GB2156153A - Alignment process for semiconductor chips - Google Patents
Alignment process for semiconductor chips Download PDFInfo
- Publication number
- GB2156153A GB2156153A GB08507359A GB8507359A GB2156153A GB 2156153 A GB2156153 A GB 2156153A GB 08507359 A GB08507359 A GB 08507359A GB 8507359 A GB8507359 A GB 8507359A GB 2156153 A GB2156153 A GB 2156153A
- Authority
- GB
- United Kingdom
- Prior art keywords
- solder
- placing
- substrate
- locations
- wetting agent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 20
- 238000000034 method Methods 0.000 title claims description 16
- 229910000679 solder Inorganic materials 0.000 claims abstract description 52
- 239000000758 substrate Substances 0.000 claims abstract description 24
- 239000000080 wetting agent Substances 0.000 claims abstract description 19
- 238000004519 manufacturing process Methods 0.000 claims abstract description 4
- 238000013508 migration Methods 0.000 claims abstract description 4
- 230000005012 migration Effects 0.000 claims abstract description 4
- 239000003112 inhibitor Substances 0.000 claims abstract 3
- 239000000463 material Substances 0.000 claims description 13
- 238000002844 melting Methods 0.000 claims description 9
- 230000008018 melting Effects 0.000 claims description 9
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000000576 coating method Methods 0.000 claims description 3
- 238000000151 deposition Methods 0.000 claims description 3
- 238000001816 cooling Methods 0.000 claims 2
- 238000009736 wetting Methods 0.000 claims 2
- 239000000155 melt Substances 0.000 abstract description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 108091008695 photoreceptors Proteins 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 229910001128 Sn alloy Inorganic materials 0.000 description 1
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- LQBJWKCYZGMFEV-UHFFFAOYSA-N lead tin Chemical compound [Sn].[Pb] LQBJWKCYZGMFEV-UHFFFAOYSA-N 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- BFKJFAAPBSQJPD-UHFFFAOYSA-N tetrafluoroethene Chemical compound FC(F)=C(F)F BFKJFAAPBSQJPD-UHFFFAOYSA-N 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/075—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
- H01L25/0753—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00 the devices being arranged next to each other
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/15—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission
- H01L27/153—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission in a repetitive configuration, e.g. LED bars
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/291—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/29101—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of less than 400°C
- H01L2224/29111—Tin [Sn] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/2919—Material with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/83801—Soldering or alloying
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01027—Cobalt [Co]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/0105—Tin [Sn]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/0665—Epoxy resin
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/1026—Compound semiconductors
- H01L2924/1032—III-V
- H01L2924/10329—Gallium arsenide [GaAs]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12041—LED
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/157—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2924/15717—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400 C and less than 950 C
- H01L2924/15724—Aluminium [Al] as principal constituent
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Led Device Packages (AREA)
Abstract
In a method of fabricating a linear array of semiconductor chips 18 such as LED's, solder is placed at selected locations on a substrate 10, semiconductor chips 18 are placed upon the solder and then the wider is melted, then cooled. As the solder melts, the semiconductor chips will align themselves due to surface tension and, upon solidifying of the solder, the chips will be secured to the substrate at the selected locations. A wetting agent may be placed at the selected locations, and a solder migration inhibitor at other locations. The selected locations may comprise depressions on the substrate. <IMAGE>
Description
SPECIFICATION
Alignment process for semiconductor chips
Background of the Invention
In the field of electronic non-impact printers, a number of different types of device have been developed. These include laser printers, thermal printers, ink jet printers and the like. One such device that shows great promise is the light emitting diode (LED) printer. In such a device, an array of LED's is positioned to address a photoreceptive surface so that when the latter is charged, exposing the surface to light from the LED's will discharge locations on the photoreceptor so as to produce an image composed of small dots of uncharged areas. The LED's are enabled selectively by electronic drivers in response to a binary coded input to produce an image representative of information being transmitted.In a process known as reverse development, the image on the photoreceptor is developed by a toner material which may then be transferred to a record member, such as paper. The image may then be developed or fused, as is well known in the art.
