GB1371104A - Methods of and apparatus for analysing mixtures - Google Patents

Methods of and apparatus for analysing mixtures

Info

Publication number
GB1371104A
GB1371104A GB730471A GB730471A GB1371104A GB 1371104 A GB1371104 A GB 1371104A GB 730471 A GB730471 A GB 730471A GB 730471 A GB730471 A GB 730471A GB 1371104 A GB1371104 A GB 1371104A
Authority
GB
United Kingdom
Prior art keywords
plasma
sample
tube
discharge
produced
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB730471A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
APPLIED RESEARCH LAB Ltd
Original Assignee
APPLIED RESEARCH LAB Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by APPLIED RESEARCH LAB Ltd filed Critical APPLIED RESEARCH LAB Ltd
Priority to GB730471A priority Critical patent/GB1371104A/en
Publication of GB1371104A publication Critical patent/GB1371104A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/105Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622Ion mobility spectrometry
    • G01N27/623Ion mobility spectrometry combined with mass spectrometry

Abstract

1371104 Ion sources APPLIED RESEARCH LABORATORIES Ltd 20 March 1972 [19 March 1971 1 July 1971 10 Sept 1971] 7304/71 30794/71 and 42253/71 Heading H1D In the analysis of a material by a mass analyser, a gaseous medium containing ions of the material is produced by injecting the material in vapour, liquid, or aerosal form, into a high temperature plasma which is at atmospheric pressure, whereafter the gaseous medium containing the ions is fed to the mass analyser through a pressure reducing stage. The high temperature plasma is produced in an argon or helium carrier gas by an r.f. electrodeless discharge, or by a D.C. discharge in gas flowing through a capillary tube. For a massive solid example either an aerosol suitable for injection into the plasma is produced by employing the sample as the cathode for a D.C. arc struck in flowing argon or helium, first compressing a powder mixture of the material with graphite or metal into a solid cathode if the material is an insulator; or a pulsed laser beam is focused on to the sample surface in flowing gas, the sample being moved between successive pulses to vary the point of impact. The plasma containing the ionized material is sampled by extracting a portion through a fine orifice and passing the resulting beam through a succession of low pressure regions. If greater control of ionization is required, ions are removed from the beam by a transverse electric field, and the resulting neutral beam is passed into an electron impact ionizer. As shown in Fig. 1, a D.C. discharge is maintained between the anode 11 and the sample cathode 10, the carrier gas entering at tube 13 and carrying the sample particles into a high temperature plasma formed in the capillary tube 18 by a discharge between electrodes 16 and 17. Most of the plasma passes out through the pumping tube 20, the remainder being drawn off through a fine orifice 21 into the mass analyser entry tube 22, which is maintained at reduced pressure by the pumping tube 23. The apparatus of Fig. 4, in which the plasma is produced by electrodeless discharge in a capillary tube 32 mounted in a microwave cavity 33, is suitable for sample material which must be maintained within a given temperature range: the sample aerosol, e.g. from a chemical reaction and at 300‹ C. is expanded into the pipe 35 at a point of the plasma tail at which it has cooled to that temperature, whereafter a portion is drawn off to the mass analyser 41, thermal lagging 39 preventing further substantial reduction in temperature.
GB730471A 1972-03-20 1972-03-20 Methods of and apparatus for analysing mixtures Expired GB1371104A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB730471A GB1371104A (en) 1972-03-20 1972-03-20 Methods of and apparatus for analysing mixtures

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB3079471 1972-03-20
GB730471A GB1371104A (en) 1972-03-20 1972-03-20 Methods of and apparatus for analysing mixtures
GB4225371 1972-03-20

Publications (1)

Publication Number Publication Date
GB1371104A true GB1371104A (en) 1974-10-23

Family

ID=27254994

Family Applications (1)

Application Number Title Priority Date Filing Date
GB730471A Expired GB1371104A (en) 1972-03-20 1972-03-20 Methods of and apparatus for analysing mixtures

Country Status (1)

Country Link
GB (1) GB1371104A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2143673A (en) * 1983-06-16 1985-02-13 Hitachi Ltd Ionizing samples for secondary ion mass spectrometry
GB2225159A (en) * 1988-11-18 1990-05-23 Vg Instr Group Mass spectrometers
CN110186998A (en) * 2019-06-20 2019-08-30 中国科学院大气物理研究所 The device and method of atmosphere pollution real-time sampling analysis

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2143673A (en) * 1983-06-16 1985-02-13 Hitachi Ltd Ionizing samples for secondary ion mass spectrometry
GB2225159A (en) * 1988-11-18 1990-05-23 Vg Instr Group Mass spectrometers
US5036195A (en) * 1988-11-18 1991-07-30 Vg Instruments Group Limited Gas analyzer
GB2225159B (en) * 1988-11-18 1993-05-05 Vg Instr Group Gas analyzer
CN110186998A (en) * 2019-06-20 2019-08-30 中国科学院大气物理研究所 The device and method of atmosphere pollution real-time sampling analysis
CN110186998B (en) * 2019-06-20 2023-11-28 中国科学院大气物理研究所 Device and method for real-time sampling and analyzing of atmospheric pollutants

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee