GB0319842D0 - Investigative systems,focussing members for investigative systems and a scanning probe - Google Patents

Investigative systems,focussing members for investigative systems and a scanning probe

Info

Publication number
GB0319842D0
GB0319842D0 GBGB0319842.1A GB0319842A GB0319842D0 GB 0319842 D0 GB0319842 D0 GB 0319842D0 GB 0319842 A GB0319842 A GB 0319842A GB 0319842 D0 GB0319842 D0 GB 0319842D0
Authority
GB
United Kingdom
Prior art keywords
investigative systems
investigative
systems
scanning probe
focussing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GBGB0319842.1A
Other versions
GB2405263B (en
GB2405263A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TeraView Ltd
Original Assignee
TeraView Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TeraView Ltd filed Critical TeraView Ltd
Priority to GB0319842A priority Critical patent/GB2405263B/en
Publication of GB0319842D0 publication Critical patent/GB0319842D0/en
Priority to PCT/GB2004/003632 priority patent/WO2005019810A2/en
Publication of GB2405263A publication Critical patent/GB2405263A/en
Application granted granted Critical
Publication of GB2405263B publication Critical patent/GB2405263B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q15/00—Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
    • H01Q15/02—Refracting or diffracting devices, e.g. lens, prism
    • H01Q15/08—Refracting or diffracting devices, e.g. lens, prism formed of solid dielectric material
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/02—Simple or compound lenses with non-spherical faces
    • G02B3/04—Simple or compound lenses with non-spherical faces with continuous faces that are rotationally symmetrical but deviate from a true sphere, e.g. so called "aspheric" lenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/42—Coupling light guides with opto-electronic elements
    • G02B6/4201—Packages, e.g. shape, construction, internal or external details
    • G02B6/4204—Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms
    • G02B6/4206—Optical features

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Toxicology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB0319842A 2003-08-22 2003-08-22 Sample investigation system with sliding focussing elements Expired - Fee Related GB2405263B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB0319842A GB2405263B (en) 2003-08-22 2003-08-22 Sample investigation system with sliding focussing elements
PCT/GB2004/003632 WO2005019810A2 (en) 2003-08-22 2004-08-20 Thz investigative systems, focussing members for thz investigative systems, and a scanning probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB0319842A GB2405263B (en) 2003-08-22 2003-08-22 Sample investigation system with sliding focussing elements

Publications (3)

Publication Number Publication Date
GB0319842D0 true GB0319842D0 (en) 2003-09-24
GB2405263A GB2405263A (en) 2005-02-23
GB2405263B GB2405263B (en) 2006-07-12

Family

ID=28460191

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0319842A Expired - Fee Related GB2405263B (en) 2003-08-22 2003-08-22 Sample investigation system with sliding focussing elements

Country Status (2)

Country Link
GB (1) GB2405263B (en)
WO (1) WO2005019810A2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111964596A (en) * 2020-08-19 2020-11-20 长春理工大学 Caliper type thickness measuring device and method based on terahertz pulse
CN112378881A (en) * 2020-10-21 2021-02-19 山东省科学院自动化研究所 Terahertz spectrum-based drug identification method

