FR3038058B1 - Dispositif de mesure de topographie d'une surface d'un ensemble de systemes. - Google Patents
Dispositif de mesure de topographie d'une surface d'un ensemble de systemes. Download PDFInfo
- Publication number
- FR3038058B1 FR3038058B1 FR1555780A FR1555780A FR3038058B1 FR 3038058 B1 FR3038058 B1 FR 3038058B1 FR 1555780 A FR1555780 A FR 1555780A FR 1555780 A FR1555780 A FR 1555780A FR 3038058 B1 FR3038058 B1 FR 3038058B1
- Authority
- FR
- France
- Prior art keywords
- drawer
- enclosure
- guide
- systems
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
- G01B5/0009—Guiding surfaces; Arrangements compensating for non-linearity there-of
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/167—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by projecting a pattern on the object
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/02—Mechanical
- G01N2201/023—Controlling conditions in casing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Nonlinear Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Ce dispositif (1) comporte une enceinte, des moyens de chauffage infrarouge (8), des moyens de projection agencés pour projeter une lumière structurée à la surface de chaque système, des moyens de capture d'image agencés pour capturer la lumière structurée réfléchie par la surface de chaque système, le dispositif étant remarquable en ce qu'il comporte un tiroir (3) de chargement, des moyens de guidage agencés pour guider le tiroir (3) dans un plan de guidage (X, Y) entre une première position dans laquelle le tiroir (3) est situé hors de l'enceinte, et une deuxième position dans laquelle le tiroir (3) est situé à l'intérieur de l'enceinte, des moyens de déplacement motorisés (M1, M2) configurés pour déplacer une mire d'étalonnage des moyens de capture d'image suivant une direction perpendiculaire au plan de guidage (X, Y).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1555780A FR3038058B1 (fr) | 2015-06-23 | 2015-06-23 | Dispositif de mesure de topographie d'une surface d'un ensemble de systemes. |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1555780A FR3038058B1 (fr) | 2015-06-23 | 2015-06-23 | Dispositif de mesure de topographie d'une surface d'un ensemble de systemes. |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3038058A1 FR3038058A1 (fr) | 2016-12-30 |
FR3038058B1 true FR3038058B1 (fr) | 2020-08-07 |
Family
ID=53801087
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1555780A Active FR3038058B1 (fr) | 2015-06-23 | 2015-06-23 | Dispositif de mesure de topographie d'une surface d'un ensemble de systemes. |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR3038058B1 (fr) |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6564166B1 (en) * | 1999-10-27 | 2003-05-13 | Georgia Tech Research Corporation | Projection moiré method and apparatus for dynamic measuring of thermal induced warpage |
US20030148536A1 (en) * | 2002-02-04 | 2003-08-07 | Chi-Wang Liang | Chemiluminescence analyzer |
FR2870935A1 (fr) * | 2004-05-25 | 2005-12-02 | Insidix Sarl | Dispositif de mesure de deformations de surface |
US10281678B2 (en) * | 2013-01-04 | 2019-05-07 | Meso Scale Technologies, Llc | Assay apparatuses, methods and reagants |
-
2015
- 2015-06-23 FR FR1555780A patent/FR3038058B1/fr active Active
Also Published As
Publication number | Publication date |
---|---|
FR3038058A1 (fr) | 2016-12-30 |
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Legal Events
Date | Code | Title | Description |
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PLFP | Fee payment |
Year of fee payment: 2 |
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PLSC | Publication of the preliminary search report |
Effective date: 20161230 |
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PLFP | Fee payment |
Year of fee payment: 3 |
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Year of fee payment: 4 |
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Year of fee payment: 5 |
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PLFP | Fee payment |
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PLFP | Fee payment |
Year of fee payment: 9 |