GB2110827B - Noise reduction in electronic measuring circuits - Google Patents
Noise reduction in electronic measuring circuitsInfo
- Publication number
- GB2110827B GB2110827B GB08229322A GB8229322A GB2110827B GB 2110827 B GB2110827 B GB 2110827B GB 08229322 A GB08229322 A GB 08229322A GB 8229322 A GB8229322 A GB 8229322A GB 2110827 B GB2110827 B GB 2110827B
- Authority
- GB
- United Kingdom
- Prior art keywords
- noise reduction
- electronic measuring
- measuring circuits
- circuits
- electronic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/125—Discriminating pulses
- H03K5/1252—Suppression or limitation of noise or interference
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
- G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
- G01R17/06—Automatic balancing arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Testing Relating To Insulation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB08229322A GB2110827B (en) | 1981-10-23 | 1982-10-14 | Noise reduction in electronic measuring circuits |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB8131996 | 1981-10-23 | ||
GB08229322A GB2110827B (en) | 1981-10-23 | 1982-10-14 | Noise reduction in electronic measuring circuits |
Publications (2)
Publication Number | Publication Date |
---|---|
GB2110827A GB2110827A (en) | 1983-06-22 |
GB2110827B true GB2110827B (en) | 1985-10-16 |
Family
ID=26281052
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB08229322A Expired GB2110827B (en) | 1981-10-23 | 1982-10-14 | Noise reduction in electronic measuring circuits |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2110827B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2749986B1 (en) * | 1996-06-14 | 1998-07-31 | Electricite De France | APPARATUS FOR DETECTING INSULATION FAILURE OF A CONNECTED DEVICE IN AN ELECTRICAL POWER DISTRIBUTION OR TRANSPORT NETWORK AND CORRESPONDING DETECTION METHOD |
-
1982
- 1982-10-14 GB GB08229322A patent/GB2110827B/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
GB2110827A (en) | 1983-06-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS57203978A (en) | Digital-tester in circuit | |
JPS57174772A (en) | Multiplying and adding circuit | |
GB2134708B (en) | Integrated circuits | |
GB2142486B (en) | Electronic flash system and circuits therefor | |
JPS57162529A (en) | Noise reducing circuit | |
EP0130613A3 (en) | Noise reduction circuit | |
GB8327868D0 (en) | Integrated circuits | |
IL62037A0 (en) | Electronic lock and circuit therefor | |
GB2122056B (en) | Noise reduction circuits | |
GB8409187D0 (en) | Noise reduction circuit | |
DE3267101D1 (en) | Electronic circuit | |
JPS57140033A (en) | Integrated circuit electronic system | |
GB2083985B (en) | Noise reduction circuits | |
GB2145817B (en) | Electronic level device | |
GB2113955B (en) | Noise reduction circuits | |
GB2083987B (en) | Noise reduction circuits | |
GB2083988B (en) | Noise reduction circuits | |
GB8409004D0 (en) | Noise reduction circuit | |
GB8401153D0 (en) | Thick-film circuits | |
GB2110827B (en) | Noise reduction in electronic measuring circuits | |
GB2149130B (en) | Testing electronic circuits | |
GB2068197B (en) | Noise reduction circuits | |
GB8423790D0 (en) | Minimizing noise in precision electronic components | |
JPS57178358A (en) | Integrated circuit potential reducing technique | |
GB8315265D0 (en) | Electronic circuits |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PE20 | Patent expired after termination of 20 years |
Effective date: 20021013 |