FR963929A - Appareil d'inspection - Google Patents

Appareil d'inspection

Info

Publication number
FR963929A
FR963929A FR963929DA FR963929A FR 963929 A FR963929 A FR 963929A FR 963929D A FR963929D A FR 963929DA FR 963929 A FR963929 A FR 963929A
Authority
FR
France
Prior art keywords
inspection device
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
Inventor
Gaylord W Penney
Harold A Thomas
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CBS Corp
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Application granted granted Critical
Publication of FR963929A publication Critical patent/FR963929A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
FR963929D 1947-04-04 1948-03-26 Appareil d'inspection Expired FR963929A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US739516A US2647214A (en) 1947-04-04 1947-04-04 Inspecting apparatus

Publications (1)

Publication Number Publication Date
FR963929A true FR963929A (fr) 1950-07-25

Family

ID=24972656

Family Applications (1)

Application Number Title Priority Date Filing Date
FR963929D Expired FR963929A (fr) 1947-04-04 1948-03-26 Appareil d'inspection

Country Status (4)

Country Link
US (1) US2647214A (fr)
BE (1) BE481542A (fr)
FR (1) FR963929A (fr)
GB (1) GB641757A (fr)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2763790A (en) * 1952-04-05 1956-09-18 Ohmart Corp Comparator
US2744697A (en) * 1952-06-25 1956-05-08 James A Van Allen Cosmic ray altimeter
US2846522A (en) * 1953-02-18 1958-08-05 Sun Oil Co Differential amplifier circuits
US3024363A (en) * 1953-04-28 1962-03-06 Bofors Ab Device for supervising the internal structure of solid bodies and the content thereof
US2797332A (en) * 1954-08-09 1957-06-25 Librascope Inc Radiacs
DE1053793B (de) * 1954-10-13 1959-03-26 Siemens Ag Einrichtung zur Messung der Dicke bzw. des Flaechengewichtes von band- oder tafelfoermigem Messgut mittels radioaktiver oder Roentgenstrahlen und eines Vergleichsnormals
US2890347A (en) * 1954-11-15 1959-06-09 Owens Illinois Glass Co Comparing and measuring values by use of x-rays
US2904690A (en) * 1954-12-31 1959-09-15 Philips Corp Device for determining the relative deviation in percent of the mean frequencies of pulse sources
US3010020A (en) * 1955-05-17 1961-11-21 Curtiss Wright Corp Apparatus for continuously measuring the mass per unit area of a coating
US2836720A (en) * 1955-09-06 1958-05-27 Rca Corp Balancing circuit
US2903524A (en) * 1956-01-31 1959-09-08 Ca Atomic Energy Ltd D-c amplifier
US2965847A (en) * 1956-12-18 1960-12-20 Industrial Nucleonics Corp Measuring system
US3012140A (en) * 1959-01-28 1961-12-05 United States Steel Corp Apparatus for measuring the thickness of a coating on a base material
FR2133318A5 (fr) * 1971-04-16 1972-11-24 Thomson Csf

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE293240C (fr) *
FR554001A (fr) * 1922-07-17 1923-06-04 Gaiffe Gallot Et Pilon Ets Procédé de mesure du rayonnement chi ou de la longueur d'onde moyenne et dispositifs en permettant la réalisation
FR601545A (fr) * 1924-10-30 1926-03-03 Procédé et dispositif pour l'application des rayons x à l'étude des corps simples ou complexes
US2097760A (en) * 1930-11-29 1937-11-02 Failla Gloacchino Testing method and apparatus
US2094318A (en) * 1930-12-01 1937-09-28 Failla Gioacchino Methods and means for testing radiant energy
US2264725A (en) * 1940-08-02 1941-12-02 Westinghouse Electric & Mfg Co Thickness gauge for rolling mills
US2346486A (en) * 1941-10-07 1944-04-11 Texas Co Method and apparatus for measuring thickness
US2365763A (en) * 1941-11-10 1944-12-26 Kalb Well logging device
US2349429A (en) * 1942-04-29 1944-05-23 Texaco Development Corp Method and apparatus for measuring thickness
GB567280A (en) * 1943-10-25 1945-02-06 British Thomson Houston Co Ltd Improvements in and relating to apparatus for testing by x-ray ionization
US2536617A (en) * 1945-02-27 1951-01-02 Barton L Weller Direct current negative feedback amplifier
US2458099A (en) * 1945-10-19 1949-01-04 Harold D Roop Ionization chamber
US2537914A (en) * 1946-06-01 1951-01-09 Automatic X Ray Corp Control system
US2465938A (en) * 1946-11-21 1949-03-29 Francis R Shonka Radiation measuring device

Also Published As

Publication number Publication date
US2647214A (en) 1953-07-28
GB641757A (en) 1950-08-16
BE481542A (fr) 1948-04-15

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