GB201104863D0 - Testing apparatus - Google Patents

Testing apparatus

Info

Publication number
GB201104863D0
GB201104863D0 GBGB1104863.4A GB201104863A GB201104863D0 GB 201104863 D0 GB201104863 D0 GB 201104863D0 GB 201104863 A GB201104863 A GB 201104863A GB 201104863 D0 GB201104863 D0 GB 201104863D0
Authority
GB
United Kingdom
Prior art keywords
testing apparatus
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GBGB1104863.4A
Other versions
GB2489262B (en
GB2489262A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Technology GmbH
Original Assignee
Alstom Grid UK Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alstom Grid UK Ltd filed Critical Alstom Grid UK Ltd
Priority to GB1104863.4A priority Critical patent/GB2489262B/en
Publication of GB201104863D0 publication Critical patent/GB201104863D0/en
Priority to KR1020120029650A priority patent/KR101899031B1/en
Publication of GB2489262A publication Critical patent/GB2489262A/en
Application granted granted Critical
Publication of GB2489262B publication Critical patent/GB2489262B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/263—Circuits therefor for testing thyristors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3272—Apparatus, systems or circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies
    • G01R31/42—AC power supplies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Power Conversion In General (AREA)
GB1104863.4A 2011-03-23 2011-03-23 Testing apparatus Expired - Fee Related GB2489262B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB1104863.4A GB2489262B (en) 2011-03-23 2011-03-23 Testing apparatus
KR1020120029650A KR101899031B1 (en) 2011-03-23 2012-03-23 Testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1104863.4A GB2489262B (en) 2011-03-23 2011-03-23 Testing apparatus

Publications (3)

Publication Number Publication Date
GB201104863D0 true GB201104863D0 (en) 2011-05-04
GB2489262A GB2489262A (en) 2012-09-26
GB2489262B GB2489262B (en) 2016-07-06

Family

ID=44013012

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1104863.4A Expired - Fee Related GB2489262B (en) 2011-03-23 2011-03-23 Testing apparatus

Country Status (2)

Country Link
KR (1) KR101899031B1 (en)
GB (1) GB2489262B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108695829A (en) * 2017-04-03 2018-10-23 维洛西门子新能源汽车法国简式股份公司 Guard method, protective device, electrical system and the charger system of resonance circuit

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103197167A (en) * 2013-02-20 2013-07-10 国网智能电网研究院 Parameter design method for load electric reactor of maximum metal condition (MMC) valve steady-state operation testing device
CN104422836A (en) * 2013-09-09 2015-03-18 南京南瑞继保电气有限公司 Overcurrent cut-off test circuit as well as control method thereof
KR101442990B1 (en) 2013-10-16 2014-11-04 엘에스산전 주식회사 Snthetic test circuit for hvdc thyristor valves
CN104914340B (en) * 2015-06-11 2016-11-09 中国西电电气股份有限公司 Flexible direct current transmission converter valve wholly-controled device overcurrent turn-off function pilot system and method
CN104977485B (en) * 2015-06-11 2017-03-01 中国西电电气股份有限公司 A kind of assay device of the soft straight power model short circuit current of MMC HVDC and method
CN112710940B (en) * 2020-12-23 2022-05-20 西安交通大学 SiC MOSFET reverse transfer capacitance measuring method
CN114167272B (en) * 2021-12-03 2024-04-12 广东电网有限责任公司 Flexible direct current converter valve steady-state operation test device and method

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2771182B1 (en) * 1997-11-18 2000-01-28 Sgs Thomson Microelectronics METHOD AND SYSTEM FOR TESTING AN INTEGRATED CIRCUIT WITH CONTACTLESS OPERATION, AND AN INPUT CAPACITY OF SUCH AN INTEGRATED CIRCUIT
SE518628C2 (en) * 2001-02-21 2002-11-05 Abb Ab Test circuit for HVDC thyristor valves and method for synthetic testing
JP4301550B2 (en) 2003-07-08 2009-07-22 東芝三菱電機産業システム株式会社 Test circuit for semiconductor power converter
CN100568004C (en) 2007-09-21 2009-12-09 中国电力科学研究院 Thyristor switched capacitor high voltage valve test device and method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108695829A (en) * 2017-04-03 2018-10-23 维洛西门子新能源汽车法国简式股份公司 Guard method, protective device, electrical system and the charger system of resonance circuit
CN108695829B (en) * 2017-04-03 2022-05-17 维洛西门子新能源汽车法国简式股份公司 Protection method and protection device for resonant circuit, electrical system and charger system

Also Published As

Publication number Publication date
GB2489262B (en) 2016-07-06
KR101899031B1 (en) 2018-09-14
KR20120109379A (en) 2012-10-08
GB2489262A (en) 2012-09-26

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Legal Events

Date Code Title Description
COOA Change in applicant's name or ownership of the application

Owner name: ALSTOM TECHNOLOGY LTD

Free format text: FORMER OWNER: ALSTOM GRID UK LIMITED

PCNP Patent ceased through non-payment of renewal fee

Effective date: 20180323