) * 1980-01-28 1981-08-19 Post Office Integrated circuit testing
WO1987007028A2 (en) * 1986-05-16 1987-11-19 Bell Communications Research, Inc. High speed laser probe
GB2192067A (en) * 1986-06-16 1987-12-31 Nat Res Dev Testing electrical material and components
EP0264481A1 (en) * 1986-10-23 1988-04-27 International Business Machines Corporation Testing method for integrated circuit packaging boards using a laser in vacuum

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2069152A (en) * 1980-01-28 1981-08-19 Post Office Integrated circuit testing
WO1987007028A2 (en) * 1986-05-16 1987-11-19 Bell Communications Research, Inc. High speed laser probe
GB2192067A (en) * 1986-06-16 1987-12-31 Nat Res Dev Testing electrical material and components
EP0264481A1 (en) * 1986-10-23 1988-04-27 International Business Machines Corporation Testing method for integrated circuit packaging boards using a laser in vacuum

Also Published As

Publication number Publication date
GB8829921D0 (en) 1989-02-15
GB2226643A (en) 1990-07-04
FR2641145A1 (en) 1990-06-29

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20071222