GB201721152D0 - Transmission electron microscopy systems - Google Patents

Transmission electron microscopy systems

Info

Publication number
GB201721152D0
GB201721152D0 GBGB1721152.5A GB201721152A GB201721152D0 GB 201721152 D0 GB201721152 D0 GB 201721152D0 GB 201721152 A GB201721152 A GB 201721152A GB 201721152 D0 GB201721152 D0 GB 201721152D0
Authority
GB
United Kingdom
Prior art keywords
transmission electron
electron microscopy
microscopy systems
systems
transmission
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB1721152.5A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Warwick
Original Assignee
University of Warwick
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Warwick filed Critical University of Warwick
Priority to GBGB1721152.5A priority Critical patent/GB201721152D0/en
Publication of GB201721152D0 publication Critical patent/GB201721152D0/en
Priority to PCT/EP2018/084470 priority patent/WO2019121195A1/en
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2002—Controlling environment of sample
    • H01J2237/2003—Environmental cells
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/206—Modifying objects while observing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/28—Scanning microscopes
    • H01J2237/2802—Transmission microscopes
GBGB1721152.5A 2017-12-18 2017-12-18 Transmission electron microscopy systems Ceased GB201721152D0 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GBGB1721152.5A GB201721152D0 (en) 2017-12-18 2017-12-18 Transmission electron microscopy systems
PCT/EP2018/084470 WO2019121195A1 (en) 2017-12-18 2018-12-12 Transmission electron microscopy systems

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB1721152.5A GB201721152D0 (en) 2017-12-18 2017-12-18 Transmission electron microscopy systems

Publications (1)

Publication Number Publication Date
GB201721152D0 true GB201721152D0 (en) 2018-01-31

Family

ID=61008863

Family Applications (1)

Application Number Title Priority Date Filing Date
GBGB1721152.5A Ceased GB201721152D0 (en) 2017-12-18 2017-12-18 Transmission electron microscopy systems

Country Status (2)

Country Link
GB (1) GB201721152D0 (en)
WO (1) WO2019121195A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113340926A (en) * 2020-03-03 2021-09-03 中国科学院物理研究所 Sample transfer method of chip type in-situ transmission electron microscope

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111312573B (en) * 2020-03-12 2021-04-27 厦门超新芯科技有限公司 Transmission electron microscope high-resolution in-situ liquid phase heating chip and preparation method thereof
EP4060094A1 (en) 2021-03-18 2022-09-21 Jozef Stefan Institute An apparatus for anodic oxidation of very small metal grids

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2304982B (en) * 1995-09-08 1999-07-21 Marconi Gec Ltd Electron microscope specimen supports
JP2004179411A (en) * 2002-11-27 2004-06-24 Toppan Printing Co Ltd Membrane mask and method for exposure
US7144753B2 (en) * 2003-11-25 2006-12-05 Board Of Trustees Of Michigan State University Boron-doped nanocrystalline diamond
GB2461708A (en) * 2008-07-08 2010-01-13 Silson Ltd Sample holder
US8058627B2 (en) * 2008-08-13 2011-11-15 Wisys Technology Foundation Addressable transmission electron microscope grid
US8852408B2 (en) * 2009-04-29 2014-10-07 International Business Machines Corporation Electrochemical liquid cell apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113340926A (en) * 2020-03-03 2021-09-03 中国科学院物理研究所 Sample transfer method of chip type in-situ transmission electron microscope
CN113340926B (en) * 2020-03-03 2022-05-20 中国科学院物理研究所 Sample transfer method of chip type in-situ transmission electron microscope

Also Published As

Publication number Publication date
WO2019121195A1 (en) 2019-06-27

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)