GB2195028B - Automatic test equipment - Google Patents

Automatic test equipment

Info

Publication number
GB2195028B
GB2195028B GB8722959A GB8722959A GB2195028B GB 2195028 B GB2195028 B GB 2195028B GB 8722959 A GB8722959 A GB 8722959A GB 8722959 A GB8722959 A GB 8722959A GB 2195028 B GB2195028 B GB 2195028B
Authority
GB
United Kingdom
Prior art keywords
bus
equipment
controller
test equipment
automatic test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB8722959A
Other versions
GB8722959D0 (en
GB2195028A (en
Inventor
John Jervis Comfort
Paul Alan Hayter
Dinesh Kargathra
Brian Robert Mason
Graham Norman Turner
Ian Robert Fisher
John William Bailey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mars Inc
Original Assignee
Mars Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB838331558A external-priority patent/GB8331558D0/en
Priority claimed from GB848409794A external-priority patent/GB8409794D0/en
Priority claimed from GB08429657A external-priority patent/GB2150696B/en
Application filed by Mars Inc filed Critical Mars Inc
Priority to GB8722959A priority Critical patent/GB2195028B/en
Publication of GB8722959D0 publication Critical patent/GB8722959D0/en
Publication of GB2195028A publication Critical patent/GB2195028A/en
Application granted granted Critical
Publication of GB2195028B publication Critical patent/GB2195028B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Bus Control (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Debugging And Monitoring (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

Equipment for testing electrical circuits includes a programmable controller based upon a microcomputer (1) and selected interface modules (20-29 Fig. 1B) which can be plugged into the controller in any of a number of interconnection locations and in any combination of module types with the controller being adapted to interrogate the modules as to their function and location, and to organize its routines accordingly. A bus structure includes a data bus, a module identification bus, analogue stimulus and measurement buses, and a synchronisation bus, and allows resource sharing within the equipment. <IMAGE>
GB8722959A 1983-11-25 1987-09-30 Automatic test equipment Expired GB2195028B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB8722959A GB2195028B (en) 1983-11-25 1987-09-30 Automatic test equipment

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB838331558A GB8331558D0 (en) 1983-11-25 1983-11-25 Automatic test equipment
GB848409794A GB8409794D0 (en) 1984-04-16 1984-04-16 Testing apparatus
GB08429657A GB2150696B (en) 1983-11-25 1984-11-23 Automatic test equipment
GB8722959A GB2195028B (en) 1983-11-25 1987-09-30 Automatic test equipment

Publications (3)

Publication Number Publication Date
GB8722959D0 GB8722959D0 (en) 1987-11-04
GB2195028A GB2195028A (en) 1988-03-23
GB2195028B true GB2195028B (en) 1988-09-01

Family

ID=27449516

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8722959A Expired GB2195028B (en) 1983-11-25 1987-09-30 Automatic test equipment

Country Status (1)

Country Link
GB (1) GB2195028B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5066909A (en) * 1990-01-30 1991-11-19 Hewlett-Packard Company Apparatus for testing an electronic circuit having an arbitrary output waveform
US5343144A (en) * 1991-02-28 1994-08-30 Sony Corporation Electronic device
US6363437B1 (en) 1999-01-07 2002-03-26 Telefonaktiebolaget Lm Ericsson (Publ) Plug and play I2C slave
US6925516B2 (en) * 2001-01-19 2005-08-02 Raze Technologies, Inc. System and method for providing an improved common control bus for use in on-line insertion of line replaceable units in wireless and wireline access systems
CN110907693B (en) * 2019-12-10 2022-02-01 航天新长征大道科技有限公司 Compact peripheral interconnection bus board card
CN116859894B (en) * 2023-08-08 2024-04-02 南京航空航天大学 Automatic test method for helicopter internal electronic regulator based on multi-agent technology

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3733587A (en) * 1971-05-10 1973-05-15 Westinghouse Electric Corp Universal buffer interface for computer controlled test systems
US3854125A (en) * 1971-06-15 1974-12-10 Instrumentation Engineering Automated diagnostic testing system
FR2405607A1 (en) * 1977-10-10 1979-05-04 Cit Alcatel ELECTRICAL CONTROL SYSTEM
US4397021A (en) * 1981-06-15 1983-08-02 Westinghouse Electric Corp. Multi-processor automatic test system

Also Published As

Publication number Publication date
GB8722959D0 (en) 1987-11-04
GB2195028A (en) 1988-03-23

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19931123