GB201703079D0 - Sample inspection apparatus employing a diffraction detector - Google Patents
Sample inspection apparatus employing a diffraction detectorInfo
- Publication number
- GB201703079D0 GB201703079D0 GBGB1703079.2A GB201703079A GB201703079D0 GB 201703079 D0 GB201703079 D0 GB 201703079D0 GB 201703079 A GB201703079 A GB 201703079A GB 201703079 D0 GB201703079 D0 GB 201703079D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- inspection apparatus
- apparatus employing
- sample inspection
- diffraction detector
- diffraction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1703079.2A GB2560696B (en) | 2017-02-25 | 2017-02-25 | Sample inspection apparatus employing a diffraction detector |
| PCT/GB2018/050467 WO2018154308A1 (en) | 2017-02-25 | 2018-02-22 | Sample inspection apparatus employing a diffraction detector |
| EP18711620.7A EP3571495B1 (en) | 2017-02-25 | 2018-02-22 | Sample inspection apparatus employing a diffraction detector |
| CN201880014087.4A CN110325846B (en) | 2017-02-25 | 2018-02-22 | Sample inspection apparatus employing diffraction detector |
| US16/549,028 US10948432B2 (en) | 2017-02-25 | 2019-08-23 | Sample inspection apparatus employing a diffraction detector |
| US17/180,310 US11467104B2 (en) | 2017-02-25 | 2021-02-19 | Sample inspection apparatus employing a diffraction detector |
| US17/945,434 US11726048B2 (en) | 2017-02-25 | 2022-09-15 | Sample inspection apparatus employing a diffraction detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1703079.2A GB2560696B (en) | 2017-02-25 | 2017-02-25 | Sample inspection apparatus employing a diffraction detector |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| GB201703079D0 true GB201703079D0 (en) | 2017-04-12 |
| GB2560696A GB2560696A (en) | 2018-09-26 |
| GB2560696B GB2560696B (en) | 2022-03-23 |
Family
ID=58544345
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB1703079.2A Active GB2560696B (en) | 2017-02-25 | 2017-02-25 | Sample inspection apparatus employing a diffraction detector |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB2560696B (en) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2004074871A1 (en) * | 2003-02-24 | 2004-09-02 | Philips Intellectual Property & Standards Gmbh | Automatic material discrimination by using computer tomography |
| US7366282B2 (en) * | 2003-09-15 | 2008-04-29 | Rapiscan Security Products, Inc. | Methods and systems for rapid detection of concealed objects using fluorescence |
| GB0710579D0 (en) * | 2007-06-02 | 2007-07-11 | Univ Cranfield | Detecion of x-ray scattering |
-
2017
- 2017-02-25 GB GB1703079.2A patent/GB2560696B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| GB2560696B (en) | 2022-03-23 |
| GB2560696A (en) | 2018-09-26 |
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