GB201005481D0 - Electrically charged particle energy analysers - Google Patents
Electrically charged particle energy analysersInfo
- Publication number
- GB201005481D0 GB201005481D0 GBGB1005481.5A GB201005481A GB201005481D0 GB 201005481 D0 GB201005481 D0 GB 201005481D0 GB 201005481 A GB201005481 A GB 201005481A GB 201005481 D0 GB201005481 D0 GB 201005481D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- charged particle
- electrically charged
- particle energy
- energy analysers
- analysers
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB1005481.5A GB201005481D0 (en) | 2010-03-31 | 2010-03-31 | Electrically charged particle energy analysers |
PCT/GB2011/000494 WO2011121302A1 (en) | 2010-03-31 | 2011-03-31 | Electrically charged particle energy analysers |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB1005481.5A GB201005481D0 (en) | 2010-03-31 | 2010-03-31 | Electrically charged particle energy analysers |
Publications (1)
Publication Number | Publication Date |
---|---|
GB201005481D0 true GB201005481D0 (en) | 2010-05-19 |
Family
ID=42228727
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GBGB1005481.5A Ceased GB201005481D0 (en) | 2010-03-31 | 2010-03-31 | Electrically charged particle energy analysers |
Country Status (2)
Country | Link |
---|---|
GB (1) | GB201005481D0 (en) |
WO (1) | WO2011121302A1 (en) |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2658150A (en) * | 1948-12-03 | 1953-11-03 | John G Backus | Method and apparatus for focusing charged particles |
US2964627A (en) * | 1957-07-01 | 1960-12-13 | Trub Tauber & Co A G | Double-focussing spectrometer for electrically charged particles |
JPS5110992A (en) * | 1974-07-17 | 1976-01-28 | Hitachi Ltd | |
US4962306A (en) * | 1989-12-04 | 1990-10-09 | Intenational Business Machines Corporation | Magnetically filtered low loss scanning electron microscopy |
EP1183527A1 (en) | 1999-06-16 | 2002-03-06 | Shimadzu Research Laboratory (Europe) Ltd. | Electrically-charged particle energy analysers |
JP2007531973A (en) * | 2004-03-31 | 2007-11-08 | オイ コーポレイション | Stabilization of the magnetic section of a mass spectrometer |
US7947951B2 (en) * | 2006-07-21 | 2011-05-24 | National University Of Singapore | Multi-beam ion/electron spectra-microscope |
-
2010
- 2010-03-31 GB GBGB1005481.5A patent/GB201005481D0/en not_active Ceased
-
2011
- 2011-03-31 WO PCT/GB2011/000494 patent/WO2011121302A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2011121302A1 (en) | 2011-10-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AT | Applications terminated before publication under section 16(1) |