GB0909104D0 - Method,computer program product and data processing program for processing an error in a data processing device - Google Patents

Method,computer program product and data processing program for processing an error in a data processing device

Info

Publication number
GB0909104D0
GB0909104D0 GB0909104A GB0909104A GB0909104D0 GB 0909104 D0 GB0909104 D0 GB 0909104D0 GB 0909104 A GB0909104 A GB 0909104A GB 0909104 A GB0909104 A GB 0909104A GB 0909104 D0 GB0909104 D0 GB 0909104D0
Authority
GB
United Kingdom
Prior art keywords
data processing
error
computer program
program product
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB0909104A
Other versions
GB2462897A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of GB0909104D0 publication Critical patent/GB0909104D0/en
Publication of GB2462897A publication Critical patent/GB2462897A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31705—Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
GB0909104A 2008-09-02 2009-05-28 Debugging a hardware device comprising combinatorial logic Withdrawn GB2462897A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP08163483 2008-09-02

Publications (2)

Publication Number Publication Date
GB0909104D0 true GB0909104D0 (en) 2009-07-01
GB2462897A GB2462897A (en) 2010-03-03

Family

ID=40863042

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0909104A Withdrawn GB2462897A (en) 2008-09-02 2009-05-28 Debugging a hardware device comprising combinatorial logic

Country Status (1)

Country Link
GB (1) GB2462897A (en)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6970815B1 (en) * 1999-11-18 2005-11-29 Koninklijke Philips Electronics N.V. Method of discriminating between different types of scan failures, computer readable code to cause a display to graphically depict one or more simulated scan output data sets versus time and a computer implemented circuit simulation and fault detection system
US6581191B1 (en) * 1999-11-30 2003-06-17 Synplicity, Inc. Hardware debugging in a hardware description language
US6490702B1 (en) * 1999-12-28 2002-12-03 International Business Machines Corporation Scan structure for improving transition fault coverage and scan diagnostics
US6694454B1 (en) * 2000-06-30 2004-02-17 International Business Machines Corporation Stuck and transient fault diagnostic system
WO2008096922A1 (en) * 2007-02-09 2008-08-14 Industry-Academic Cooperation Foundation, Yonsei University Method for diagnosing troubles in scan chain via symbolic simulation

Also Published As

Publication number Publication date
GB2462897A (en) 2010-03-03

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)