FR3047633B1 - INTEGRATED CIRCUIT WITH AUXILIARY POWER SUPPLY PINS - Google Patents

INTEGRATED CIRCUIT WITH AUXILIARY POWER SUPPLY PINS Download PDF

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Publication number
FR3047633B1
FR3047633B1 FR1650980A FR1650980A FR3047633B1 FR 3047633 B1 FR3047633 B1 FR 3047633B1 FR 1650980 A FR1650980 A FR 1650980A FR 1650980 A FR1650980 A FR 1650980A FR 3047633 B1 FR3047633 B1 FR 3047633B1
Authority
FR
France
Prior art keywords
power supply
integrated circuit
auxiliary power
supply system
supply pins
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1650980A
Other languages
French (fr)
Other versions
FR3047633A1 (en
Inventor
Cedric BENABEN
Didier LASCOMBES
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Continental Automotive GmbH
Continental Automotive France SAS
Original Assignee
Continental Automotive GmbH
Continental Automotive France SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Continental Automotive GmbH, Continental Automotive France SAS filed Critical Continental Automotive GmbH
Priority to FR1650980A priority Critical patent/FR3047633B1/en
Priority to US15/425,431 priority patent/US10598725B2/en
Priority to CN201710066773.3A priority patent/CN107046013B/en
Publication of FR3047633A1 publication Critical patent/FR3047633A1/en
Application granted granted Critical
Publication of FR3047633B1 publication Critical patent/FR3047633B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/263—Arrangements for using multiple switchable power supplies, e.g. battery and AC

Abstract

La présente invention a pour objet un circuit intégré (1) comprenant deux bornes (2a, 2b) d'alimentation électrique respectivement positive et de masse faisant partie d'un premier système d'alimentation (2) électrique interne au circuit intégré et assurant son alimentation électrique à partir d'une source d'alimentation électrique extérieure au circuit intégré, caractérisé en ce qu'il comprend deux broches (3a, 3b) respectivement positive et de masse faisant partie d'un deuxième système d'alimentation (3) électrique et assurant une connexion électrique auxiliaire du circuit intégré avec l'extérieur, le deuxième système d'alimentation étant en parallèle du premier système d'alimentation, le premier système d'alimentation étant ouvert quand le deuxième système d'alimentation est fermé et réciproquement.The subject of the present invention is an integrated circuit (1) comprising two terminals (2a, 2b) of respectively positive and ground power supply forming part of a first electrical power supply system (2) internal to the integrated circuit and ensuring its power supply from a power source external to the integrated circuit, characterized in that it comprises two pins (3a, 3b) respectively positive and ground forming part of a second power supply system (3) electrical and providing an auxiliary electrical connection of the integrated circuit with the outside, the second power supply being in parallel with the first power supply system, the first power supply being open when the second power supply system is closed and vice versa.

FR1650980A 2016-02-08 2016-02-08 INTEGRATED CIRCUIT WITH AUXILIARY POWER SUPPLY PINS Active FR3047633B1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR1650980A FR3047633B1 (en) 2016-02-08 2016-02-08 INTEGRATED CIRCUIT WITH AUXILIARY POWER SUPPLY PINS
US15/425,431 US10598725B2 (en) 2016-02-08 2017-02-06 Integrated circuit with auxiliary electrical power supply pins
CN201710066773.3A CN107046013B (en) 2016-02-08 2017-02-07 Integrated circuit with auxiliary power supply pin

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1650980 2016-02-08
FR1650980A FR3047633B1 (en) 2016-02-08 2016-02-08 INTEGRATED CIRCUIT WITH AUXILIARY POWER SUPPLY PINS

Publications (2)

Publication Number Publication Date
FR3047633A1 FR3047633A1 (en) 2017-08-11
FR3047633B1 true FR3047633B1 (en) 2019-03-22

Family

ID=55590074

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1650980A Active FR3047633B1 (en) 2016-02-08 2016-02-08 INTEGRATED CIRCUIT WITH AUXILIARY POWER SUPPLY PINS

Country Status (3)

Country Link
US (1) US10598725B2 (en)
CN (1) CN107046013B (en)
FR (1) FR3047633B1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11609832B2 (en) * 2019-10-04 2023-03-21 International Business Machines Corporation System and method for hardware component connectivity verification

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2577495B2 (en) * 1990-08-21 1997-01-29 株式会社東芝 Semiconductor evaluation circuit
JPH04283673A (en) * 1991-03-13 1992-10-08 Fujitsu Ltd Test mode setting circuit for lsi
JPH06309475A (en) * 1993-04-26 1994-11-04 Mitsubishi Electric Corp Semiconductor integrated circuit
US6657455B2 (en) * 2000-01-18 2003-12-02 Formfactor, Inc. Predictive, adaptive power supply for an integrated circuit under test
CN1181545C (en) 2001-03-26 2004-12-22 华邦电子股份有限公司 Gate blocking protector for integrated circuit with more power supplies and its method
JP2003187596A (en) * 2001-12-14 2003-07-04 Mitsubishi Electric Corp Semiconductor memory
DE10313872B3 (en) 2003-03-21 2004-06-09 Infineon Technologies Ag Integrated circuit with testing facility provided by test circuit performing test sequence for operative circuit of IC in response to test signal
US8704541B2 (en) 2011-12-01 2014-04-22 Nanya Technology Corporation Test method of driving apparatus and circuit testing interface thereof
EP3506370B1 (en) 2013-03-15 2023-12-20 Solaredge Technologies Ltd. Bypass mechanism
EP3104671B1 (en) * 2015-05-08 2018-07-18 Joylabz LLC Methods and systems for magnetic coupling

Also Published As

Publication number Publication date
CN107046013A (en) 2017-08-15
US10598725B2 (en) 2020-03-24
FR3047633A1 (en) 2017-08-11
CN107046013B (en) 2020-07-21
US20170227601A1 (en) 2017-08-10

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Owner name: CONTINENTAL AUTOMOTIVE GMBH, DE

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Effective date: 20220103

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