In the construction of the print head of an
LED printer, a chip, made of a semiconductor material, such as gallium arsenide (GaAs), is selectively doped at various locations to produce LED sites after anodes and cathodes are connected to such doped sites. Such chips with LED sites are generally referred to as monoliths. These monoliths may be attached in tandem to a substrate, such as aluminum oxide, so as to produce an LED array. The monoliths have previously been attached to the substrate by an adhesive such as epoxy resin. The monoliths must be laid next to one another in a rather precise fashion so that the cathodes of the respective modules are not so close as to short across one another. It is, therefore, necessary to have a relatively wide gap between epoxy areas when placing the
LED monoliths directely on a substrate.
Aligning the monoliths is difficult since they are required to be placed within + 0.0005 in.
and moving them around causes the adhesive to move and create shorts. A still further difficulty is the brittle nature of the gallium arsenide material from which the monliths are made. As is well known, such material has a tendency to readily fracture.
Summary of the Invention
It has been found that arrays of semiconductor chips may be made in a convenient and reliable manner by first applying a wetting agent at locations on a substrate in a selected pattern, positioning solder upon the wetting agent at each location, placing doped semiconductor chips on the solder and then melting the solder. When the solder is in the molten state, it has been discovered that the chips will align themselves so long as the area covered by the solder has approximately the same dimensions as the chips and the chips are placed in proximity of their proposed final positions.
Brief Description of the Drawing
Figure 1 shows a plan view of a monolith with semiconductor chips located thereon;
Figure 2 shows a cross-sectional view of a monolith and a chip before and after the solder has been melted; and
Figure 3 shows an alternative embodiment that is similar to Fig. 2.
Detailed Description of the Preferred Embodiments
The instant invention will be described as it may be utilized in an LED array, but it will be appreciated that the principles of the invention are applicable in other devices and purposes where semiconductors are attached to a surface.
Referring now to Figs. 1 and 2, an LED array is shown generally at 10 which has a substrate 12 made of a material such as aluminum oxide. A wetting agent 14, such as gold or copper, is located at a plurality of locations to form a pattern. As shown in Fig.
1, the pattern would be a longitudinal series of squares separated by a small distance.
Placed at these locations are appropriate quantities solder 16 which act as a bonding material between the substrate 12 and chips 18 that are positioned upon the solder. The solder 16 may be made of a lead-tin alloy. On an individual basis, the area, as seen in Fig. 1 of the solder 16 normally is approximately the same size as its associated chip 18 but it may be slightly larger than the chip so that a wire 20 may be embedded in the solder, as seen in Fig. 3, thereby allowing the solder to serve as an electrical connection (cathode) between the chip and a selectable power supply source or driver (not shown). The chips 18 will have a number of doped sites 22 with a lead 24 (anode) to each site thereby defining a plurality of light emitting diodes. With such construction, the LED's 18 may be selectively enabled to selectively emit light as required.
In the making of an LED array 10 as shown in Fig. 1, a pattern is formed by applying a wetting agent 14 at selected locations by any conventional method, such as depositing the wetting agent by photolithographic masking technique, to achieve the desired placement accuracy for the location of the LED chips 18.
Both the wetting agent and the semi-conductor materials are easily wet by solder, but the wetting agent may also be applied the underside of the chip 18 if desired. The difference in surface energies between the pattern regions and the nonpattern regions are sufficiently large so that liquidfied solder will not migrate into the unwet region for small dis placements of the chips. This energy difference can be enhanced by coating the nonpattern portion of the substrate, or the location about the wetting agent, with a material that will inhibit the migration of the solder. An example of such a material is polytetra-fluore- thylene which is available from E I Dupont, de
Nemours 8 Co. under the trademark TEFLON.
