GB1162173A - Improvements in or relating to X-Ray Analysis - Google Patents

Improvements in or relating to X-Ray Analysis

Info

Publication number
GB1162173A
GB1162173A GB4367766A GB4367766A GB1162173A GB 1162173 A GB1162173 A GB 1162173A GB 4367766 A GB4367766 A GB 4367766A GB 4367766 A GB4367766 A GB 4367766A GB 1162173 A GB1162173 A GB 1162173A
Authority
GB
United Kingdom
Prior art keywords
sample
tested
filters
chamber
cao
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4367766A
Inventor
Hiroshi Imamura
Kaoru Uchida
Hiroshi Tominaga
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ube Corp
Original Assignee
Ube Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to DE19661673174 priority Critical patent/DE1673174A1/en
Application filed by Ube Industries Ltd filed Critical Ube Industries Ltd
Priority to GB4367766A priority patent/GB1162173A/en
Publication of GB1162173A publication Critical patent/GB1162173A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

1,162,173. X-ray fluorescence analysis. UBE KOSAN K.K. Sept.29, 1966, No.43677/66. Heading G1A. [Also in Divisions H1 and H5] In X-ray analysis apparatus the sample is excited by alpha rays and electromagnetic radiation from a radio-active source and the characteristic X-rays emitted by light and heavy elements of the sample are detected by a proportional counter connected to a pre-amplifier, a linear amplifier, a pulse height analyzer and a scaler. Radiation from the sources 5, 6, Fig. 1, falls on the sample 4 to generate characteristic X-rays which are detected by the proportional counters 7, 9. Counter 9 has a window with a filter 8 which filters out radiation which overlaps a peak of an element to be detected. The material of the filter is the same as the element to be detected e.g. to determine Al 2 O 3 in a cement mix also containing SiO 2 , the Si K radiation is eliminated by an Al filter. A plurality of filtered cells may be used, or a single cell with provision for interchangable filters. The outputs of the counters are fed to pulse height analyzers set to detect the required component elements of the test sample. Light elements are excited by alpha radiation from the Po210 source 5 and heavy elements by electromagnetic radiation from the source 6 e.g. H 3 absorbed on Ti, Ni or Zr. A single substance e.g. Am241 may be used to provide both radiations. The following determinations may be made:- Cement raw materials may be tested for Al 2 O 3 ; SiO 2 ; CaO and Fe 2 O 3 using an Al filter. Cement or cement clinker may be tested for Al 2 O 3 ; SiO 2 ; SO 3 ; CaO and Fe 2 O 3 using Al, Si and S filters. Iron ore may be tested for MgO; Al 2 O 3 ; SiO 2 ; CaO; MnO; Fe 2 O 3 ; and TiO 2 using Mg. Al Si, Mn, Ti and Fe filters. Glass may be tested for Na 2 O; MgO; Al 2 O 3 ; SiO 2 ; SO 3 ; CaO; Fe 2 O 3 B 2 O 3 ; BaO and PbO using Na, Mg, Al, Si, S and Ca filters. Magnesium clinker may be tested for MgO; Al 2 O 3 ; P; S; CaO and Fe 2 O 3 using Mg, Al and Si filters. Petroleum may be tested for S without using filters. Iron Slag may be tested for MgO; Al 2 O 3 ; SiO 2 SO 3 ; CaO and Fe 2 O 3 using Mg, Al, Si and S filters. Steel may be tested for C; Si; P; S; Mn and Cr using P, Si and Cr filters. Pig Iron may be tested for C; Si; P; S; Mn and Cu using a Si filter. Sample transferring mechanism The measuring chamber 62, (Fig.4), which is evacuated to reduce radiation attenuation is attached to a sample exchange chamber 52 and extending between the chambers is a sample carrier 68 with two sample stations 50, 51. While a measurement is being made on the sample at 50, a lever 53 may be operated to raise a member 67 which squeezes the sealing rings to isolate the chamber 62 from the vacuum in chamber 62. Air is then introduced into chamber 52 from valve 56 so that the lid 55 may be removed and sample 51 changed. Chamber 52 is then evacuated through valve 56 and lever 53 released. When the measurement is finished the sample 50 may be replaced by the new sample 51 by rotating the knob 69. In a simpler embodiment, Fig.3 (not shown), chamber 52 is not used and the rotatable sample carrier 68 is replaced by a carrier which slides linearly between a plurality of sealing rings. When in the test position the sample may be rotated to eliminate effects due to surface irregularities.
GB4367766A 1966-09-28 1966-09-29 Improvements in or relating to X-Ray Analysis Expired GB1162173A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE19661673174 DE1673174A1 (en) 1966-09-28 1966-09-28 Sample analyzer
GB4367766A GB1162173A (en) 1966-09-28 1966-09-29 Improvements in or relating to X-Ray Analysis

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DEU0013118 1966-09-28
GB4367766A GB1162173A (en) 1966-09-28 1966-09-29 Improvements in or relating to X-Ray Analysis

Publications (1)

Publication Number Publication Date
GB1162173A true GB1162173A (en) 1969-08-20

Family

ID=26001113

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4367766A Expired GB1162173A (en) 1966-09-28 1966-09-29 Improvements in or relating to X-Ray Analysis

Country Status (2)

Country Link
DE (1) DE1673174A1 (en)
GB (1) GB1162173A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996023212A1 (en) * 1995-01-27 1996-08-01 Asoma Instruments, Inc. Glass composition determination method and apparatus
CN100593116C (en) * 2006-04-10 2010-03-03 上海爱斯特电子有限公司 X fluorescent multi-element analyser

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996023212A1 (en) * 1995-01-27 1996-08-01 Asoma Instruments, Inc. Glass composition determination method and apparatus
US5663997A (en) * 1995-01-27 1997-09-02 Asoma Instruments, Inc. Glass composition determination method and apparatus
CN100593116C (en) * 2006-04-10 2010-03-03 上海爱斯特电子有限公司 X fluorescent multi-element analyser

Also Published As

Publication number Publication date
DE1673174A1 (en) 1972-03-23

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Legal Events

Date Code Title Description
PS Patent sealed
PLNP Patent lapsed through nonpayment of renewal fees