FR843213A - Microscope à trame électronique à enregistrement photographique - Google Patents

Microscope à trame électronique à enregistrement photographique

Info

Publication number
FR843213A
FR843213A FR843213DA FR843213A FR 843213 A FR843213 A FR 843213A FR 843213D A FR843213D A FR 843213DA FR 843213 A FR843213 A FR 843213A
Authority
FR
France
Prior art keywords
photographic recording
recording electronic
raster microscope
electronic raster
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
French (fr)
Inventor
Manfred Von Ardenne
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens and Halske AG
Siemens AG
Original Assignee
Siemens and Halske AG
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens and Halske AG, Siemens AG filed Critical Siemens and Halske AG
Application granted granted Critical
Publication of FR843213A publication Critical patent/FR843213A/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/22—Optical or photographic arrangements associated with the tube
    • H01J37/224—Luminescent screens or photographic plates for imaging ; Apparatus specially adapted therefor, e.g. cameras, TV-cameras, photographic equipment, exposure control; Optical subsystems specially adapted therefor, e.g. microscopes for observing image on luminescent screen
    • D—TEXTILES; PAPER
    • D04—BRAIDING; LACE-MAKING; KNITTING; TRIMMINGS; NON-WOVEN FABRICS
    • D04B—KNITTING
    • D04B15/00—Details of, or auxiliary devices incorporated in, weft knitting machines, restricted to machines of this kind
    • D04B15/66—Devices for determining or controlling patterns ; Programme-control arrangements
    • D04B15/68—Devices for determining or controlling patterns ; Programme-control arrangements characterised by the knitting instruments used
    • D04B15/78—Electrical devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/28—Scanning microscopes
    • H01J2237/2802—Transmission microscopes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR843213D 1937-09-11 1938-09-09 Microscope à trame électronique à enregistrement photographique Expired FR843213A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE518951X 1937-09-11

Publications (1)

Publication Number Publication Date
FR843213A true FR843213A (fr) 1939-06-28

Family

ID=6550298

Family Applications (1)

Application Number Title Priority Date Filing Date
FR843213D Expired FR843213A (fr) 1937-09-11 1938-09-09 Microscope à trame électronique à enregistrement photographique

Country Status (5)

Country Link
US (1) US2241432A (sv)
BE (1) BE430092A (sv)
FR (1) FR843213A (sv)
GB (1) GB518951A (sv)
NL (1) NL53866C (sv)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2527562A (en) * 1945-08-02 1950-10-31 Raymond E Mccormick Apparatus for recording oscilloscopic signal traces
US2680669A (en) * 1947-11-26 1954-06-08 Jr Ward Shepard Cathode ray multisignal measuring and recording apparatus
US2729748A (en) * 1950-08-17 1956-01-03 High Voltage Engineering Corp Apparatus for sterilizing foods, drugs and other substances by scanning action of high-energy electrons
US2680815A (en) * 1950-12-28 1954-06-08 High Voltage Engineering Corp Method of and apparatus for treating substances with high energy electrons
US2839602A (en) * 1951-10-09 1958-06-17 Julius Cato Vredenburg Inglesb Method of and apparatus for recording pictures
US2901627A (en) * 1953-02-19 1959-08-25 Leitz Ernst Gmbh Method of and apparatus for the electronic magnification of objects
US2932549A (en) * 1953-11-20 1960-04-12 Technicon Instr Method and apparatus for recording vectorcardiographs
US2894160A (en) * 1954-09-09 1959-07-07 Sheldon Edward Emanuel Electron microscopes
US3025125A (en) * 1957-08-06 1962-03-13 Texaco Inc Method and apparatus for photographing oscilloscopic sweep magnified signals
US3346736A (en) * 1964-09-22 1967-10-10 Applied Res Lab Inc Electron probe apparatus having an objective lens with an aperture for restricting fluid flow
DE2223367C3 (de) * 1972-05-12 1978-11-30 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V., 3400 Goettingen Mikrostrahlsonde zur quantitativen Erfassung von geladenen Sekundärteilchen
AU534811B2 (en) * 1979-07-03 1984-02-16 Unisearch Limited Atmospheric scanning electron microscope
US7618906B2 (en) * 2005-11-17 2009-11-17 Oxford Instruments Analytical Oy Window membrane for detector and analyser devices, and a method for manufacturing a window membrane
US7474730B2 (en) * 2006-10-17 2009-01-06 Oxford Instruments Analytical Oy Compensation for fluctuations over time in the radiation characteristics of the X-ray source in an XRF analyser

Also Published As

Publication number Publication date
NL53866C (sv)
US2241432A (en) 1941-05-13
BE430092A (sv)
GB518951A (en) 1940-03-12

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