GB1522306A - Nondestructive testing of materials - Google Patents
Nondestructive testing of materialsInfo
- Publication number
- GB1522306A GB1522306A GB4428774A GB4428774A GB1522306A GB 1522306 A GB1522306 A GB 1522306A GB 4428774 A GB4428774 A GB 4428774A GB 4428774 A GB4428774 A GB 4428774A GB 1522306 A GB1522306 A GB 1522306A
- Authority
- GB
- United Kingdom
- Prior art keywords
- flaw
- workpiece
- scans
- flaws
- produce
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/52—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S15/00
- G01S7/52017—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S15/00 particularly adapted to short-range imaging
- G01S7/52053—Display arrangements
- G01S7/52057—Cathode ray tube displays
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
- G01N29/38—Detecting the response signal, e.g. electronic circuits specially adapted therefor by time filtering, e.g. using time gates
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Nanotechnology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Crystallography & Structural Chemistry (AREA)
- Molecular Biology (AREA)
- Computer Networks & Wireless Communication (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Acoustics & Sound (AREA)
Abstract
1522306 Ultrasonic flaw testing STEEL CASTINGS RESEARCH & TRADE ASSOCIATION 12 April 1976 [12 Jan 1975] 44287/74 Heading GIG A workpiece is non-destructively tested for flaws by scanning its surface with an ultrasonic probe to produce an initial C-scan of bottom surface echoes (which are attenuated on passage through a flaw), detecting those flaws above a certain severity, and then making repeated scans of any area of the workpiece in which a flaw was detected to produce a succession of C-scans each showing the extent of the flaw at a particular depth below the surface of the workpiece, and recording the C-scans on an X-Y plotter. The severity discriminator has an adjustable acceptance window (VR1, VR2) Fig. 2 (not shown), different severities ot flaw being plotted in different colours of ink. An A-scan oscilloscope is provided for checking the peak level of the back surface echoes and for determining the depth of the flaws. L.E.D's indicate whether or not the discriminator threshold is exceeded. Sine-cosine potentiometers at the pivots of the linkages supporting the probe control the pen position of the recorder.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB4428774A GB1522306A (en) | 1976-04-12 | 1976-04-12 | Nondestructive testing of materials |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB4428774A GB1522306A (en) | 1976-04-12 | 1976-04-12 | Nondestructive testing of materials |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1522306A true GB1522306A (en) | 1978-08-23 |
Family
ID=10432599
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB4428774A Expired GB1522306A (en) | 1976-04-12 | 1976-04-12 | Nondestructive testing of materials |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB1522306A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2512206A1 (en) * | 1981-09-02 | 1983-03-04 | Mannesmann Ag | METHOD AND DEVICE FOR DETECTION OF HYDROGEN-INDUCED CRIQUES IN METALLIC MATERIALS |
CN112816556A (en) * | 2019-11-18 | 2021-05-18 | 中国商用飞机有限责任公司 | Defect detection method, device, equipment and storage medium |
-
1976
- 1976-04-12 GB GB4428774A patent/GB1522306A/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2512206A1 (en) * | 1981-09-02 | 1983-03-04 | Mannesmann Ag | METHOD AND DEVICE FOR DETECTION OF HYDROGEN-INDUCED CRIQUES IN METALLIC MATERIALS |
CN112816556A (en) * | 2019-11-18 | 2021-05-18 | 中国商用飞机有限责任公司 | Defect detection method, device, equipment and storage medium |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PCNP | Patent ceased through non-payment of renewal fee |