GB1138029A - Semiconductor devices - Google Patents

Semiconductor devices

Info

Publication number
GB1138029A
GB1138029A GB970966A GB970966A GB1138029A GB 1138029 A GB1138029 A GB 1138029A GB 970966 A GB970966 A GB 970966A GB 970966 A GB970966 A GB 970966A GB 1138029 A GB1138029 A GB 1138029A
Authority
GB
United Kingdom
Prior art keywords
region
base
emitter
screen
pad
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB970966A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RCA Corp
Original Assignee
RCA Corp
Radio Corporation of America
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RCA Corp, Radio Corporation of America filed Critical RCA Corp
Publication of GB1138029A publication Critical patent/GB1138029A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/482Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body
    • H01L23/485Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body consisting of layered constructions comprising conductive layers and insulating layers, e.g. planar contacts
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/58Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/585Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries comprising conductive layers or plates or strips or rods or rings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3011Impedance

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Bipolar Transistors (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

1,138,029. Semi-conductor devices. RADIO CORPORATION OF AMERICA. 4 March, 1966 [19 March, 1965], No. 9709/66. Heading H1K. In a transistor having an electrode contact bonding pad extending over a dielectric layer, the capacitance between the pad and the collector region is reduced by forming a low impedance screen region in the body below the location of the pad and connecting this region to a source of electrical potential. As shown, Fig. 1, the surface of an N-type silicon substrate 10 is masked and boron is diffused-in from the vapour phase to produce P-type regions 12 and 14 which constitute the base region and the screen region respectively. Phosphorous is diffused into region 12 to form N-type emitter region 18. The surface of the wafer is covered with a layer 20 of silicon oxide, windows are formed to expose parts of the emitter, base and screen regions, and aluminium is evaporated-on to form the electrodes. The emitter electrode comprises a portion 22 which contacts region 18 and a portion 21 which forms the bonding pad and overlies arm 15 of screen region 14 from which it is insulated by oxide layer 20. The base electrode is similarly constructed and arranged over arm 16 of region 14. Bonding pad 26 provides a contact to screen region 14 and may be earthed in use. The device is enclosed in a four-lead encapsulation. In a second embodiment, Figs. 2, 2a, 2b and 2c (not shown), the starting wafer comprises an epitaxial layer grown on a more highly doped substrate and the device has a plurality of emitter regions (47), each having an electrode (48) connecting it to a common emitter bonding pad (46), alternately arranged with base contact regions (33), each having an electrode (44) connecting it to a common base bonding pad (43). The transistor is produced by growing the epitaxial layer, diffusing-in heavily doped regions to form the base contacts (33) and the screen region (35) and then diffusing-in base region (41) and emitter region (47), covering the surface with silicon oxide, forming windows and depositing the contact regions. In further embodiments: (i) the screen region surrounds the base region and is electrically connected to the emitter region by means of a common bonding pad (76), Figs. 4, 4a and 4b (not shown); (ii) as in (i) but with the screen electrically connected to the base region instead of the emitter region, Fig. 5 (not shown); (iii) two separate screen regions are provided for the base and emitter bonding pads, the base pad screen region being connected to the emitter and the emitter pad screen region being left floating, Figs. 6 and 6a (not shown); and (iv) as in (iii) but with emitter pad screen region connected to the base and the base pad screen region being left floating, Fig. 7 (not shown). A plurality of transistors may be formed in a single wafer of semi-conductor material which is then divided into separate devices. The semiconductor material may be silicon, germanium, silicon-germanium alloy, gallium arsenide, or indium phosphide. The following impurities are referred to in connection with silicon devices, boron aluminium, gallium, indium, phosphorus, arsenic and antimony. Selenium and tellurium are mentioned as donors for gallium arsenide and indium phosphide. The electrodes may be of aluminium, gold or chromium and may be applied by evaporation, electroplating or electroless plating. If the semi-conductor material is gallium arsenide the insulating layer may be produced by forcing the pyrolytic decomposition products of a vaporized siloxane compound through a jet on to the wafer. An encapsulation, Fig. 3 (not shown), is described and comprises a header (50) with four lead-out wires one of which (57) is shorted to the header (50) and is also connected to the screen region. The body of the wafer (the collector) is mounted on a platform (59) connected to a lead-out wire (55<SP>11</SP>), and the emitter and base electrodes are connected to two other lead-out wires (55, 55<SP>1</SP>) respectively.
GB970966A 1965-03-19 1966-03-04 Semiconductor devices Expired GB1138029A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US44116065A 1965-03-19 1965-03-19

Publications (1)

Publication Number Publication Date
GB1138029A true GB1138029A (en) 1968-12-27

Family

ID=23751779

Family Applications (1)

Application Number Title Priority Date Filing Date
GB970966A Expired GB1138029A (en) 1965-03-19 1966-03-04 Semiconductor devices

Country Status (3)

Country Link
ES (1) ES324317A1 (en)
GB (1) GB1138029A (en)
NL (1) NL6603563A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2243485A (en) * 1990-04-27 1991-10-30 Motorola Gmbh Semiconductor device contact pads

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2243485A (en) * 1990-04-27 1991-10-30 Motorola Gmbh Semiconductor device contact pads

Also Published As

Publication number Publication date
NL6603563A (en) 1966-09-20
ES324317A1 (en) 1967-02-01

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