GB201608829D0 - Improved signal probe - Google Patents
Improved signal probeInfo
- Publication number
- GB201608829D0 GB201608829D0 GBGB1608829.6A GB201608829A GB201608829D0 GB 201608829 D0 GB201608829 D0 GB 201608829D0 GB 201608829 A GB201608829 A GB 201608829A GB 201608829 D0 GB201608829 D0 GB 201608829D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- improved signal
- signal probe
- probe
- improved
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1608829.6A GB2550398B (en) | 2016-05-19 | 2016-05-19 | Improved signal probe. |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1608829.6A GB2550398B (en) | 2016-05-19 | 2016-05-19 | Improved signal probe. |
Publications (3)
Publication Number | Publication Date |
---|---|
GB201608829D0 true GB201608829D0 (en) | 2016-07-06 |
GB2550398A GB2550398A (en) | 2017-11-22 |
GB2550398B GB2550398B (en) | 2021-01-13 |
Family
ID=56369636
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1608829.6A Active GB2550398B (en) | 2016-05-19 | 2016-05-19 | Improved signal probe. |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2550398B (en) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6930497B2 (en) * | 2001-12-19 | 2005-08-16 | Chung Shan Institute Of Science And Technology Armaments Bureau, M.N.D. | Flexible multi-layered probe for measuring a signal from an object |
DE202004019636U1 (en) * | 2004-12-20 | 2005-03-03 | Rosenberger Hochfrequenztechnik Gmbh & Co. Kg | High frequency semiconductor wafer test probe contact unit has coaxial connectors connected to probe tips by matching network and coplanar waveguide |
-
2016
- 2016-05-19 GB GB1608829.6A patent/GB2550398B/en active Active
Also Published As
Publication number | Publication date |
---|---|
GB2550398A (en) | 2017-11-22 |
GB2550398B (en) | 2021-01-13 |
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