Through use of photo-lithographic marking techniques, a thin film of the wetting agent 14, is deposited. A predetermined amount of the solder 16 in the form of a wafer may then be placed at each location 14 and a chip 18 placed upon the solder. Although the chip 18 as shown in Figs. 2 and 3 is not aligned with the solder 16 by a large amount, it will be appreciated that this is the worst case situation. After the chip 18 has been placed on the solder 16, the temperature of the solder 1 6 is increased to above its solder melting temperature. After the solder 16 melts, the chip 18 will float on the surface of the solder.If the chip 18 is within a few mils of its final desired location and a few degrees from its desired orientation, it will align itself with the desired pattern formed by the solder 16 and wetting agent 14 on the substrate 12 as a result of restoring forces. Because the restoring forces are larger than the gravitational forces, the chip will align itself to the proper position.
After the chips have assumed the proper positions, the solder is cooled and solidifies and the chips are locked in place. The time required for the chip to align itself has been found to be 5 to 10 milliseconds with a comparable dampening time for oscillations.
By using the previously described method in placing chips upon a substrate, one is able to obtain an LED array in a convenient and economical manner. This method not only allows the chips to be accurately aligned and distributed on the substrate, but in addition, it diminishes the risk of breaking chips 18 during fabrication of the LED array 10.
In an alternative embodiment, instead of creating photolithographic marking techniques, a pattern can be formed by creating depressions 26 in the substrate 12. A depression 26 is made in each of the locations of the pattern. The area, as seen in Fig. 1, of each depression being approximately the same size as the chip which is to be placed thereover. Although the depth of the depression 26 is not critical, a convenient depth of such depression may be approximately 0.005". A quantity of solder 16 would be placed within each depression with the width of the solder, as seen in Fig. 2, being slightly greater than the depth of the depression.
Claims (10)
1. A method of fabricating an array of semiconductor chips, the steps comprising:
placing a quantity of solder at locations on a a substrate,
placing a chip of semiconductor material upon each quantity of solder,
increasing the temperature of the solder above its melting point to form a bond with the associated semiconductor chips, and
cooling the solder below its melting point.
2. The method of claim 1 including the steps of placing a pattern of wetting agents at locations on the substrate and placing quantities of solder on each wetting agent location.
3. The method of claim 2 including the step of placing a solder migration inhibitor at locations on said substrate about said wetting agent.
4. A method for fabricating an LED array, the steps comprising:
creating a pattern of locations on a substrate by depositing a film of a wetting agent at each location,
placing a piece of solder upon each of the film locations,
placing a semiconductor chip upon the solder, and melting the solder.
5. The method of claim 4 including the steps of coating the non-pattern portion of the substrate with a non-wetting material.
6. A method for fabricating an LED array, the steps comprising:
creating a pattern of depression on a substrate,
placing a piece of solder within each depression,
placing a semiconductor chip upon each of the solder pieces, and
melting the solder.
7. A method of fabricating an array of semiconductor chips, the steps comprising:
placing a wetting agent in a pattern at locations on a substrate,
placing a quantity of solder on each wetting agent location,
placing a chip of semiconductor material upon each quantity of solder,
increasing the temperature of the solder above its melting point to form a bond with the associated semiconductor chips, and
cooling the solder below its melting point.
8. The method of claim 7 including the step of placing a solder migration inhibitor at locations on said substrate about said wetting agent.
9. A method for fabricating an LED array, the steps comprising:
creating a pattern of locations on a substrate by depositing a film of a wetting agent at each location,
placing a piece of solder upon each of the film locations,
placing a semiconductor chip upon the solder, and melting the solder.
