GB1140579A - Method of making semiconductor devices and devices made thereby - Google Patents
Method of making semiconductor devices and devices made therebyInfo
- Publication number
- GB1140579A GB1140579A GB3718866A GB3718866A GB1140579A GB 1140579 A GB1140579 A GB 1140579A GB 3718866 A GB3718866 A GB 3718866A GB 3718866 A GB3718866 A GB 3718866A GB 1140579 A GB1140579 A GB 1140579A
- Authority
- GB
- United Kingdom
- Prior art keywords
- semi
- layer
- wafer
- insulating layer
- diffusing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 title abstract 3
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000010410 layer Substances 0.000 abstract 12
- 229910004298 SiO 2 Inorganic materials 0.000 abstract 3
- 229910001218 Gallium arsenide Inorganic materials 0.000 abstract 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 2
- 239000012535 impurity Substances 0.000 abstract 2
- 229910052751 metal Inorganic materials 0.000 abstract 2
- 239000002184 metal Substances 0.000 abstract 2
- 238000005275 alloying Methods 0.000 abstract 1
- 229910052793 cadmium Inorganic materials 0.000 abstract 1
- 238000009792 diffusion process Methods 0.000 abstract 1
- 238000005530 etching Methods 0.000 abstract 1
- 229910052738 indium Inorganic materials 0.000 abstract 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
- 230000001681 protective effect Effects 0.000 abstract 1
- 238000007493 shaping process Methods 0.000 abstract 1
- 239000000377 silicon dioxide Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
- 239000002344 surface layer Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
- H01L21/225—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a solid phase, e.g. a doped oxide layer
- H01L21/2258—Diffusion into or out of AIIIBV compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Led Devices (AREA)
- Semiconductor Lasers (AREA)
Abstract
1,140,579. Semi-conductor devices; lasers. STANDARD TELEPHONES & CABLES Ltd. 19 Aug., 1966, No. 37188/66. Headings H1C and H1K. Semi-insulating regions are produced in a body of semi-conductor material by diffusing-in a suitable impurity through a protective surface layer. A wafer (1) of N-type GaAs is lapped, polished and etched and a layer (2) of SiO 2 is deposited on one face, Fig. 1 (not shown). A layer (3) of Cr is evaporated on to the oxide layer (2) and the wafer is placed in an evacuated silica tube and heated to diffuse the Cr through the oxide into the GaAs to form a semi-insulating layer (4), having a resistivity of about 10<SP>8</SP> ohm cm., Figs. 2 and 3 (not shown). The SiO 2 layer and the excess Cr are removed by etching, Fig. 4 (not shown). The wafer is then processed in one of the following ways. FETs are produced by applying a SiO 2 mask (5) to the semi-insulating layer (4), and vapour diffusing-in Zn to form P-type source and drain regions (6 and 7) which extend completely through the semi-insulating layer (4), Figs., 5 and 6 (not shown). The oxide layer is removed, Fig. 7 (not shown), and metal electrodes 8 and 9 are deposited on the source and drain regions 6 and 7 and on the semi-insulating layer 4, Fig. 8. Electrode 9 is the gate electrode and is insulated from the current channel, which forms at the interface between the layer 4 and the substrate 1, by the semi-insulating region 4. LASERS are produced by diffusing Zn into a plurality of P-type parallel strips (12) which extend through the semi-insulating layer (4), cleaving the wafer transversely to the strips, and sawing between the strips, Figs. 10 to 12 (not shown). The devices are then mounted either by alloying between metal blocks or by means of indium pressure contacts. One contact is applied to the base of the wafer and the other to the whole of the top surface. Non-Lasing LIGHT EMITTING DIODES may be made using the same diffusion method as for lasers but different cutting and shaping steps. P.I.N. SWITCHING DIODES are produced by diffusing Zn into the whole of the surface of the semi-insulating layer, applying contacts to the top and bottom surfaces of the wafer, and then dicing. The P-type impurity may be Cd or Mg instead of Zn.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB3718866A GB1140579A (en) | 1966-08-19 | 1966-08-19 | Method of making semiconductor devices and devices made thereby |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB3718866A GB1140579A (en) | 1966-08-19 | 1966-08-19 | Method of making semiconductor devices and devices made thereby |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1140579A true GB1140579A (en) | 1969-01-22 |
Family
ID=10394495
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB3718866A Expired GB1140579A (en) | 1966-08-19 | 1966-08-19 | Method of making semiconductor devices and devices made thereby |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB1140579A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3700978A (en) * | 1971-03-18 | 1972-10-24 | Bell Telephone Labor Inc | Field effect transistors and methods for making field effect transistors |
US3713912A (en) * | 1971-02-11 | 1973-01-30 | Bell Telephone Labor Inc | Gallium arsenide field effect structure |
US4033788A (en) * | 1973-12-10 | 1977-07-05 | Hughes Aircraft Company | Ion implanted gallium arsenide semiconductor devices fabricated in semi-insulating gallium arsenide substrates |
US4297783A (en) * | 1979-01-30 | 1981-11-03 | Bell Telephone Laboratories, Incorporated | Method of fabricating GaAs devices utilizing a semi-insulating layer of AlGaAs in combination with an overlying masking layer |
-
1966
- 1966-08-19 GB GB3718866A patent/GB1140579A/en not_active Expired
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3713912A (en) * | 1971-02-11 | 1973-01-30 | Bell Telephone Labor Inc | Gallium arsenide field effect structure |
US3700978A (en) * | 1971-03-18 | 1972-10-24 | Bell Telephone Labor Inc | Field effect transistors and methods for making field effect transistors |
US4033788A (en) * | 1973-12-10 | 1977-07-05 | Hughes Aircraft Company | Ion implanted gallium arsenide semiconductor devices fabricated in semi-insulating gallium arsenide substrates |
US4297783A (en) * | 1979-01-30 | 1981-11-03 | Bell Telephone Laboratories, Incorporated | Method of fabricating GaAs devices utilizing a semi-insulating layer of AlGaAs in combination with an overlying masking layer |
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