FR3032063B1 - CONFIGURED ELECTRONIC CIRCUIT FOR CALIBRATING SILICON PHOTOMULTIPLIERS PHOTONLY DETECTING DEVICE, PHOTON DETECTING DEVICE, CALIBRATION METHOD, AND CORRESPONDING COMPUTER PROGRAM. - Google Patents
CONFIGURED ELECTRONIC CIRCUIT FOR CALIBRATING SILICON PHOTOMULTIPLIERS PHOTONLY DETECTING DEVICE, PHOTON DETECTING DEVICE, CALIBRATION METHOD, AND CORRESPONDING COMPUTER PROGRAM. Download PDFInfo
- Publication number
- FR3032063B1 FR3032063B1 FR1550659A FR1550659A FR3032063B1 FR 3032063 B1 FR3032063 B1 FR 3032063B1 FR 1550659 A FR1550659 A FR 1550659A FR 1550659 A FR1550659 A FR 1550659A FR 3032063 B1 FR3032063 B1 FR 3032063B1
- Authority
- FR
- France
- Prior art keywords
- detecting device
- photonly
- computer program
- electronic circuit
- calibration method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title 1
- 238000004590 computer program Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 229910052710 silicon Inorganic materials 0.000 title 1
- 239000010703 silicon Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
- G01T7/005—Details of radiation-measuring instruments calibration techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/248—Silicon photomultipliers [SiPM], e.g. an avalanche photodiode [APD] array on a common Si substrate
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1550659A FR3032063B1 (en) | 2015-01-28 | 2015-01-28 | CONFIGURED ELECTRONIC CIRCUIT FOR CALIBRATING SILICON PHOTOMULTIPLIERS PHOTONLY DETECTING DEVICE, PHOTON DETECTING DEVICE, CALIBRATION METHOD, AND CORRESPONDING COMPUTER PROGRAM. |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1550659 | 2015-01-28 | ||
FR1550659A FR3032063B1 (en) | 2015-01-28 | 2015-01-28 | CONFIGURED ELECTRONIC CIRCUIT FOR CALIBRATING SILICON PHOTOMULTIPLIERS PHOTONLY DETECTING DEVICE, PHOTON DETECTING DEVICE, CALIBRATION METHOD, AND CORRESPONDING COMPUTER PROGRAM. |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3032063A1 FR3032063A1 (en) | 2016-07-29 |
FR3032063B1 true FR3032063B1 (en) | 2018-03-02 |
Family
ID=54014896
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1550659A Active FR3032063B1 (en) | 2015-01-28 | 2015-01-28 | CONFIGURED ELECTRONIC CIRCUIT FOR CALIBRATING SILICON PHOTOMULTIPLIERS PHOTONLY DETECTING DEVICE, PHOTON DETECTING DEVICE, CALIBRATION METHOD, AND CORRESPONDING COMPUTER PROGRAM. |
Country Status (1)
Country | Link |
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FR (1) | FR3032063B1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113848168A (en) * | 2021-07-15 | 2021-12-28 | 嘉兴凯实生物科技股份有限公司 | Nonlinear compensation method and compensation device for silicon photomultiplier in fluorescence detection |
CN114527822A (en) * | 2022-02-18 | 2022-05-24 | 上海联影微电子科技有限公司 | Voltage calibration equipment and method and imaging system |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8395127B1 (en) * | 2005-04-22 | 2013-03-12 | Koninklijke Philips Electronics N.V. | Digital silicon photomultiplier for TOF PET |
US8907290B2 (en) * | 2012-06-08 | 2014-12-09 | General Electric Company | Methods and systems for gain calibration of gamma ray detectors |
-
2015
- 2015-01-28 FR FR1550659A patent/FR3032063B1/en active Active
Also Published As
Publication number | Publication date |
---|---|
FR3032063A1 (en) | 2016-07-29 |
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