GB2181630B - Method for the non destructive testing of parts of non homogeneous material - Google Patents

Method for the non destructive testing of parts of non homogeneous material

Info

Publication number
GB2181630B
GB2181630B GB08617437A GB8617437A GB2181630B GB 2181630 B GB2181630 B GB 2181630B GB 08617437 A GB08617437 A GB 08617437A GB 8617437 A GB8617437 A GB 8617437A GB 2181630 B GB2181630 B GB 2181630B
Authority
GB
United Kingdom
Prior art keywords
parts
destructive testing
homogeneous material
non destructive
non homogeneous
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB08617437A
Other versions
GB8617437D0 (en
GB2181630A (en
Inventor
Manfred Hentschel
Rolf Hosemann
Axel Lange
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Erno Raumfahrttechnik GmbH
Original Assignee
Erno Raumfahrttechnik GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Erno Raumfahrttechnik GmbH filed Critical Erno Raumfahrttechnik GmbH
Publication of GB8617437D0 publication Critical patent/GB8617437D0/en
Publication of GB2181630A publication Critical patent/GB2181630A/en
Application granted granted Critical
Publication of GB2181630B publication Critical patent/GB2181630B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB08617437A 1984-11-17 1985-05-07 Method for the non destructive testing of parts of non homogeneous material Expired GB2181630B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19843442061 DE3442061A1 (en) 1984-11-17 1984-11-17 METHOD FOR DESTRUCTION-FREE TESTING INHOMOGENIC MATERIALS

Publications (3)

Publication Number Publication Date
GB8617437D0 GB8617437D0 (en) 1986-08-28
GB2181630A GB2181630A (en) 1987-04-23
GB2181630B true GB2181630B (en) 1989-01-11

Family

ID=6250539

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08617437A Expired GB2181630B (en) 1984-11-17 1985-05-07 Method for the non destructive testing of parts of non homogeneous material

Country Status (5)

Country Link
EP (1) EP0201507A1 (en)
JP (1) JPS62500802A (en)
DE (1) DE3442061A1 (en)
GB (1) GB2181630B (en)
WO (1) WO1986003005A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9335282B2 (en) 2012-04-02 2016-05-10 Rigaku Corporation X-ray topography apparatus
US9336917B2 (en) 2009-07-01 2016-05-10 Rigaku Corporation X-ray apparatus, method of using the same and X-ray irradiation method

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4430615C2 (en) * 1994-08-17 1998-04-02 Deutsches Elektronen Synchr Method and device for imaging powder diffractometry
US6704390B2 (en) * 2000-05-29 2004-03-09 Vladimir Kogan X-ray analysis apparatus provided with a multilayer mirror and an exit collimator
JP5081556B2 (en) * 2007-09-28 2012-11-28 株式会社リガク X-ray diffraction measurement apparatus equipped with a Debye-Scherrer optical system and X-ray diffraction measurement method therefor

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2805341A (en) * 1954-07-12 1957-09-03 Andrew R Lang Diffractometer
US2887585A (en) * 1955-05-17 1959-05-19 Philips Corp X-ray diffraction method and apparatus
US3160749A (en) * 1962-10-19 1964-12-08 Philips Corp Spectrometer with novel plural crystal arrangement
DE2933047C2 (en) * 1979-08-16 1982-12-30 Stoe & Cie. GmbH, 6100 Darmstadt Method and device of X-ray diffraction

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9336917B2 (en) 2009-07-01 2016-05-10 Rigaku Corporation X-ray apparatus, method of using the same and X-ray irradiation method
US9335282B2 (en) 2012-04-02 2016-05-10 Rigaku Corporation X-ray topography apparatus

Also Published As

Publication number Publication date
JPS62500802A (en) 1987-04-02
GB8617437D0 (en) 1986-08-28
DE3442061C2 (en) 1990-12-20
EP0201507A1 (en) 1986-11-20
DE3442061A1 (en) 1986-05-28
WO1986003005A1 (en) 1986-05-22
GB2181630A (en) 1987-04-23

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee