FR969256A - Procédé et appareil pour l'analyse quantitative et qualitative de matières - Google Patents

Procédé et appareil pour l'analyse quantitative et qualitative de matières

Info

Publication number
FR969256A
FR969256A FR969256DA FR969256A FR 969256 A FR969256 A FR 969256A FR 969256D A FR969256D A FR 969256DA FR 969256 A FR969256 A FR 969256A
Authority
FR
France
Prior art keywords
quantitative
materials
qualitative analysis
qualitative
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of FR969256A publication Critical patent/FR969256A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR969256D 1946-07-19 1948-07-16 Procédé et appareil pour l'analyse quantitative et qualitative de matières Expired FR969256A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US684908A US2449066A (en) 1946-07-19 1946-07-19 Analysis by fluorescent X-ray excitation

Publications (1)

Publication Number Publication Date
FR969256A true FR969256A (fr) 1950-12-18

Family

ID=24750044

Family Applications (1)

Application Number Title Priority Date Filing Date
FR969256D Expired FR969256A (fr) 1946-07-19 1948-07-16 Procédé et appareil pour l'analyse quantitative et qualitative de matières

Country Status (2)

Country Link
US (1) US2449066A (fr)
FR (1) FR969256A (fr)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2711480A (en) * 1948-06-29 1955-06-21 Friedman Herbert Method of measuring thickness of thin layers
NL74667C (fr) * 1949-04-19
US2635192A (en) * 1949-10-24 1953-04-14 Babcock & Wilcox Co Fluorescent spectral analysis
US2642537A (en) * 1949-12-22 1953-06-16 United States Steel Corp Apparatus for determining coating thickness
US2578722A (en) * 1950-05-18 1951-12-18 United States Steel Corp Apparatus for determining coating thickness
US2709752A (en) * 1954-01-18 1955-05-31 Philips Corp Method of aligning an X-ray diffraction goniometer and apparatus therefor
US3102952A (en) * 1954-05-27 1963-09-03 Philips Corp X-ray fluorescence analysis of multi-component systems
US2882418A (en) * 1954-08-02 1959-04-14 Philips Corp Analysis of unknown substances
US2928944A (en) * 1954-08-04 1960-03-15 Research Corp Apparatus for x-ray fluorescence analysis
US2842670A (en) * 1955-02-23 1958-07-08 Jr La Verne S Birks Flat crystal fluorescent X-ray spectrograph
US2835820A (en) * 1955-03-07 1958-05-20 Jr La Verne S Birks Curved crystal fluorescent x-ray spectrograph
US2926257A (en) * 1955-05-16 1960-02-23 Friedman Herbert Method of measuring the thickness of thin coatings
US2887585A (en) * 1955-05-17 1959-05-19 Philips Corp X-ray diffraction method and apparatus
US2881327A (en) * 1955-10-14 1959-04-07 Philips Corp Method and apparatus for making x-ray measurements
US2890344A (en) * 1955-12-27 1959-06-09 Philips Corp Analysis of materials by x-rays
US3013157A (en) * 1958-12-31 1961-12-12 High Voitage Engineering Corp Spot-size camera
US3143652A (en) * 1960-05-31 1964-08-04 Gen Electric X-ray collimator comprising a plurality of spaced plastic lamina with X-ray absorbent material coated thereon
US3072789A (en) * 1960-06-13 1963-01-08 Philips Corp X-ray spectral analysis
US3257560A (en) * 1963-05-24 1966-06-21 Ian R Jones Neutron collimator with surface coatings to suppress neutron reflection
DE1623009C3 (de) * 1965-09-16 1974-12-12 Siemens Ag, 1000 Berlin Und 8000 Muenchen Probenträger für ein Röntgenspektrometer
US3688110A (en) * 1970-05-20 1972-08-29 Du Pont Photographic emulsion silver gage
FR2175667B1 (fr) * 1972-03-17 1974-08-02 Aquitaine Petrole

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1546348A (en) * 1921-12-30 1925-07-14 Bovey Thomas Casing structure for automobile heaters
US1589833A (en) * 1923-12-21 1926-06-22 Behnken Hermann Measuring device for the examination of electromagnetic waves
US2025488A (en) * 1933-03-29 1935-12-24 Yap Chu-Phay X-ray diffraction apparatus
US2386785A (en) * 1942-07-28 1945-10-16 Friedman Herbert Method and means for measuring x-ray diffraction patterns

Also Published As

Publication number Publication date
US2449066A (en) 1948-09-14

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