GB2165709A - Interface adaptor arrangement for programmable automatic test equipment - Google Patents

Interface adaptor arrangement for programmable automatic test equipment Download PDF

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Publication number
GB2165709A
GB2165709A GB08419320A GB8419320A GB2165709A GB 2165709 A GB2165709 A GB 2165709A GB 08419320 A GB08419320 A GB 08419320A GB 8419320 A GB8419320 A GB 8419320A GB 2165709 A GB2165709 A GB 2165709A
Authority
GB
United Kingdom
Prior art keywords
conductor tracks
equipment
interface
plane
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB08419320A
Other versions
GB8419320D0 (en
Inventor
John Russell Jefferies
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Crystalate Electronics Ltd
Original Assignee
Crystalate Electronics Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Crystalate Electronics Ltd filed Critical Crystalate Electronics Ltd
Priority to GB08419320A priority Critical patent/GB2165709A/en
Publication of GB8419320D0 publication Critical patent/GB8419320D0/en
Publication of GB2165709A publication Critical patent/GB2165709A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R29/00—Coupling parts for selective co-operation with a counterpart in different ways to establish different circuits, e.g. for voltage selection, for series-parallel selection, programmable connectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0286—Programmable, customizable or modifiable circuits
    • H05K1/029—Programmable, customizable or modifiable circuits having a programmable lay-out, i.e. adapted for choosing between a few possibilities
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10227—Other objects, e.g. metallic pieces
    • H05K2201/10287—Metal wires as connectors or conductors
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/17—Post-manufacturing processes
    • H05K2203/173—Adding connections between adjacent pads or conductors, e.g. for modifying or repairing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/22—Secondary treatment of printed circuits
    • H05K3/222—Completing of printed circuits by adding non-printed jumper connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

An interface adaptor arrangement is provided for programmable automatic test equipment for electronic apparatus whereby the equipment is adaptable for testing a variety of electronic components or modules. The arrangement comprises a printed circuit board (1) with conductor tracks (2, 3) at first and second planes. A socket (5) on the board (1) receives and electrically connects to conductor tracks (2) at the first plane, a component or module to be tested. A first portion (8) of a multiple-contact connector is attached to the board (1) and connected to conductor tracks (3) at the second plane. A second portion of the connector, mateable with the first portion (8), is mounted on the test equipment, and wired to terminals in interface connectors in the equipment (15). Conductive links, e.g. soldered wires, provided in apertures (4) in the board (1) interconnect selected conductor tracks (2, 3) in a desired configuration, whereby signals in a test programme are transmitted between the equipment (15) and the component or module under test. <IMAGE>

