GB2055478B - Fault location methods and apparatus - Google Patents

Fault location methods and apparatus

Info

Publication number
GB2055478B
GB2055478B GB8019954A GB8019954A GB2055478B GB 2055478 B GB2055478 B GB 2055478B GB 8019954 A GB8019954 A GB 8019954A GB 8019954 A GB8019954 A GB 8019954A GB 2055478 B GB2055478 B GB 2055478B
Authority
GB
United Kingdom
Prior art keywords
fault location
location methods
methods
fault
location
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB8019954A
Other languages
English (en)
Other versions
GB2055478A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Schlumberger Technologies Ltd
Original Assignee
Membrain Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Membrain Ltd filed Critical Membrain Ltd
Publication of GB2055478A publication Critical patent/GB2055478A/en
Application granted granted Critical
Publication of GB2055478B publication Critical patent/GB2055478B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/088—Aspects of digital computing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/315—Contactless testing by inductive methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Mathematical Physics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Locating Faults (AREA)
GB8019954A 1979-06-23 1980-06-18 Fault location methods and apparatus Expired GB2055478B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB7921940 1979-06-23
GB7943989 1979-12-20

Publications (2)

Publication Number Publication Date
GB2055478A GB2055478A (en) 1981-03-04
GB2055478B true GB2055478B (en) 1983-01-26

Family

ID=26271949

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8019954A Expired GB2055478B (en) 1979-06-23 1980-06-18 Fault location methods and apparatus

Country Status (3)

Country Link
DE (1) DE3022279A1 (enrdf_load_stackoverflow)
FR (1) FR2459980A1 (enrdf_load_stackoverflow)
GB (1) GB2055478B (enrdf_load_stackoverflow)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3270882D1 (en) * 1981-10-16 1986-06-05 Fairchild Camera Instr Co Current probe signal processing circuit
US4857833A (en) * 1987-08-27 1989-08-15 Teradyne, Inc. Diagnosis of faults on circuit board
EP0527321A1 (de) * 1991-08-05 1993-02-17 Siemens Aktiengesellschaft Verfahren zur automatischen Fehlerdiagnose von elektrischen Baugruppen
DE69229389T2 (de) * 1992-02-25 1999-10-07 Hewlett-Packard Co., Palo Alto Testsystem für Schaltkreise
EP0729035A3 (de) * 1995-02-24 1997-05-07 Langer Guenter Feldquelle zur Untersuchung der elektromagnetischen Verträglichkeit
CN113777459B (zh) * 2021-08-12 2024-05-28 中国南方电网有限责任公司超高压输电公司昆明局 换流器丢脉冲故障定位方法及装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2524361A1 (de) * 1975-06-02 1976-12-09 Tesla Np Verfahren zum pruefen von integrierten digitalbausteinen
US4074188A (en) * 1975-08-01 1978-02-14 Testline Instruments, Inc. Low impedance fault detection system and method
GB1537870A (en) * 1975-09-05 1979-01-04 Ericsson L M Pty Ltd Printed circuit board testing method and apparatus
US4186338A (en) * 1976-12-16 1980-01-29 Genrad, Inc. Phase change detection method of and apparatus for current-tracing the location of faults on printed circuit boards and similar systems
DD133598A1 (de) * 1977-10-18 1979-01-10 Franz Drescher Verfahren und vorrichtung zur fehlerlokalisierung an defekten digitalen funktionseinheiten

Also Published As

Publication number Publication date
DE3022279C2 (enrdf_load_stackoverflow) 1992-08-13
FR2459980B1 (enrdf_load_stackoverflow) 1983-04-01
DE3022279A1 (de) 1981-01-08
GB2055478A (en) 1981-03-04
FR2459980A1 (fr) 1981-01-16

Similar Documents

Publication Publication Date Title
GB2044980B (en) Informationrecording process and apparatus
GB2051613B (en) Plasma sparay method and apparatus
ZA805150B (en) Packaging method and apparatus
JPS5655858A (en) Diagnosis method and apparatus
EP0030355A3 (en) Medical-examination apparatus
GB2055401B (en) Electroplating device and method
JPS55140567A (en) Method and device for suspending inkkjettcoating device
GB2051364B (en) Flaw detectinmg device and method
JPS55152292A (en) Method and device for testing well
ZA805685B (en) Processes and apparatus
GB2058727B (en) Cleaning apparatus and method
GB2053619B (en) Interpolation methods and apparatus
JPS5663300A (en) Decontaminating method and device
GB2047414B (en) Weight-testing apparatus
GB2071298B (en) Cryogenic apparatus
JPS56131328A (en) Milking method and apparatus
DE3063171D1 (en) Decontamination method and apparatus
DE3070154D1 (en) Decontamination apparatus
GB2045502B (en) Coin-separating apparatus
GB2055478B (en) Fault location methods and apparatus
JPS5695748A (en) Method and device for monitoring nonnskid device
GB2063158B (en) Copying method and apparatus
GB2061864B (en) Wrapping method and apparatus
GB2039211B (en) Wafer-baking apparatus
JPS55143529A (en) Method and device for display

Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19940618