GB2025100B - Apparatus for generating pulses - Google Patents

Apparatus for generating pulses

Info

Publication number
GB2025100B
GB2025100B GB7922388A GB7922388A GB2025100B GB 2025100 B GB2025100 B GB 2025100B GB 7922388 A GB7922388 A GB 7922388A GB 7922388 A GB7922388 A GB 7922388A GB 2025100 B GB2025100 B GB 2025100B
Authority
GB
United Kingdom
Prior art keywords
generating pulses
pulses
generating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB7922388A
Other versions
GB2025100A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of GB2025100A publication Critical patent/GB2025100A/en
Application granted granted Critical
Publication of GB2025100B publication Critical patent/GB2025100B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/78—Generating a single train of pulses having a predetermined pattern, e.g. a predetermined number
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
GB7922388A 1978-07-06 1979-06-27 Apparatus for generating pulses Expired GB2025100B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2829709A DE2829709C2 (en) 1978-07-06 1978-07-06 Method and arrangement for generating pulse cycles immediately following one another in time

Publications (2)

Publication Number Publication Date
GB2025100A GB2025100A (en) 1980-01-16
GB2025100B true GB2025100B (en) 1982-08-11

Family

ID=6043705

Family Applications (1)

Application Number Title Priority Date Filing Date
GB7922388A Expired GB2025100B (en) 1978-07-06 1979-06-27 Apparatus for generating pulses

Country Status (3)

Country Link
US (1) US4263669A (en)
DE (1) DE2829709C2 (en)
GB (1) GB2025100B (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5914840B2 (en) * 1979-10-19 1984-04-06 日本電信電話株式会社 Pattern generator for semiconductor memory testing
DE3023699A1 (en) * 1980-06-25 1982-01-14 Ibm Deutschland Gmbh, 7000 Stuttgart METHOD AND ARRANGEMENT FOR GENERATING IMPULSES AT PRESET TIME RELATION WITHIN PRESET IMPULSE INTERVALS WITH HIGH TIME RESOLUTION
US4388719A (en) * 1981-01-16 1983-06-14 Loranger Manufacturing Company Dynamic signal generator
US4429389A (en) 1981-05-26 1984-01-31 Burroughs Corporation Test pattern address generator
US4442519A (en) * 1982-03-05 1984-04-10 International Business Machines Corporation Memory address sequence generator
DE3375266D1 (en) * 1983-06-08 1988-02-11 Ibm Deutschland Method and circuit arrangement for the generation of pulses of arbitrary time relation within directly successive pulse intervals with very high precision and temporal resolution
GB8406509D0 (en) * 1984-03-13 1984-04-18 Bio Medical Res Ltd Electrical stimulation of muscle
US4608669A (en) * 1984-05-18 1986-08-26 International Business Machines Corporation Self contained array timing
US4855681A (en) * 1987-06-08 1989-08-08 International Business Machines Corporation Timing generator for generating a multiplicty of timing signals having selectable pulse positions
US4852096A (en) * 1987-08-14 1989-07-25 International Business Machines Corp. CN2 test pattern generator
EP0491998B1 (en) * 1990-12-28 1996-07-24 International Business Machines Corporation Programme-controlled method and circuit arrangement for generating pulses within successive time intervals

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3718910A (en) * 1970-09-30 1973-02-27 Ibm Time coherent sampling system for eliminating the effects of test system jitter and providing a simplified single transient threshold test
US3713097A (en) * 1971-05-14 1973-01-23 Ibm Test bit pattern generator for pattern recognition machines
US3805152A (en) * 1971-08-04 1974-04-16 Ibm Recirculating testing methods and apparatus
GB1379588A (en) * 1971-12-01 1975-01-02 Int Computers Ltd Systems for testing electrical devices
US3737637A (en) * 1971-12-13 1973-06-05 Ibm Data generator
US3719885A (en) * 1971-12-13 1973-03-06 Ibm Statistical logic test system having a weighted random test pattern generator
US3789195A (en) * 1972-05-09 1974-01-29 Gulf & Western Industries Digital counter and timer with multiplex setting and readout
US3781829A (en) * 1972-06-16 1973-12-25 Ibm Test pattern generator
US3824637A (en) * 1972-10-27 1974-07-23 C Hunnicutt Ventilating attachment for water closet
JPS5842490B2 (en) * 1973-09-29 1983-09-20 イワサキツウシンキ カブシキガイシヤ Digital linearizer
US4041387A (en) * 1975-09-18 1977-08-09 Hewlett-Packard Company Apparatus and method for measuring the frequency of a sweeping signal
US4066882A (en) * 1976-08-16 1978-01-03 Grumman Aerospace Corporation Digital stimulus generating and response measuring means
DE2746743C2 (en) * 1977-10-18 1986-04-17 Ibm Deutschland Gmbh, 7000 Stuttgart Method and arrangement for the computer-controlled generation of pulse intervals

Also Published As

Publication number Publication date
US4263669A (en) 1981-04-21
DE2829709C2 (en) 1984-02-23
GB2025100A (en) 1980-01-16
DE2829709A1 (en) 1980-01-17

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee