FR3108176B1 - Dispositif de détection de défauts de surface sur au moins une face terminale d’au moins une fibre optique. - Google Patents

Dispositif de détection de défauts de surface sur au moins une face terminale d’au moins une fibre optique. Download PDF

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Publication number
FR3108176B1
FR3108176B1 FR2002362A FR2002362A FR3108176B1 FR 3108176 B1 FR3108176 B1 FR 3108176B1 FR 2002362 A FR2002362 A FR 2002362A FR 2002362 A FR2002362 A FR 2002362A FR 3108176 B1 FR3108176 B1 FR 3108176B1
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France
Prior art keywords
face
surface defects
optical fiber
detecting surface
reference images
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Active
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FR2002362A
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English (en)
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FR3108176A1 (fr
Inventor
Yannick Laperriere
Julien Maille
Eric Tanguy
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Data Pixel SAS
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Data Pixel SAS
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Publication date
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Priority to FR2002362A priority Critical patent/FR3108176B1/fr
Priority to US17/191,906 priority patent/US11808991B2/en
Priority to CN202110256078.XA priority patent/CN113379670A/zh
Publication of FR3108176A1 publication Critical patent/FR3108176A1/fr
Application granted granted Critical
Publication of FR3108176B1 publication Critical patent/FR3108176B1/fr
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Anticipated expiration legal-status Critical

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Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24Coupling light guides
    • G02B6/36Mechanical coupling means
    • G02B6/38Mechanical coupling means having fibre to fibre mating means
    • G02B6/3807Dismountable connectors, i.e. comprising plugs
    • G02B6/3833Details of mounting fibres in ferrules; Assembly methods; Manufacture
    • G02B6/385Accessories for testing or observation of connectors
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30Testing of optical devices, constituted by fibre optics or optical waveguides
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/94Investigating contamination, e.g. dust
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computing arrangements based on biological models
    • G06N3/02Neural networks
    • G06N3/04Architecture, e.g. interconnection topology
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/136Segmentation; Edge detection involving thresholding
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8883Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges involving the calculation of gauges, generating models
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511Optical elements other than lenses, e.g. mirrors
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10056Microscopic image
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20081Training; Learning
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20084Artificial neural networks [ANN]
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Multimedia (AREA)
  • Data Mining & Analysis (AREA)
  • General Engineering & Computer Science (AREA)
  • Computational Linguistics (AREA)
  • Biomedical Technology (AREA)
  • Evolutionary Computation (AREA)
  • Molecular Biology (AREA)
  • Computing Systems (AREA)
  • Biophysics (AREA)
  • Mathematical Physics (AREA)
  • Software Systems (AREA)
  • Artificial Intelligence (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

L’invention concerne un dispositif de détection (10) de défauts de surface (62-65) sur une face terminale (16) d’une fibre optique (14), ledit dispositif comportant :- un microscope numérique (15) configuré pour capter une image (img1) d’une face terminale (16) ; et- des moyens d’analyse (25) de ladite image (img1), configurés pour détecter des défauts de surface présents sur la face terminale (16), les moyens d’analyse intégrant un réseau de neurones (26) de type « U-Net » dont la phase d’apprentissage a été réalisée par l’intermédiaire d’un augmenteur ; ledit augmenteur étant configuré pour créer des images d’apprentissage, destinée à entrainer ledit réseau de neurones (26), à partir d’images de référence ; lesdites images d’apprentissage étant obtenues à partir desdites images de référence en appliquant uniquement des retournements, des rotations et/ou des variations de luminosité, de contraste ou de teinte sur lesdites images de référence. Figure pour abrégé : Fig 1
FR2002362A 2020-03-10 2020-03-10 Dispositif de détection de défauts de surface sur au moins une face terminale d’au moins une fibre optique. Active FR3108176B1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR2002362A FR3108176B1 (fr) 2020-03-10 2020-03-10 Dispositif de détection de défauts de surface sur au moins une face terminale d’au moins une fibre optique.
US17/191,906 US11808991B2 (en) 2020-03-10 2021-03-04 Device of detection of surface defects on at least one terminal surface of at least one optical fiber
CN202110256078.XA CN113379670A (zh) 2020-03-10 2021-03-09 检测至少一个光纤的至少一个端面上的表面缺陷的装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR2002362 2020-03-10
FR2002362A FR3108176B1 (fr) 2020-03-10 2020-03-10 Dispositif de détection de défauts de surface sur au moins une face terminale d’au moins une fibre optique.

Publications (2)

Publication Number Publication Date
FR3108176A1 FR3108176A1 (fr) 2021-09-17
FR3108176B1 true FR3108176B1 (fr) 2022-09-02

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FR2002362A Active FR3108176B1 (fr) 2020-03-10 2020-03-10 Dispositif de détection de défauts de surface sur au moins une face terminale d’au moins une fibre optique.

Country Status (3)

Country Link
US (1) US11808991B2 (fr)
CN (1) CN113379670A (fr)
FR (1) FR3108176B1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116912205B (zh) * 2023-07-13 2024-03-08 上海频准激光科技有限公司 一种基于神经网络模型的光纤熔接质量预测方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5179419A (en) 1991-11-22 1993-01-12 At&T Bell Laboratories Methods of detecting, classifying and quantifying defects in optical fiber end faces
US6751017B2 (en) 2002-03-19 2004-06-15 Westover Scientific, Inc. Microscope for backplane ribbon fiber analysis
US7312859B2 (en) 2004-01-30 2007-12-25 Promet International, Inc. Optical fiber inspection device
US7336884B2 (en) 2006-07-20 2008-02-26 Lightel Technologies Inc. Adaptive device for shifting imaging axis across fiber-optic endfaces in multi-fiber connector for inspection
WO2014205214A1 (fr) * 2013-06-19 2014-12-24 Afl Telecommunications Llc Sélection de mode automatique dans des images d'extrémité de fibre optique
US11069030B2 (en) * 2018-03-22 2021-07-20 Adobe, Inc. Aesthetics-guided image enhancement
WO2019212850A2 (fr) 2018-05-02 2019-11-07 Corning Research & Development Corporation Procédés de détection de contaminants sur des connecteurs de fibres optiques
CN110335269A (zh) * 2018-05-16 2019-10-15 腾讯医疗健康(深圳)有限公司 眼底图像的类别识别方法和装置
JP2020020997A (ja) * 2018-08-02 2020-02-06 古河電気工業株式会社 融着接続システム、融着接続機及び光ファイバ種判別方法
US11821808B2 (en) * 2019-08-30 2023-11-21 Exfo Inc. Signature recognition on optical-fiber connector endfaces
EP4038366A4 (fr) * 2019-10-01 2024-03-06 Univ California Procédé d'identification de variations chimiques et structurales par spectroscopie térahertz dans le domaine temporel
US11436725B2 (en) * 2019-11-15 2022-09-06 Arizona Board Of Regents On Behalf Of Arizona State University Systems, methods, and apparatuses for implementing a self-supervised chest x-ray image analysis machine-learning model utilizing transferable visual words

Also Published As

Publication number Publication date
FR3108176A1 (fr) 2021-09-17
US20210286133A1 (en) 2021-09-16
CN113379670A (zh) 2021-09-10
US11808991B2 (en) 2023-11-07

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