FR3063144B1 - SPECTROMETER AND METHOD FOR ANALYZING AN OBJECT - Google Patents
SPECTROMETER AND METHOD FOR ANALYZING AN OBJECT Download PDFInfo
- Publication number
- FR3063144B1 FR3063144B1 FR1851372A FR1851372A FR3063144B1 FR 3063144 B1 FR3063144 B1 FR 3063144B1 FR 1851372 A FR1851372 A FR 1851372A FR 1851372 A FR1851372 A FR 1851372A FR 3063144 B1 FR3063144 B1 FR 3063144B1
- Authority
- FR
- France
- Prior art keywords
- receiving
- installation
- spectrometer
- analyzing
- light beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000009434 installation Methods 0.000 abstract 4
- 238000005259 measurement Methods 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0264—Electrical interface; User interface
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
- G01J1/22—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means
- G01J1/24—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
- G01J1/28—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source
- G01J1/30—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/027—Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0289—Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/02—Mechanical
- G01N2201/022—Casings
- G01N2201/0221—Portable; cableless; compact; hand-held
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Human Computer Interaction (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Spectromètre (1) pour analyser un objet (7) comprenant : une installation d'émission (2) émettant un faisceau lumineux (L), une installation de réception (3) recevant le faisceau lumineux (L) réfléchi par l'objet (7) et fournissant une grandeur de mesure comprenant une intensité de signal et/ou un rapport signal/bruit et, une installation de commande (4) pour faire varier un paramètre de fonctionnement de l'installation d'émission (2) et/ou de l'installation de réception (3), recevoir les grandeurs de mesure de l'installation de réception (3) et en fonction des grandeurs de mesure, fournir à l'utilisateur du spectromètre (1), un signal indicateur pour modifier les conditions de mesure selon le paramètre de fonctionnement.Spectrometer (1) for analyzing an object (7) comprising: an emission installation (2) emitting a light beam (L), a reception installation (3) receiving the light beam (L) reflected by the object (7 ) and supplying a measurement quantity comprising a signal intensity and/or a signal/noise ratio and, a control device (4) for varying an operating parameter of the transmitting device (2) and/or of receiving installation (3), receiving the measured quantities from the receiving installation (3) and, depending on the measured quantities, providing the user of the spectrometer (1) with an indicator signal to modify the conditions of measurement according to the operating parameter.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102017202661.8 | 2017-02-20 | ||
DE102017202661.8A DE102017202661A1 (en) | 2017-02-20 | 2017-02-20 | Spectrometer and method for analyzing an object |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3063144A1 FR3063144A1 (en) | 2018-08-24 |
FR3063144B1 true FR3063144B1 (en) | 2022-04-29 |
Family
ID=63046172
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1851372A Expired - Fee Related FR3063144B1 (en) | 2017-02-20 | 2018-02-19 | SPECTROMETER AND METHOD FOR ANALYZING AN OBJECT |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE102017202661A1 (en) |
FR (1) | FR3063144B1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102018220601A1 (en) | 2018-11-29 | 2020-06-04 | Robert Bosch Gmbh | Spectrometer device and a corresponding method for operating a spectrometer device |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10042003B4 (en) | 2000-08-26 | 2005-08-11 | Robert Bosch Gmbh | Material testing device and its use |
US6661509B2 (en) * | 2001-02-07 | 2003-12-09 | Thermo Electron Scientific Instruments Corporation | Method and apparatus for alignment of multiple beam paths in spectroscopy |
US7586602B2 (en) | 2006-07-24 | 2009-09-08 | General Electric Company | Method and apparatus for improved signal to noise ratio in Raman signal detection for MEMS based spectrometers |
JP4356724B2 (en) | 2006-09-20 | 2009-11-04 | 株式会社デンソー | Infrared gas detector and gas detection method thereof |
US20090219525A1 (en) * | 2008-02-29 | 2009-09-03 | Honeywell International Inc. | System and method for portable raman spectroscopy |
JP2013181912A (en) | 2012-03-02 | 2013-09-12 | Seiko Epson Corp | Component analyzer |
WO2014143235A1 (en) * | 2013-03-14 | 2014-09-18 | Integrated Plasmonics Corporation | Ambient light assisted spectroscopy |
WO2016125164A2 (en) * | 2015-02-05 | 2016-08-11 | Verifood, Ltd. | Spectrometry system applications |
-
2017
- 2017-02-20 DE DE102017202661.8A patent/DE102017202661A1/en not_active Withdrawn
-
2018
- 2018-02-19 FR FR1851372A patent/FR3063144B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
FR3063144A1 (en) | 2018-08-24 |
DE102017202661A1 (en) | 2018-08-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PLFP | Fee payment |
Year of fee payment: 3 |
|
PLSC | Publication of the preliminary search report |
Effective date: 20200501 |
|
PLFP | Fee payment |
Year of fee payment: 4 |
|
PLFP | Fee payment |
Year of fee payment: 5 |
|
ST | Notification of lapse |
Effective date: 20231005 |