GB1019583A - Apparatus for use in x-ray micro-analysis - Google Patents

Apparatus for use in x-ray micro-analysis

Info

Publication number
GB1019583A
GB1019583A GB1447463A GB1447463A GB1019583A GB 1019583 A GB1019583 A GB 1019583A GB 1447463 A GB1447463 A GB 1447463A GB 1447463 A GB1447463 A GB 1447463A GB 1019583 A GB1019583 A GB 1019583A
Authority
GB
United Kingdom
Prior art keywords
crystal
microscope
specimen
pivoted
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1447463A
Inventor
Peter Duncumb
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TI Group Services Ltd
Original Assignee
TI Group Services Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TI Group Services Ltd filed Critical TI Group Services Ltd
Priority to GB1447463A priority Critical patent/GB1019583A/en
Publication of GB1019583A publication Critical patent/GB1019583A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/28—Scanning microscopes
    • H01J2237/2803—Scanning microscopes characterised by the imaging method
    • H01J2237/2807—X-rays

Abstract

1,019,583. X-ray spectrometer. T.I. (GROUP SERVICES) Ltd. Aug. 26, 1963, No. 14474/65. Divided out of 1,019,581. Heading H5R. [Also in Division H1] An X-ray bent crystal spectrometer of the linear focusing type, i.e. in which the crystal is movable in a straight line towards and away from the specimen, while the centre of the Rowland circle moves in an arcuate path around the specimen, is included within the evacuated envelope of an electron microscope, the crystal and the detector being moved by an interconnecting linkage which, in order to avoid obstruction by the microscope lens system, defines a virtual circle displaced outwards away from the microscope axis with respect to the true Rowland circle. One end of an arm A is pivoted at a fixed point P, displaced by d, say, from the specimen S, the other end being pivoted to arms B and C. The crystal X is mounted on one end of a carriage M of length d, contrained to move along the slide N, the linkage E, F ensuring that the crystal is kept facing the centre of the Rowland circle R. Detector Y is mounted at the end of a member D of length d pivoted to the end of arm C which is arranged to rotate, by gearing at the interconnection of arms A, B and C, at twice the rate of arm B. Member D is maintained parallel to slide N by a belt passing over suitable diameter ratio pulleys C<SP>1</SP> and C<SP>2</SP>, and a further belt and pulley, system D<SP>1</SP>, D<SP>2</SP> keeps the detector Y facing crystal X. Carriage M is movable by a lead screw from outside the microscope envelope; X may consist of two crystals mounted back-to-back, whereby turning them over extends the wavelength range of the analyser.
GB1447463A 1963-08-26 1963-08-26 Apparatus for use in x-ray micro-analysis Expired GB1019583A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB1447463A GB1019583A (en) 1963-08-26 1963-08-26 Apparatus for use in x-ray micro-analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1447463A GB1019583A (en) 1963-08-26 1963-08-26 Apparatus for use in x-ray micro-analysis

Publications (1)

Publication Number Publication Date
GB1019583A true GB1019583A (en) 1966-02-09

Family

ID=10041848

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1447463A Expired GB1019583A (en) 1963-08-26 1963-08-26 Apparatus for use in x-ray micro-analysis

Country Status (1)

Country Link
GB (1) GB1019583A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116068609A (en) * 2023-03-09 2023-05-05 中国科学院合肥物质科学研究院 Space position calibration method and device for flexural spectrometer in vacuum environment

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116068609A (en) * 2023-03-09 2023-05-05 中国科学院合肥物质科学研究院 Space position calibration method and device for flexural spectrometer in vacuum environment
CN116068609B (en) * 2023-03-09 2023-05-30 中国科学院合肥物质科学研究院 Space position calibration method and device for flexural spectrometer in vacuum environment

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