FR3107627B1 - Circuit de contrôle d'une photodiode SPAD - Google Patents

Circuit de contrôle d'une photodiode SPAD Download PDF

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Publication number
FR3107627B1
FR3107627B1 FR2001884A FR2001884A FR3107627B1 FR 3107627 B1 FR3107627 B1 FR 3107627B1 FR 2001884 A FR2001884 A FR 2001884A FR 2001884 A FR2001884 A FR 2001884A FR 3107627 B1 FR3107627 B1 FR 3107627B1
Authority
FR
France
Prior art keywords
current
current source
spad photodiode
series
control circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR2001884A
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English (en)
Other versions
FR3107627A1 (fr
Inventor
François Ayel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA, Commissariat a lEnergie Atomique et aux Energies Alternatives CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR2001884A priority Critical patent/FR3107627B1/fr
Priority to US17/170,563 priority patent/US11982565B2/en
Priority to CN202110212342.XA priority patent/CN113315494A/zh
Publication of FR3107627A1 publication Critical patent/FR3107627A1/fr
Application granted granted Critical
Publication of FR3107627B1 publication Critical patent/FR3107627B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/02016—Circuit arrangements of general character for the devices
    • H01L31/02019—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02027—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier for devices working in avalanche mode
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/04—Modifications for accelerating switching
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4413—Type
    • G01J2001/442—Single-photon detection or photon counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/446—Photodiode
    • G01J2001/4466—Avalanche

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electronic Switches (AREA)
  • Amplifiers (AREA)

Abstract

Circuit de contrôle d'une photodiode SPAD La présente description concerne un circuit (300) de contrôle d'une photodiode SPAD, comportant : - une première source de courant (101) ; - un miroir de courant comportant un transistor d'entrée (107) en série avec la première source de courant (101) et un transistor de sortie (109) en série avec la photodiode SPAD (PD) ; et - une deuxième source de courant (301) en série avec le transistor d'entrée (107) du miroir de courant et en parallèle de la première source de courant (101), la deuxième source de courant (301) étant commandable en alternance dans un état dit inactif dans lequel elle ne délivre pas de courant, et dans un état dit actif dans lequel elle délivre un courant (If) non nul qui s'additionne, dans le transistor d'entrée (107) du miroir de courant, à un courant (Ib) délivré par la première source de courant (101). Figure pour l'abrégé : Fig. 3
FR2001884A 2020-02-26 2020-02-26 Circuit de contrôle d'une photodiode SPAD Active FR3107627B1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR2001884A FR3107627B1 (fr) 2020-02-26 2020-02-26 Circuit de contrôle d'une photodiode SPAD
US17/170,563 US11982565B2 (en) 2020-02-26 2021-02-08 SPAD photodiode control circuit
CN202110212342.XA CN113315494A (zh) 2020-02-26 2021-02-25 Spad光电二极管控制电路

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR2001884A FR3107627B1 (fr) 2020-02-26 2020-02-26 Circuit de contrôle d'une photodiode SPAD
FR2001884 2020-02-26

Publications (2)

Publication Number Publication Date
FR3107627A1 FR3107627A1 (fr) 2021-08-27
FR3107627B1 true FR3107627B1 (fr) 2022-02-25

Family

ID=71452376

Family Applications (1)

Application Number Title Priority Date Filing Date
FR2001884A Active FR3107627B1 (fr) 2020-02-26 2020-02-26 Circuit de contrôle d'une photodiode SPAD

Country Status (3)

Country Link
US (1) US11982565B2 (fr)
CN (1) CN113315494A (fr)
FR (1) FR3107627B1 (fr)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021167890A1 (fr) 2020-02-21 2021-08-26 Hi Llc Ensemble module pouvant être portés pour un système de mesure optique
US12029558B2 (en) 2020-02-21 2024-07-09 Hi Llc Time domain-based optical measurement systems and methods configured to measure absolute properties of tissue
WO2021167893A1 (fr) 2020-02-21 2021-08-26 Hi Llc Ensembles détecteurs intégrés pour un module pouvant être porté d'un système de mesure optique
US11883181B2 (en) 2020-02-21 2024-01-30 Hi Llc Multimodal wearable measurement systems and methods
WO2021167892A1 (fr) 2020-02-21 2021-08-26 Hi Llc Dispositifs et ensembles portables avec positionnement réglable destinés à être utilisés dans un système de mesure optique
US11969259B2 (en) 2020-02-21 2024-04-30 Hi Llc Detector assemblies for a wearable module of an optical measurement system and including spring-loaded light-receiving members
US11950879B2 (en) 2020-02-21 2024-04-09 Hi Llc Estimation of source-detector separation in an optical measurement system
US11607132B2 (en) 2020-03-20 2023-03-21 Hi Llc Temporal resolution control for temporal point spread function generation in an optical measurement system
WO2021188496A1 (fr) 2020-03-20 2021-09-23 Hi Llc Étalonnage de photodétecteur d'un système de mesure optique
WO2021188485A1 (fr) 2020-03-20 2021-09-23 Hi Llc Maintien de sensibilité de photodétecteur constante dans un système de mesure optique
WO2021188488A1 (fr) 2020-03-20 2021-09-23 Hi Llc Génération de tension de polarisation dans un système de mesure optique
US11645483B2 (en) 2020-03-20 2023-05-09 Hi Llc Phase lock loop circuit based adjustment of a measurement time window in an optical measurement system
US11877825B2 (en) 2020-03-20 2024-01-23 Hi Llc Device enumeration in an optical measurement system
US11187575B2 (en) 2020-03-20 2021-11-30 Hi Llc High density optical measurement systems with minimal number of light sources
US12059262B2 (en) * 2020-03-20 2024-08-13 Hi Llc Maintaining consistent photodetector sensitivity in an optical measurement system
US11857348B2 (en) 2020-03-20 2024-01-02 Hi Llc Techniques for determining a timing uncertainty of a component of an optical measurement system
US11864867B2 (en) 2020-03-20 2024-01-09 Hi Llc Control circuit for a light source in an optical measurement system by applying voltage with a first polarity to start an emission of a light pulse and applying voltage with a second polarity to stop the emission of the light pulse
CN115291663A (zh) * 2022-08-03 2022-11-04 深圳市灵明光子科技有限公司 一种spad控制电路、spad阵列和激光测距装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4590974B2 (ja) * 2004-08-09 2010-12-01 住友電気工業株式会社 光受信回路
EP3598740B1 (fr) * 2018-02-27 2022-09-14 Shenzhen Goodix Technology Co., Ltd. Capteur d'image et circuit de compensation de sortie du capteur d'image
TWI846805B (zh) * 2019-03-07 2024-07-01 日商索尼半導體解決方案公司 受光裝置及測距裝置
JP2020153712A (ja) * 2019-03-18 2020-09-24 ソニーセミコンダクタソリューションズ株式会社 電流生成回路および測距システム

Also Published As

Publication number Publication date
US20210265512A1 (en) 2021-08-26
CN113315494A (zh) 2021-08-27
FR3107627A1 (fr) 2021-08-27
US11982565B2 (en) 2024-05-14

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