Description

SPECIFICATION Interface adaptor arrangement for component testing equipment This invention relates to programmable automatic test equipment for electronic apparatus and more particularly to an interface adaptor arrangement for such equipment whereby the latter is adaptable for testing a variety of electronic components or modules.
Programmable automatic test equipment for electronic apparatus is well known. Such equipment is generally microprocessor supervised and is commercially available, examples being products from A.T.E. Systems Ltd having the trade names Beaver 3 and Beaver Major. In typical equipment, an interface panel is provided on which it is intended that the user should mount a holder or socket adapted for receiving the particular electronic apparatus to be tested. A number of multi-way interface connectors (e.g. five 100-way connectors) are included in the equipment, comprising multiway jack sockets into which fit matching plugs on the interface panel. Connecting lead wires are provided between these plugs on the panel and terminals in the holder or socket for the apparatus to be tested. The interface panel may be hinged to a housing for the test equipment.Such equipment is particularly suitable for testing apparatus of one particular type because in the normal mode of operation the interface panel is arranged to provide physical mounting and electrical connection for the particular apparatus being tested. Generally a separate purpose built interface panel is required for each type of apparatus to be tested. This may not be disadvantageous when only one or two different types of apparatus are required to be handled, but requirements exist to employ the equipment for testing electronic components or modules of various types, sizes and configurations. The components may, for example, comprise resistors, capacitors or inductors, and networks involving these, and the modules may include integrated circuits and hybrid devices.The test equipment of the prior art is unsatisfactory for accommodating such components or modules because of the need to provide a range of interface panels adapted to receive each different type, size and configuration of compcnents or modules to be tested. The provision of such a range of panels is expensive and their interchange on the equipment may be unacceptably time consuming and inconvenient.
It is an object of the present invention to overcome these disadvantages by providing an interface adaptor arrangement for automatic test equipment suitable for facilitating the handling of a range of electronic components or modules to be tested.
The present invention provides an interface adaptor arrangement for programmable automatic test equipment for electronic apparatus whereby said equipment is adaptable for testing a variety of electronic components or modules, said arrangement comprising: a printed circuit board provided with conductor tracks at first and second planes thereof; means on said circuit board for receiving and electrically connecting to conductor tracks provided at said first plane of said board a component or module to be tested; a multiple-contact connector comprising first and second mateable portions, said first portion being attached to said circuit board and electrically connected to conductor tracks provided at said second plane thereof, said second portion being attached to a surface of said equipment, contacts in said second portion being electrically connected to selected terminals in one or more interface connectors provided on or in said equipment; means for interconnecting selected conductor tracks at said first plane to selected conductor tracks at said second plane in a desired configuration, whereby electrical signals in a test programme may be transmitted between said interface connectors in said test equipment and said component or module under test.
Conveniently said first and second planes at which said conductor tracks are provided comprise opposite major faces of said circuit board.
Suitably the said means for interconnecting said selected conductor tracks at said first plane to said selected conductor tracks at said second plane comprise electrically conductive links, e.g. wires, pins, plugs, rivets or eyelets located in apertures through the said circuit board.
The said second portion of said multiplecontact connector is conveniently secured to an interface panel provided on a housing for the said test equipment. The invention is now described by way of example with reference to the accompanying drawings in which: Figure 1 represents a plan view of conductive tracks on a first major face of a printed circuit board employed in an interface adaptor arrangement according to the invention.
Figure 2 represents a plan view of conductive tracks on a second major face of the printed circuit board of Figure 1, Figure 3 represent a plan view of conductive tracks on first and second faces of the printed circuit board of Figures 1 and 2, in which the printed circuit board material has been shown as if it were transparent, to illustrate the positional relationship between the conductive tracks on the two faces.
Figure 4 represents a top plan view of programmable automatic test equipment provided with a portion of a multiple-contact connector to be mated with a corresponding portion of a connector on the circuit board of Figure 3 to provide an interface adaptor arrangement according to the invention.
A printed circuit board is prepared using well known techniques and comprising an electrically insulating board 1, e.g. of glassfilled epoxy material, having on a first major face a pattern 2 of electrically conductive tracks, e.g. of copper, (Figure 1) and on a second major face, a pattern 3 of electrically conductive tracks (Figure 2). The positional relationship of the patterns 2 and 3 to one another on opposite faces of the board 1 is illustrated in Figure 3. A matrix of holes is provided through the circuit board 1 in selected regions, shown typically by reference numeral 4 in Figure 3 where conductive tracks in pattern 2 directly overlie conductor tracks in pattern 3 on opposite faces of the board 1.
These holes 4 are adapted to receive conductive links (not shown), which may comprise soldered wires, or pins, plugs, rivets or eyelets, such that by selective insertion of the links, conductive tracks in pattern 2 are electrically connected to conductive tracks in pattern 3, in a desired configuration.
A socket 5 for receiving an electronic component or module to be tested is mounted on the first major face of the board 1 with terminals thereon connected to rows of terminal regions 6 and 7 (Figure 3) of the pattern of conductive tracks on the circuit board. Provision is made on the board for connecting various types and sizes of socket 5 according to the sort of component or module to be tested. A multiple-contact (e.g. 96-way) connector is provided comprising first and second mateable portions. A first portion 8 of the connector, is mounted on the second major face of the circuit board with terminals secured through holes 9 (Figure 1) in the circuit board, and is electrically connected, e.g. by soldering, to rows of terminal regions 10, 11, 12 provided on the pattern 3 of conductive tracks on the second major face of the circuit board.A second portion 13 (Figure 4) of the connector, which is mateable with the first portion 8, is mounted on an interface panel 14 of commercially available programmable automatic test equipment 15, an example of such equipment being Beaver Major (trade name) supplied by A.T.E. Systems Ltd. Contacts 16 in the portion 13 of the connector are electrically wired to selected terminals in interface connectors 17, 18, 19, 20, 21 provided as part of the equipment 15.
In use, the two portions 8 and 13 of the multiple-contact connector are mated together and a component or module to be tested is inserted in the socket 5. The aforementioned conductive links are provided in appropriate holes 4 in the circuit board 1 to provide connections between selected tracks on opposite sides of the board 1 and achieve required interconnections between the portion 8 of the connector and appropriate terminals of the component or module in the socket 5. The automatic test equipment 15 (Figure 4) is programmed in conventional manner whereby electrical signals in a test programme for the component or module are transmitted between the interface connectors 17 to 21 in the equipment 15 and the component or module in the socket 5.
Other configurations of component or module can be tested by providing alternative arrangements of the conductive links in different sets of holes 4.
By separating the two portions 8 and 13 of the multiple-contact connector, the printed circuit board 1 can be quickly and readily exchanged for another carrying a different type of socket 5, or another type of component or module to be tested.
Mounting and connecting arrangements can readily be provided on the printed circuit board to enable 'surface mounted' components or modules to be tested if required.
By providing a suitable software package for the equipment, standard and non-standard analog and digital integrated circuit modules are able to be tested with minimal operator intervention.
By providing a suitable dual-in-line switch arrangement (not shown) or appropriate wire links (not shown) at rows 22, 23 of holes through the printed circuit board 1, and connected to the conductive tracks on the board, a binary number can be effectively set to identify each particular circuit board. The test equipment 15 can be programmed to execute a search to ascertain the particular circuit board involved in a test operation, on the basis of the binary code.
If required, one or more active circuits may be connected to the printed circuit board 1 at terminals 24 of the conductive tracks in order to allow any unusual test requirements to be accommodated.

