FR3036492B1 - Systeme de mesure de la quantite de nano-cristaux semi-conducteurs presents dans un fluide - Google Patents

Systeme de mesure de la quantite de nano-cristaux semi-conducteurs presents dans un fluide

Info

Publication number
FR3036492B1
FR3036492B1 FR1554562A FR1554562A FR3036492B1 FR 3036492 B1 FR3036492 B1 FR 3036492B1 FR 1554562 A FR1554562 A FR 1554562A FR 1554562 A FR1554562 A FR 1554562A FR 3036492 B1 FR3036492 B1 FR 3036492B1
Authority
FR
France
Prior art keywords
fluid
measuring
semiconductor nano
crystals present
crystals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1554562A
Other languages
English (en)
Other versions
FR3036492A1 (fr
Inventor
Eric Lecolier
Patrick Gateau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IFP Energies Nouvelles IFPEN
Original Assignee
IFP Energies Nouvelles IFPEN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by IFP Energies Nouvelles IFPEN filed Critical IFP Energies Nouvelles IFPEN
Priority to FR1554562A priority Critical patent/FR3036492B1/fr
Priority to PCT/EP2016/060536 priority patent/WO2016184744A1/fr
Priority to EP16722191.0A priority patent/EP3298387A1/fr
Priority to US15/575,739 priority patent/US10495577B2/en
Publication of FR3036492A1 publication Critical patent/FR3036492A1/fr
Application granted granted Critical
Publication of FR3036492B1 publication Critical patent/FR3036492B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6489—Photoluminescence of semiconductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids

Landscapes

  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Optics & Photonics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
FR1554562A 2015-05-21 2015-05-21 Systeme de mesure de la quantite de nano-cristaux semi-conducteurs presents dans un fluide Expired - Fee Related FR3036492B1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR1554562A FR3036492B1 (fr) 2015-05-21 2015-05-21 Systeme de mesure de la quantite de nano-cristaux semi-conducteurs presents dans un fluide
PCT/EP2016/060536 WO2016184744A1 (fr) 2015-05-21 2016-05-11 Systeme de mesure de la quantite de nano-cristaux semi-conducteurs presents dans un fluide
EP16722191.0A EP3298387A1 (fr) 2015-05-21 2016-05-11 Systeme de mesure de la quantite de nano-cristaux semi-conducteurs presents dans un fluide
US15/575,739 US10495577B2 (en) 2015-05-21 2016-05-11 System for measuring the quantity of semiconductor nanocrystals present in a fluid

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1554562A FR3036492B1 (fr) 2015-05-21 2015-05-21 Systeme de mesure de la quantite de nano-cristaux semi-conducteurs presents dans un fluide

Publications (2)

Publication Number Publication Date
FR3036492A1 FR3036492A1 (fr) 2016-11-25
FR3036492B1 true FR3036492B1 (fr) 2017-05-12

Family

ID=53541812

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1554562A Expired - Fee Related FR3036492B1 (fr) 2015-05-21 2015-05-21 Systeme de mesure de la quantite de nano-cristaux semi-conducteurs presents dans un fluide

Country Status (4)

Country Link
US (1) US10495577B2 (fr)
EP (1) EP3298387A1 (fr)
FR (1) FR3036492B1 (fr)
WO (1) WO2016184744A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10260985B2 (en) * 2017-05-16 2019-04-16 Linde Aktiengesellschaft Methods for detecting leaks in liquid pipelines

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20010049101A1 (en) * 2000-02-23 2001-12-06 Brian Brogger Micro-label biological assay system
PL375252A1 (en) * 2002-09-06 2005-11-28 Chiron Corporation Methods for verifying fluid movement
US7767435B2 (en) * 2003-08-25 2010-08-03 University Of Washington Method and device for biochemical detection and analysis of subcellular compartments from a single cell
US20070185679A1 (en) * 2004-04-01 2007-08-09 Petruno Patrick T Indicating status of a diagnostic test system
US20060014175A1 (en) * 2004-05-17 2006-01-19 Imad Naasani Functionalized fluorescent nanocrystal detection system
NL1034253C2 (nl) * 2007-03-16 2008-09-17 Stichting Wetsus Ct Of Excelle Werkwijze, inrichting en systeem voor het meten en/of behandelen van in een vloeistof opgeloste verontreinigende componenten.
US8454895B2 (en) * 2007-05-03 2013-06-04 Nanyang Technological University Online contaminant detection and removal system
US8455845B2 (en) * 2010-08-23 2013-06-04 Saudi Arabian Oil Company Method for detecting drag reducer additives in gasoline
EP2661540A2 (fr) * 2011-01-06 2013-11-13 Halliburton Energy Services, Inc. Évaluation de contamination de fluide de formation de fond
JP6352805B2 (ja) * 2011-08-17 2018-07-04 バックマン・ラボラトリーズ・インターナショナル・インコーポレーテッドＢｕｃｋｍａｎ Ｌａｂｏｒａｔｏｒｉｅｓ Ｉｎｔｅｒｎａｔｉｏｎａｌ Ｉｎｃｏｒｐｏｒａｔｅｄ タグ付きポリマー、水処理組成物、及び水系システムにおけるそれらの使用方法
EP2769202A4 (fr) * 2011-10-20 2015-11-18 Exxonmobil Upstream Res Co Sondes de nanoparticule, procédés et systèmes pour utilisation de celles-ci
US20140260694A1 (en) * 2013-03-15 2014-09-18 Chevron U.S.A. Inc. Automated Tracer Sampling and Measurement System
EP2853884A1 (fr) * 2013-09-25 2015-04-01 Siemens Aktiengesellschaft Technique de détermination de métaux dans des échantillons de pétrole obtenus à partir d'huile de lubrification de machines
WO2016007758A1 (fr) * 2014-07-11 2016-01-14 Alcoa Inc. Système et procédés de traitement des eaux usées
US9715036B2 (en) * 2015-06-15 2017-07-25 Baker Hughes Incorporated Wellbores including carbon quantum dots, and methods of forming carbon quantum dots

Also Published As

Publication number Publication date
EP3298387A1 (fr) 2018-03-28
US20180292322A1 (en) 2018-10-11
WO2016184744A1 (fr) 2016-11-24
FR3036492A1 (fr) 2016-11-25
US10495577B2 (en) 2019-12-03

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