GB1367302A - Analysing apparatus - Google Patents
Analysing apparatusInfo
- Publication number
- GB1367302A GB1367302A GB3908071A GB3908071A GB1367302A GB 1367302 A GB1367302 A GB 1367302A GB 3908071 A GB3908071 A GB 3908071A GB 3908071 A GB3908071 A GB 3908071A GB 1367302 A GB1367302 A GB 1367302A
- Authority
- GB
- United Kingdom
- Prior art keywords
- specimen
- electrons
- field
- pole
- aperture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
1367302 Particle spectrometers; X-ray tubes NIHON DENSHI KK 19 Aug 1971 [19 Aug 1970] 39080/71 Heading H1D Analysing apparatus comprises means for producing a magnetic field symmetrical about an axis; means for supporting a specimen 6 in the field; an X-ray or low-pressure U-V resonance line source 8 for irradiating the specimen to give off electrons and means to analyse the electrons. Slight asymmetries of the # field about the axis do not affect focusing. Information on the bonding state of atoms may be obtained Coil 4, adjacent polepieces 1, 2, may be A.C. or D.C. excited, and specimen 6 and yoke 3 may be the same potential (e.g. earth). The output from energy analyser 11 is fed to recorder 12. In Fig. 2 (not shown), the electron velocities are reduced by an electric field, pole 1 being insulated by material (13) and pole 2 at negative potential. Voltages are specified. Separation of electrons according to energies is obtained in Fig. 3 (not shown), and detector 15 may measure electron intensity, D.C. source 17 being connected to non-magnetic apertured member (16). In Fig. 6 (not shown), U.V. is irradiated on to a gaseous specimen from vessel (19). He 2 gas in vessel (22) is ionized by discharge between electrodes (25a), (25b). Fig. 7 (not shown) includes insulator (27) between specimen and pole 1 for potential variations w.r.t. aperture (16) and Fig 8 (not shown) includes aperture with an insulating material (28). The p.d. being applied between the aperture rim and the specimen. Fig. 9 (not shown) includes a permanent magnet 29 to produce the symmetrical field and Fig. 10 (not shown) includes a solenoid (33). Fig. 11 (not shown) includes a lens of the kind used in a scanning or transmission electron microscope, and sample 6 is outside the space between poles 1 and 2. Fig. 12 (not shown) includes an X-ray generator comprising ring- shaped filament (35) for emitting electrons (36), spherical target (37) for generating X-rays by electron irradiation, and ring-shaped electrode (38) for controlling the electrons.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP45072621A JPS5129437B1 (en) | 1970-08-19 | 1970-08-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1367302A true GB1367302A (en) | 1974-09-18 |
Family
ID=13494621
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB3908071A Expired GB1367302A (en) | 1970-08-19 | 1971-08-19 | Analysing apparatus |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPS5129437B1 (en) |
DE (1) | DE2138800A1 (en) |
FR (1) | FR2104427A5 (en) |
GB (1) | GB1367302A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62176959U (en) * | 1986-04-22 | 1987-11-10 | ||
US5506414A (en) * | 1993-03-26 | 1996-04-09 | Fisons Plc | Charged-particle analyzer |
US10712296B2 (en) | 2016-12-23 | 2020-07-14 | Orion Engineering Limited | Handheld material analyser |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3479505A (en) * | 1966-06-30 | 1969-11-18 | Applied Res Lab | Method of operating an ion microprobe using secondary elections |
-
1970
- 1970-08-19 JP JP45072621A patent/JPS5129437B1/ja active Pending
-
1971
- 1971-08-03 DE DE19712138800 patent/DE2138800A1/en active Pending
- 1971-08-17 FR FR7129971A patent/FR2104427A5/fr not_active Expired
- 1971-08-19 GB GB3908071A patent/GB1367302A/en not_active Expired
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62176959U (en) * | 1986-04-22 | 1987-11-10 | ||
US4810879A (en) * | 1986-04-22 | 1989-03-07 | Spectros Limited | Charged particle energy analyzer |
US5506414A (en) * | 1993-03-26 | 1996-04-09 | Fisons Plc | Charged-particle analyzer |
US10712296B2 (en) | 2016-12-23 | 2020-07-14 | Orion Engineering Limited | Handheld material analyser |
Also Published As
Publication number | Publication date |
---|---|
JPS5129437B1 (en) | 1976-08-25 |
DE2138800A1 (en) | 1972-03-30 |
FR2104427A5 (en) | 1972-04-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PLNP | Patent lapsed through nonpayment of renewal fees |