GB0314677D0 - Temperature-compensated sensor - Google Patents

Temperature-compensated sensor

Info

Publication number
GB0314677D0
GB0314677D0 GBGB0314677.6A GB0314677A GB0314677D0 GB 0314677 D0 GB0314677 D0 GB 0314677D0 GB 0314677 A GB0314677 A GB 0314677A GB 0314677 D0 GB0314677 D0 GB 0314677D0
Authority
GB
United Kingdom
Prior art keywords
temperature
compensated sensor
compensated
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GBGB0314677.6A
Other versions
GB2386196B (en
GB2386196A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NOVATECH MEASUREMENTS Ltd
Original Assignee
NOVATECH MEASUREMENTS Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NOVATECH MEASUREMENTS Ltd filed Critical NOVATECH MEASUREMENTS Ltd
Publication of GB0314677D0 publication Critical patent/GB0314677D0/en
Publication of GB2386196A publication Critical patent/GB2386196A/en
Application granted granted Critical
Publication of GB2386196B publication Critical patent/GB2386196B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2268—Arrangements for correcting or for compensating unwanted effects
    • G01L1/2281—Arrangements for correcting or for compensating unwanted effects for temperature variations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • G01D3/0365—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves the undesired influence being measured using a separate sensor, which produces an influence related signal

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Force In General (AREA)
  • Measuring Fluid Pressure (AREA)
GB0314677A 2000-12-22 2001-12-21 Temperature-compensated sensor Expired - Lifetime GB2386196B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0031456A GB2370358A (en) 2000-12-22 2000-12-22 Measuring device comprising a temperature sensitive potential divider for temperature compensation
PCT/GB2001/005798 WO2002052228A1 (en) 2000-12-22 2001-12-21 Temperature-compensated sensor

Publications (3)

Publication Number Publication Date
GB0314677D0 true GB0314677D0 (en) 2003-07-30
GB2386196A GB2386196A (en) 2003-09-10
GB2386196B GB2386196B (en) 2004-07-28

Family

ID=9905742

Family Applications (2)

Application Number Title Priority Date Filing Date
GB0031456A Withdrawn GB2370358A (en) 2000-12-22 2000-12-22 Measuring device comprising a temperature sensitive potential divider for temperature compensation
GB0314677A Expired - Lifetime GB2386196B (en) 2000-12-22 2001-12-21 Temperature-compensated sensor

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB0031456A Withdrawn GB2370358A (en) 2000-12-22 2000-12-22 Measuring device comprising a temperature sensitive potential divider for temperature compensation

Country Status (2)

Country Link
GB (2) GB2370358A (en)
WO (1) WO2002052228A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2003133241A (en) * 2003-11-17 2005-04-20 Александр Владимирович Лопатин (RU) DEVICE FOR DETERMINING VALUE OF VARIABLE TIME OF A MEASURED VALUE
CN114878033B (en) * 2022-03-29 2023-12-22 深圳国微感知技术有限公司 Matrix type pressure distribution measurement system and method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4462018A (en) * 1982-11-05 1984-07-24 Gulton Industries, Inc. Semiconductor strain gauge with integral compensation resistors
DE3418751C1 (en) * 1984-05-19 1985-03-14 Hottinger Baldwin Messtechnik Gmbh, 6100 Darmstadt Measurement-bridge circuit for inductive sensors
JPH0664080B2 (en) * 1989-03-10 1994-08-22 山武ハネウエル株式会社 Temperature compensation circuit for flow sensor
US5184520A (en) * 1989-10-18 1993-02-09 Ishida Scales Mfg. Co., Ltd. Load sensor
US5534773A (en) * 1994-06-23 1996-07-09 Mitsubishi Denki Kabushiki Kaisha Method for compensating an offset voltage temperature drift in a semiconductor strain gage sensor

Also Published As

Publication number Publication date
GB0031456D0 (en) 2001-02-07
GB2386196B (en) 2004-07-28
WO2002052228A1 (en) 2002-07-04
GB2370358A (en) 2002-06-26
GB2386196A (en) 2003-09-10

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Legal Events

Date Code Title Description
PE20 Patent expired after termination of 20 years

Expiry date: 20211220