GB201805456D0 - Nuget effectgrade assessment - Google Patents

Nuget effectgrade assessment

Info

Publication number
GB201805456D0
GB201805456D0 GBGB1805456.9A GB201805456A GB201805456D0 GB 201805456 D0 GB201805456 D0 GB 201805456D0 GB 201805456 A GB201805456 A GB 201805456A GB 201805456 D0 GB201805456 D0 GB 201805456D0
Authority
GB
United Kingdom
Prior art keywords
effectgrade
nuget
assessment
nuget effectgrade
effectgrade assessment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GBGB1805456.9A
Other versions
GB2572569A (en
GB2572569C (en
GB2572569A8 (en
GB2572569B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mineral Explor Network Finland Ltd
Original Assignee
Mineral Explor Network Finland Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mineral Explor Network Finland Ltd filed Critical Mineral Explor Network Finland Ltd
Priority to GB1805456.9A priority Critical patent/GB2572569C/en
Publication of GB201805456D0 publication Critical patent/GB201805456D0/en
Publication of GB2572569A publication Critical patent/GB2572569A/en
Publication of GB2572569A8 publication Critical patent/GB2572569A8/en
Application granted granted Critical
Publication of GB2572569B publication Critical patent/GB2572569B/en
Publication of GB2572569C publication Critical patent/GB2572569C/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6402—Atomic fluorescence; Laser induced fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2204—Specimen supports therefor; Sample conveying means therefore
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/24—Earth materials
    • G01N33/389—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/616—Specific applications or type of materials earth materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/202—Constituents thereof
    • G01N33/2028—Metallic constituents
GB1805456.9A 2018-04-03 2018-04-03 Nugget effect grade assessment Active GB2572569C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB1805456.9A GB2572569C (en) 2018-04-03 2018-04-03 Nugget effect grade assessment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1805456.9A GB2572569C (en) 2018-04-03 2018-04-03 Nugget effect grade assessment

Publications (5)

Publication Number Publication Date
GB201805456D0 true GB201805456D0 (en) 2018-05-16
GB2572569A GB2572569A (en) 2019-10-09
GB2572569A8 GB2572569A8 (en) 2019-10-30
GB2572569B GB2572569B (en) 2022-04-13
GB2572569C GB2572569C (en) 2022-12-14

Family

ID=62142171

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1805456.9A Active GB2572569C (en) 2018-04-03 2018-04-03 Nugget effect grade assessment

Country Status (1)

Country Link
GB (1) GB2572569C (en)

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ZA741707B (en) * 1974-03-15 1975-07-30 Chamber Of Mines Services Ltd Determining heavy element concentration in ores
US4510573A (en) * 1981-05-06 1985-04-09 Unc Nuclear Industries, Inc. Method for X-ray fluorescence spectroscopy
AU576831B2 (en) * 1984-03-23 1988-09-08 General Mining Union Corp. Ltd. Logging core data
US6130931A (en) * 1998-09-17 2000-10-10 Process Control, Inc. X-ray fluorescence elemental analyzer
US6753957B1 (en) * 2001-08-17 2004-06-22 Florida Institute Of Phosphate Research Mineral detection and content evaluation method
AU2002324849B2 (en) * 2001-09-04 2008-01-24 Quality Control, Inc. X-ray fluorescence measuring system and methods for trace elements
US7233643B2 (en) * 2005-05-20 2007-06-19 Oxford Instruments Analytical Oy Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopy
WO2009082373A1 (en) * 2007-12-21 2009-07-02 Innov-X Systems, Inc. Hand-held xrf analyzer
CN201335816Y (en) * 2009-01-14 2009-10-28 布莱格科技（北京）有限公司 X-ray energy spectrum core scanner
EP2893331B1 (en) * 2012-09-07 2020-01-15 Carl Zeiss X-Ray Microscopy, Inc. Combined confocal x-ray fluorescence and x-ray computerised tomographic system and method

Also Published As

Publication number Publication date
GB2572569A (en) 2019-10-09
GB2572569C (en) 2022-12-14
GB2572569A8 (en) 2019-10-30
GB2572569B (en) 2022-04-13

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Legal Events

Date Code Title Description
S117 Correction of errors in patents and applications (sect. 117/patents act 1977)

Free format text: REQUEST FILED; REQUEST FOR CORRECTION UNDER SECTION 117 FILED ON 11 AUGUST 2022

S117 Correction of errors in patents and applications (sect. 117/patents act 1977)

Free format text: CORRECTIONS ALLOWED; REQUEST FOR CORRECTION UNDER SECTION 117 FILED ON 11 AUGUST 2022 WAS ALLOWED ON 08 DECEMBER 2022