GB2172726B - Testing programmable logic arrays - Google Patents

Testing programmable logic arrays

Info

Publication number
GB2172726B
GB2172726B GB08601718A GB8601718A GB2172726B GB 2172726 B GB2172726 B GB 2172726B GB 08601718 A GB08601718 A GB 08601718A GB 8601718 A GB8601718 A GB 8601718A GB 2172726 B GB2172726 B GB 2172726B
Authority
GB
United Kingdom
Prior art keywords
programmable logic
logic arrays
testing programmable
testing
arrays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB08601718A
Other versions
GB8601718D0 (en
GB2172726A (en
Inventor
Richard John Illman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Services Ltd
Original Assignee
Fujitsu Services Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Services Ltd filed Critical Fujitsu Services Ltd
Publication of GB8601718D0 publication Critical patent/GB8601718D0/en
Publication of GB2172726A publication Critical patent/GB2172726A/en
Application granted granted Critical
Publication of GB2172726B publication Critical patent/GB2172726B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
    • H03K19/173—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components
    • H03K19/177—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components arranged in matrix form
    • H03K19/17704—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components arranged in matrix form the logic functions being realised by the interconnection of rows and columns
    • H03K19/17708—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components arranged in matrix form the logic functions being realised by the interconnection of rows and columns using an AND matrix followed by an OR matrix, i.e. programmable logic arrays
GB08601718A 1985-03-23 1986-01-24 Testing programmable logic arrays Expired GB2172726B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB858507611A GB8507611D0 (en) 1985-03-23 1985-03-23 Testing programmable logic arrays

Publications (3)

Publication Number Publication Date
GB8601718D0 GB8601718D0 (en) 1986-02-26
GB2172726A GB2172726A (en) 1986-09-24
GB2172726B true GB2172726B (en) 1988-03-23

Family

ID=10576532

Family Applications (2)

Application Number Title Priority Date Filing Date
GB858507611A Pending GB8507611D0 (en) 1985-03-23 1985-03-23 Testing programmable logic arrays
GB08601718A Expired GB2172726B (en) 1985-03-23 1986-01-24 Testing programmable logic arrays

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB858507611A Pending GB8507611D0 (en) 1985-03-23 1985-03-23 Testing programmable logic arrays

Country Status (1)

Country Link
GB (2) GB8507611D0 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8626517D0 (en) * 1986-11-06 1986-12-10 Int Computers Ltd Testing programmable logic arrays
GB8626516D0 (en) * 1986-11-06 1986-12-10 Int Computers Ltd Testing programmable logic arrays
CN106354045B (en) * 2016-11-15 2018-09-25 中国电子科技集团公司第四十一研究所 Microwave electric mechanical switch control system and microwave switch Auto-Test System

Also Published As

Publication number Publication date
GB8601718D0 (en) 1986-02-26
GB2172726A (en) 1986-09-24
GB8507611D0 (en) 1985-05-01

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee