GB1028879A - Improvements in or relating to x-ray apparatus - Google Patents

Improvements in or relating to x-ray apparatus

Info

Publication number
GB1028879A
GB1028879A GB35733/64A GB3573364A GB1028879A GB 1028879 A GB1028879 A GB 1028879A GB 35733/64 A GB35733/64 A GB 35733/64A GB 3573364 A GB3573364 A GB 3573364A GB 1028879 A GB1028879 A GB 1028879A
Authority
GB
United Kingdom
Prior art keywords
crystal
rays
detectors
planes
sept
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB35733/64A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Electronics UK Ltd
Original Assignee
Philips Electronic and Associated Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronic and Associated Industries Ltd filed Critical Philips Electronic and Associated Industries Ltd
Publication of GB1028879A publication Critical patent/GB1028879A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

1,028,879. X-ray spectrometers. PHILIPS ELECTRONIC & ASSOCIATED INDUSTRIES Ltd. Sept. 1, 1964 [Sept. 4, 1963], No. 35733/64. Heading H5R. X-ray spectrometer apparatus utilizes two detectors, each oriented to detect X-rays diffracted by a respective set of diffracting planes in the analysing crystal. X-rays from the tube 2 (Fig. 1) are directed at the specimen 1 to be investigated and the secondary X-rays generated, having wavelengths characteristic of the specimen, are passed through collimator 4 to the analysing crystals. X-rays reflected by the crystal are passed through collimators 10 and 11 before reaching detectors 7, 8 mounted on a carriage 9 which is coupled with the crystal to rotate about an axis 6 at twice the angular velocity of the crystal. Thus reflections from two planes of the crystal, which may be of quartz, are detected simultaneously. The detectors are always arranged so that the normal to a set of planes bisects the angle between incident and diffracted beams. Transmitted diffraction may be used with appropriately thin crystals.
GB35733/64A 1963-09-04 1964-09-01 Improvements in or relating to x-ray apparatus Expired GB1028879A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US30645363A 1963-09-04 1963-09-04

Publications (1)

Publication Number Publication Date
GB1028879A true GB1028879A (en) 1966-05-11

Family

ID=23185357

Family Applications (1)

Application Number Title Priority Date Filing Date
GB35733/64A Expired GB1028879A (en) 1963-09-04 1964-09-01 Improvements in or relating to x-ray apparatus

Country Status (1)

Country Link
GB (1) GB1028879A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0222442A1 (en) * 1985-11-04 1987-05-20 North American Philips Corporation Improved double crystal X-ray spectrometer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0222442A1 (en) * 1985-11-04 1987-05-20 North American Philips Corporation Improved double crystal X-ray spectrometer

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