GB1389319A - Data processing system - Google Patents
Data processing systemInfo
- Publication number
- GB1389319A GB1389319A GB5129172A GB5129172A GB1389319A GB 1389319 A GB1389319 A GB 1389319A GB 5129172 A GB5129172 A GB 5129172A GB 5129172 A GB5129172 A GB 5129172A GB 1389319 A GB1389319 A GB 1389319A
- Authority
- GB
- United Kingdom
- Prior art keywords
- failures
- logic circuit
- trace
- test patterns
- failure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
1389319 Digital computers; diagnostic programs INTERNATIONAL BUSINESS MACHINES CORP 7 Nov 1972 [15 Nov 1971] 51291/72 Heading G4A A data processing apparatus is programmed to identify groups of potentially detectable failures from a list of possible failures in a logic circuit. A group of logic circuit descriptions (including definitions of circuit inputs, outputs, logic block values, failure counts and time of last block value change), and a sequence 112 of test patterns to be performed on the logic circuit are entered in a computer and a good machine simulation 122 is effected with error sensitivity propagation to produce an all events trace 124. The trace 124 is then operated on in an error sensitivity propagation back trace 126 in conjunction with a failure definition list 115 to produce a selected failure list output 121. This identifies groups of potentially detectable failures for each test pattern in a series of test patterns and omits the potentially undetectable failures, thus reducing the running time of fault simulation of system test patterns.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US19878271A | 1971-11-15 | 1971-11-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1389319A true GB1389319A (en) | 1975-04-03 |
Family
ID=22734820
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB5129172A Expired GB1389319A (en) | 1971-11-15 | 1972-11-07 | Data processing system |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB1389319A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2131211A (en) * | 1982-10-22 | 1984-06-13 | Control Data Corp | Logic simulator apparatus |
EP0259662A2 (en) * | 1986-09-02 | 1988-03-16 | Digital Equipment Corporation | Method for generating a candidate list of faulty circuit elements and method for isolating faults in a digital logic circuit using said candidate list. |
US8607175B1 (en) | 2012-10-04 | 2013-12-10 | International Business Machines Corporation | Identifying logic blocks in a synthesized logic design that have specified inputs |
-
1972
- 1972-11-07 GB GB5129172A patent/GB1389319A/en not_active Expired
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2131211A (en) * | 1982-10-22 | 1984-06-13 | Control Data Corp | Logic simulator apparatus |
EP0259662A2 (en) * | 1986-09-02 | 1988-03-16 | Digital Equipment Corporation | Method for generating a candidate list of faulty circuit elements and method for isolating faults in a digital logic circuit using said candidate list. |
EP0259662A3 (en) * | 1986-09-02 | 1989-07-26 | Digital Equipment Corporation | Method and apparatus for isolating faults in a digital logic circuit |
US8607175B1 (en) | 2012-10-04 | 2013-12-10 | International Business Machines Corporation | Identifying logic blocks in a synthesized logic design that have specified inputs |
US8612909B1 (en) | 2012-10-04 | 2013-12-17 | International Business Machines Corporation | Identifying logic blocks in a synthesized logic design that have specified inputs |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PCNP | Patent ceased through non-payment of renewal fee |