GB0126838D0 - Fullerene ion gun - Google Patents

Fullerene ion gun

Info

Publication number
GB0126838D0
GB0126838D0 GB0126838A GB0126838A GB0126838D0 GB 0126838 D0 GB0126838 D0 GB 0126838D0 GB 0126838 A GB0126838 A GB 0126838A GB 0126838 A GB0126838 A GB 0126838A GB 0126838 D0 GB0126838 D0 GB 0126838D0
Authority
GB
United Kingdom
Prior art keywords
ion gun
fullerene ion
fullerene
gun
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB0126838A
Other versions
GB2386747A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ionoptika Ltd
Original Assignee
Ionoptika Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ionoptika Ltd filed Critical Ionoptika Ltd
Priority to GB0126838A priority Critical patent/GB2386747A/en
Publication of GB0126838D0 publication Critical patent/GB0126838D0/en
Publication of GB2386747A publication Critical patent/GB2386747A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06—Sources
    • H01J2237/08—Ion sources
    • H01J2237/0812—Ionized cluster beam [ICB] sources

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Molecular Biology (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
GB0126838A 2001-11-08 2001-11-08 Fullerene ion gun Withdrawn GB2386747A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB0126838A GB2386747A (en) 2001-11-08 2001-11-08 Fullerene ion gun

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB0126838A GB2386747A (en) 2001-11-08 2001-11-08 Fullerene ion gun

Publications (2)

Publication Number Publication Date
GB0126838D0 true GB0126838D0 (en) 2002-01-02
GB2386747A GB2386747A (en) 2003-09-24

Family

ID=9925399

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0126838A Withdrawn GB2386747A (en) 2001-11-08 2001-11-08 Fullerene ion gun

Country Status (1)

Country Link
GB (1) GB2386747A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113115504A (en) * 2021-04-06 2021-07-13 江苏深蓝航天有限公司 ExB probe capable of guiding beam current

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4497889B2 (en) * 2003-10-29 2010-07-07 アルバック・ファイ株式会社 Electron spectroscopic analysis method and analyzer
US7235796B2 (en) * 2004-11-24 2007-06-26 Technion Research & Development Foundation Ltd. Method and apparatus for the generation of anionic and neutral particulate beams and a system using same
DE102005027937B3 (en) * 2005-06-16 2006-12-07 Ion-Tof Gmbh Method for analyzing a solid sample
US8405326B2 (en) 2006-01-13 2013-03-26 Technion Research & Development Foundation Limited Method and apparatus for generating ion beam
US8835880B2 (en) * 2006-10-31 2014-09-16 Fei Company Charged particle-beam processing using a cluster source
DE102008041813B4 (en) * 2008-09-04 2013-06-20 Carl Zeiss Microscopy Gmbh Method for the depth analysis of an organic sample
GB2484488B (en) 2010-10-12 2013-04-17 Vg Systems Ltd Improvements in and relating to ion guns
CA3137275A1 (en) * 2019-04-19 2020-10-22 SHINE Medical Technologies, LLC Ion source and neutron generator

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2556291C3 (en) * 1975-12-13 1980-11-27 Gesellschaft Fuer Strahlen- Und Umweltforschung Mbh, 8000 Muenchen Scanning ion microscope
DE69212858T2 (en) * 1991-02-22 1997-03-20 Shimadzu Corp Backscatter ion spectrometer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113115504A (en) * 2021-04-06 2021-07-13 江苏深蓝航天有限公司 ExB probe capable of guiding beam current
CN113115504B (en) * 2021-04-06 2022-11-22 江苏深蓝航天有限公司 ExB probe capable of guiding beam current

Also Published As

Publication number Publication date
GB2386747A (en) 2003-09-24

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)