Claims (6)

1. An interface adaptor arrangement for programmable automatic test equipment for electronic apparatus whereby said equipment is adaptable fcr testing a variety of electronic components or modules, said arrangement comprising: a printed circuit board prcvided with conductor tracks at first and second planes thereof; means on said circuit board for receiving and electrically connecting to conductor tracks provided at said first plane of said board a component or module to be tested; a multiple-contact connector comprising first and second mateable portions, said first portion being attached to said circuit bcard and electrically connected to conductor tracks provided at said second plane thereof, said second portion being attached to a surface of said equipment, contacts in said second portion being electrically connected to selected terminals in cne or more interface connectors provided on or in said equipment; means for interconnecting selected conductor tracks at said first plane to selected conductor tracks at said second plane in a desired configuration, whereby electrical signals in a test programme may be transmitted between said interface connectors in said test equipment and said component or module under test.
2. An interface adaptor arrangement according to claim 1, in which said first and second planes at which said conductor tracks are provided comprise opposite major faces of said circuit board.
3. An interface adaptor arrangement according to claim 1 or 2, in which the said means for interconnecting said selected conductor tracks at said first plane to said selected conductor tracks at said second plane comprise electrically conductive links, located in apertures through the said circuit board.
4. An interface adaptcr arrangement according to claim 3, in which said electrically conductive links are selected from wires, pins, plugs, rivets, or eyelets.
5. An interface adaptor arrangement acccrding to any preceding claim, in which said second portion of said multiple-contact connector is secured to an interface panel provided on a housing for the said test equipment.
6. An interface adaptor arrangement for programmable automatic test equipment, constructed and arranged substantially as hereinbefore described with reference to the accompanying drawings.
GB08419320A 1984-07-28 1984-07-28 Interface adaptor arrangement for programmable automatic test equipment Withdrawn GB2165709A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB08419320A GB2165709A (en) 1984-07-28 1984-07-28 Interface adaptor arrangement for programmable automatic test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08419320A GB2165709A (en) 1984-07-28 1984-07-28 Interface adaptor arrangement for programmable automatic test equipment

Publications (2)

Publication Number Publication Date
GB8419320D0 GB8419320D0 (en) 1984-08-30
GB2165709A true GB2165709A (en) 1986-04-16

Family

ID=10564626

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08419320A Withdrawn GB2165709A (en) 1984-07-28 1984-07-28 Interface adaptor arrangement for programmable automatic test equipment

Country Status (1)

Country Link
GB (1) GB2165709A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0404940A1 (en) * 1988-04-28 1991-01-02 Fanuc Ltd. Memory testing system
EP0526922A2 (en) * 1991-07-10 1993-02-10 Schlumberger Technologies, Inc. Modular board test system having wireless receiver

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2115989A (en) * 1982-02-12 1983-09-14 Voltmace Limited Programmed cartridge/video machine adaptor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2115989A (en) * 1982-02-12 1983-09-14 Voltmace Limited Programmed cartridge/video machine adaptor

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0404940A1 (en) * 1988-04-28 1991-01-02 Fanuc Ltd. Memory testing system
EP0404940A4 (en) * 1988-04-28 1992-03-25 Fanuc Ltd Memory testing system
EP0526922A2 (en) * 1991-07-10 1993-02-10 Schlumberger Technologies, Inc. Modular board test system having wireless receiver
EP0526922A3 (en) * 1991-07-10 1994-05-18 Schlumberger Technologies Inc Modular board test system having wireless receiver

Also Published As

Publication number Publication date
GB8419320D0 (en) 1984-08-30

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)