10. The method of claim 9 including the steps of coating the non-pattern portion of the substrate with a non-wetting material.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US59175984A | 1984-03-21 | 1984-03-21 |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8507359D0 GB8507359D0 (en) | 1985-05-01 |
GB2156153A true GB2156153A (en) | 1985-10-02 |
GB2156153B GB2156153B (en) | 1988-02-24 |
Family
ID=24367818
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB08507359A Expired GB2156153B (en) | 1984-03-21 | 1985-03-21 | Alignment process for semiconductor chips |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2156153B (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989008927A1 (en) * | 1988-03-15 | 1989-09-21 | Siemens Aktiengesellschaft | Assembly process for producing led rows |
GB2236217A (en) * | 1989-08-23 | 1991-03-27 | Itt Ind Ltd | Improvement relating to electrical connectors |
FR3125358A1 (en) * | 2021-07-16 | 2023-01-20 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Interactive display device and method of manufacturing such a device |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1457806A (en) * | 1974-03-04 | 1976-12-08 | Mullard Ltd | Semiconductor device manufacture |
US4074299A (en) * | 1974-12-04 | 1978-02-14 | Hitachi, Ltd. | Light-emitting diode element and device |
GB1553065A (en) * | 1978-01-28 | 1979-09-19 | Int Computers Ltd | Circuit structures including integrated circuits |
GB2062963A (en) * | 1979-11-12 | 1981-05-28 | Hitachi Ltd | Semiconductor chip mountings |
US4394600A (en) * | 1981-01-29 | 1983-07-19 | Litton Systems, Inc. | Light emitting diode matrix |
-
1985
- 1985-03-21 GB GB08507359A patent/GB2156153B/en not_active Expired
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1457806A (en) * | 1974-03-04 | 1976-12-08 | Mullard Ltd | Semiconductor device manufacture |
US4074299A (en) * | 1974-12-04 | 1978-02-14 | Hitachi, Ltd. | Light-emitting diode element and device |
GB1553065A (en) * | 1978-01-28 | 1979-09-19 | Int Computers Ltd | Circuit structures including integrated circuits |
GB2062963A (en) * | 1979-11-12 | 1981-05-28 | Hitachi Ltd | Semiconductor chip mountings |
US4394600A (en) * | 1981-01-29 | 1983-07-19 | Litton Systems, Inc. | Light emitting diode matrix |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989008927A1 (en) * | 1988-03-15 | 1989-09-21 | Siemens Aktiengesellschaft | Assembly process for producing led rows |
US5043296A (en) * | 1988-03-15 | 1991-08-27 | Siemens Aktiengesellschaft | Method of manufacturing LED rows using a temporary rigid auxiliary carrier |
GB2236217A (en) * | 1989-08-23 | 1991-03-27 | Itt Ind Ltd | Improvement relating to electrical connectors |
FR3125358A1 (en) * | 2021-07-16 | 2023-01-20 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Interactive display device and method of manufacturing such a device |
Also Published As
Publication number | Publication date |
---|---|
GB8507359D0 (en) | 1985-05-01 |
GB2156153B (en) | 1988-02-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5134340A (en) | Light-emitting diode printhead | |
US5793117A (en) | Semiconductor device and method of fabricating the same | |
US6592205B2 (en) | Inkjet printhead for wide area printing | |
US6501663B1 (en) | Three-dimensional interconnect system | |
TWI674654B (en) | Method for bonding bare chip dies | |
US5045867A (en) | Optical writing head with curved surface formed by one end of any optical fiber bundle | |
US6998334B2 (en) | Semiconductor devices with permanent polymer stencil and method for manufacturing the same | |
US20010013653A1 (en) | Array of electrodes reliable, durable and economical and process for fabrication thereof | |
JPH01151275A (en) | Light emitting diode array | |
EP0125632B1 (en) | Light emitting diode array and method of producing the same | |
EP0145595A3 (en) | Integrated circuit device | |
US20020048828A1 (en) | Semiconductor device and method of manufacturing the same | |
US20050090026A1 (en) | Method of manufacturing a semiconductor device | |
GB2156153A (en) | Alignment process for semiconductor chips | |
EP0751568A2 (en) | Light-emitting device assembly and method of fabricating same | |
US6812949B1 (en) | Imaging apparatus and method for exposing a photosensitive material | |
EP0510274A1 (en) | Light emitting diode printhead | |
EP1602494A2 (en) | Method of manufacturing a thermal head | |
JP3485788B2 (en) | Light emitting diode array and optical print head | |
US5874984A (en) | Optical character generator for an electrographic printer | |
JPH04345041A (en) | Mounting structure of semiconductor element | |
JP4991125B2 (en) | Optical printer head and optical printer using the same | |
JPH0677283A (en) | Method of mounting ic device on wiring board | |
JPH07178961A (en) | Imaging device | |
JPH0985985A (en) | Photoprinting head and rod lens unit |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19930321 |