FR3094558B1 - Dispositif de spectroscopie de perte et de gain d’énergie stimulés ou hors équilibre - Google Patents

Dispositif de spectroscopie de perte et de gain d’énergie stimulés ou hors équilibre Download PDF

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Publication number
FR3094558B1
FR3094558B1 FR1903201A FR1903201A FR3094558B1 FR 3094558 B1 FR3094558 B1 FR 3094558B1 FR 1903201 A FR1903201 A FR 1903201A FR 1903201 A FR1903201 A FR 1903201A FR 3094558 B1 FR3094558 B1 FR 3094558B1
Authority
FR
France
Prior art keywords
stimulated
spectroscopy device
energy gain
loss spectroscopy
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1903201A
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English (en)
Other versions
FR3094558A1 (fr
Inventor
Mathieu Kociak
Marcel Tencé
Jean-Denis Blazit
Pabitra Das
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Universite Paris Saclay
Original Assignee
Centre National de la Recherche Scientifique CNRS
Universite Paris Sud Paris 11
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS, Universite Paris Sud Paris 11 filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR1903201A priority Critical patent/FR3094558B1/fr
Priority to US16/830,646 priority patent/US11830718B2/en
Publication of FR3094558A1 publication Critical patent/FR3094558A1/fr
Application granted granted Critical
Publication of FR3094558B1 publication Critical patent/FR3094558B1/fr
Active legal-status Critical Current
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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/045—Beam blanking or chopping, i.e. arrangements for momentarily interrupting exposure to the discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/22—Optical, image processing or photographic arrangements associated with the tube
    • H01J37/226—Optical arrangements for illuminating the object; optical arrangements for collecting light from the object
    • H01J37/228—Optical arrangements for illuminating the object; optical arrangements for collecting light from the object whereby illumination or light collection take place in the same area of the discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/0063—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by applying a resonant excitation voltage
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/061—Ion deflecting means, e.g. ion gates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/04—Means for controlling the discharge
    • H01J2237/043—Beam blanking
    • H01J2237/0432—High speed and short duration
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/05—Arrangements for energy or mass analysis
    • H01J2237/057—Energy or mass filtering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/24485—Energy spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/248—Components associated with the control of the tube
    • H01J2237/2482—Optical means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/2617—Comparison or superposition of transmission images; Moiré
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/262—Non-scanning techniques
    • H01J2237/2623—Field-emission microscopes
    • H01J2237/2626—Pulsed source
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/28—Scanning microscopes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

L’invention concerne un dispositif de spectroscopie (200) comprenant : une source d’électrons (102) agencée pour émettre un flux d’électrons vers un échantillon (104), une source de photons (106) pulsée émettant des impulsions de photons vers ledit échantillon (104), et au moins un spectromètre (108) pour recevoir un flux d’électrons provenant de l’échantillon (104), et au moins un détecteur d’électrons (112) ; caractérisé en ce que le dispositif (200) comprend en outre au moins un déflecteur (202), entre la source d’électrons (102) et au moins un détecteur d’électrons (112), synchronisé avec ladite source de photons pulsée (106) pour autoriser ou interdire le passage d’électrons émis par ladite source d’électrons (102), vers ledit détecteur d’électrons (112).
FR1903201A 2019-03-27 2019-03-27 Dispositif de spectroscopie de perte et de gain d’énergie stimulés ou hors équilibre Active FR3094558B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR1903201A FR3094558B1 (fr) 2019-03-27 2019-03-27 Dispositif de spectroscopie de perte et de gain d’énergie stimulés ou hors équilibre
US16/830,646 US11830718B2 (en) 2019-03-27 2020-03-26 Stimulated or non-equilibrium energy-loss and energy-gain spectroscopy device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1903201A FR3094558B1 (fr) 2019-03-27 2019-03-27 Dispositif de spectroscopie de perte et de gain d’énergie stimulés ou hors équilibre
FR1903201 2019-03-27

Publications (2)

Publication Number Publication Date
FR3094558A1 FR3094558A1 (fr) 2020-10-02
FR3094558B1 true FR3094558B1 (fr) 2023-01-06

Family

ID=67660248

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1903201A Active FR3094558B1 (fr) 2019-03-27 2019-03-27 Dispositif de spectroscopie de perte et de gain d’énergie stimulés ou hors équilibre

Country Status (2)

Country Link
US (1) US11830718B2 (fr)
FR (1) FR3094558B1 (fr)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8429761B2 (en) * 2009-09-18 2013-04-23 California Institute Of Technology Photon induced near field electron microscope and biological imaging system
EP2388796A1 (fr) * 2010-05-21 2011-11-23 FEI Company Détection simultanée d'électrons
US8569712B2 (en) * 2010-10-07 2013-10-29 Fei Company Beam blanker for interrupting a beam of charged particles
US9464998B2 (en) * 2014-06-20 2016-10-11 California Institute Of Technology Method and system for electron microscope with multiple cathodes
EP2998979A1 (fr) * 2014-09-22 2016-03-23 Fei Company Spectroscopie améliorée dans un système de microscope à particules chargées de transmission
JP6702807B2 (ja) * 2016-06-14 2020-06-03 日本電子株式会社 電子顕微鏡および画像取得方法
EP3327748B1 (fr) * 2016-11-28 2019-03-27 FEI Company Spectroscopie de particules chargées de temps de vol

Also Published As

Publication number Publication date
US11830718B2 (en) 2023-11-28
US20200312649A1 (en) 2020-10-01
FR3094558A1 (fr) 2020-10-02

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