FR841824A - Electron microscope - Google Patents
Electron microscopeInfo
- Publication number
- FR841824A FR841824A FR841824DA FR841824A FR 841824 A FR841824 A FR 841824A FR 841824D A FR841824D A FR 841824DA FR 841824 A FR841824 A FR 841824A
- Authority
- FR
- France
- Prior art keywords
- electron microscope
- microscope
- electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE517704X | 1937-08-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
FR841824A true FR841824A (en) | 1939-05-31 |
Family
ID=6549657
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR841824D Expired FR841824A (en) | 1937-08-17 | 1938-08-08 | Electron microscope |
Country Status (5)
Country | Link |
---|---|
US (1) | US2268539A (en) |
BE (1) | BE429638A (en) |
FR (1) | FR841824A (en) |
GB (1) | GB517704A (en) |
NL (1) | NL52570C (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE955537C (en) * | 1942-01-17 | 1957-01-03 | Siemens Ag | Holder for specimen slide, which is built into the interior of a vacuum space of a particle beam apparatus, in particular an electron microscope |
US2423158A (en) * | 1944-04-19 | 1947-07-01 | Rca Corp | Specimen chamber for electron microscopes |
US2418317A (en) * | 1944-04-27 | 1947-04-01 | Rca Corp | Electronic gun adjustment |
US2679018A (en) * | 1950-06-30 | 1954-05-18 | Rca Corp | Magnetic electron lens pole piece |
US3939353A (en) * | 1972-05-22 | 1976-02-17 | Kabushiki Kaisha Akashi Seisakusho | Electron microscope specimen mounting apparatus |
EP1526372A3 (en) * | 2004-11-02 | 2005-05-04 | Agilent Technologies, Inc. | Microfluidic system with adjustment for an optical detection |
CN103730312B (en) * | 2014-01-09 | 2015-12-02 | 东北大学 | A kind of sample platform for nanomechanic test system and using method thereof |
-
0
- NL NL52570D patent/NL52570C/xx active
- BE BE429638D patent/BE429638A/xx unknown
-
1938
- 1938-08-05 GB GB23222/38A patent/GB517704A/en not_active Expired
- 1938-08-08 FR FR841824D patent/FR841824A/en not_active Expired
- 1938-08-17 US US225278A patent/US2268539A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
GB517704A (en) | 1940-02-06 |
BE429638A (en) | |
US2268539A (en) | 1941-12-30 |
NL52570C (en) |
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