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101203742B (en) 2004-05-26 2011-10-19 派克米瑞斯有限责任公司 Terahertz imaging in reflection and transmission mode for luggage and personnel inspection
EP1899695B8 (en) 2005-06-30 2012-06-27 LED Roadway Lighting Ltd. Method and system for luminance characterization
CA2656177C (en) 2005-06-30 2015-04-21 Streetlight Intelligence, Inc. Adaptive energy performance monitoring and control system
FR2904434B1 (en) * 2006-07-28 2011-04-15 Univ Savoie OPTICAL DEVICE FOR IMAGING OR CHARACTERIZING A MATERIAL SAMPLE IN MICROSCOPY OR SPECTROSCOPY IN REFLECTION IN THE TERAHERTZ SPECTRAL DOMAIN
US7888646B2 (en) 2007-06-04 2011-02-15 Morpho Detection, Inc. System and method for detecting contraband
US7745792B2 (en) 2007-08-15 2010-06-29 Morpho Detection, Inc. Terahertz detectors for use in terahertz inspection or imaging systems
GB2452267B (en) * 2007-08-28 2010-06-16 Teraview Ltd Scanning Terahertz probe
US8290710B2 (en) * 2007-09-07 2012-10-16 Led Roadway Lighting Ltd. Streetlight monitoring and control
JP6169614B2 (en) 2012-01-23 2017-07-26 ザ・リージェンツ・オブ・ザ・ユニバーシティ・オブ・ミシガンＴｈｅ Ｒｅｇｅｎｔｓ Ｏｆ Ｔｈｅ Ｕｎｉｖｅｒｓｉｔｙ Ｏｆ Ｍｉｃｈｉｇａｎ Photoconductive device having a plasmon electrode
DE102013217038A1 (en) * 2013-08-27 2015-03-05 Inoex Gmbh Measuring device for reflection measurements on test objects and method for measuring radiation reflected on test objects
JP2015087163A (en) * 2013-10-29 2015-05-07 パイオニア株式会社 Terahertz wave measuring device
DE102016119728A1 (en) * 2016-10-17 2018-04-19 Inoex Gmbh Lnnovationen Und Ausrüstungen Für Die Extrusionstechnik Terahertz meter
WO2018195429A1 (en) 2017-04-20 2018-10-25 The Regents Of The University Of California Systems and methods for high frequency nanoscopy
WO2021067635A1 (en) 2019-10-01 2021-04-08 The Regents Of The University Of California Method for identifying chemical and structural variations through terahertz time-domain spectroscopy
US12066380B2 (en) 2019-10-31 2024-08-20 The Regents Of The University Of California Methods and systems for detecting water status in plants using terahertz radiation
CN111308464B (en) * 2020-02-29 2024-04-09 哈尔滨吉赫科技有限责任公司 Ultra-wideband terahertz passive anti-stealth radar
DE102020133704B4 (en) 2020-12-16 2022-07-07 CiTEX Holding GmbH THz measuring device and THz measuring method for measuring a corrugated pipe

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4488156A (en) * 1982-02-10 1984-12-11 Hughes Aircraft Company Geodesic dome-lens antenna
JPH0461636A (en) * 1990-06-27 1992-02-27 Omron Corp Optical head
DE4225512C1 (en) * 1992-08-01 1994-02-17 Bosch Gmbh Robert Opto-electronic radiation detector, e.g. for IR communications system - uses semi-ellipsoidal lens coupled to optical sensor via intermediate cylindrical disc
US5706017A (en) * 1993-04-21 1998-01-06 California Institute Of Technology Hybrid antenna including a dielectric lens and planar feed
US5581408A (en) * 1994-05-13 1996-12-03 United Technologies Corporation Method and apparatus for deflecting an optical beam
US5623145A (en) * 1995-02-15 1997-04-22 Lucent Technologies Inc. Method and apparatus for terahertz imaging
JPH11501411A (en) * 1995-12-12 1999-02-02 パレト、エウゲニ ホルダナ Lens structure without spherical aberration and stereo camera including such lens structure
US5789750A (en) * 1996-09-09 1998-08-04 Lucent Technologies Inc. Optical system employing terahertz radiation
EP0840493B1 (en) * 1996-10-30 2005-06-15 Fuji Photo Film Co., Ltd. Method and Apparatus for Inner Face Scanning with Multi Beams
AUPO790397A0 (en) * 1997-07-16 1997-08-07 Lions Eye Institute Of Western Australia Incorporated, The Laser scanning apparatus and method
JP2000214506A (en) * 1998-11-03 2000-08-04 Toshiba Research Europe Ltd Radiation light source and image pickup system
JP2000228023A (en) * 1999-02-05 2000-08-15 Samsung Yokohama Kenkyusho:Kk Optical pickup device
WO2000050859A1 (en) * 1999-02-23 2000-08-31 Teraprobe Limited Method and apparatus for terahertz imaging
US6288815B1 (en) * 1999-03-31 2001-09-11 Philips Electronics North America Corporation Light scanner with cylindrical lenses
GB2371618B (en) * 2001-01-30 2004-11-17 Teraprobe Ltd A probe, apparatus and method for examining a sample
JP3550381B2 (en) * 2001-06-27 2004-08-04 松下電器産業株式会社 Polarization analyzer and polarization analysis method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111964596A (en) * 2020-08-19 2020-11-20 长春理工大学 Caliper type thickness measuring device and method based on terahertz pulse
CN111964596B (en) * 2020-08-19 2021-10-19 长春理工大学 Caliper type thickness measuring device and method based on terahertz pulse
CN112378881A (en) * 2020-10-21 2021-02-19 山东省科学院自动化研究所 Terahertz spectrum-based drug identification method

Also Published As

Publication number Publication date
GB2405263B (en) 2006-07-12
WO2005019810A3 (en) 2005-05-06
GB2405263A (en) 2005-02-23
WO2005019810A2 (en) 2005-03-03

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20160822