FR3023000B1 - METHOD AND SYSTEM FOR ANALYZING A DIFFRACTOMETRY OBJECT USING DIFFUSION SPECTRUM AND SPECTRUM IN TRANSMISSION - Google Patents

METHOD AND SYSTEM FOR ANALYZING A DIFFRACTOMETRY OBJECT USING DIFFUSION SPECTRUM AND SPECTRUM IN TRANSMISSION

Info

Publication number
FR3023000B1
FR3023000B1 FR1456186A FR1456186A FR3023000B1 FR 3023000 B1 FR3023000 B1 FR 3023000B1 FR 1456186 A FR1456186 A FR 1456186A FR 1456186 A FR1456186 A FR 1456186A FR 3023000 B1 FR3023000 B1 FR 3023000B1
Authority
FR
France
Prior art keywords
spectrum
diffractometry
analyzing
transmission
diffusion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1456186A
Other languages
French (fr)
Other versions
FR3023000A1 (en
Inventor
Caroline Paulus
Joachim Tabary
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA, Commissariat a lEnergie Atomique et aux Energies Alternatives CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR1456186A priority Critical patent/FR3023000B1/en
Priority to US15/322,611 priority patent/US10352882B2/en
Priority to JP2016575883A priority patent/JP6678602B2/en
Priority to EP15742349.2A priority patent/EP3161461B1/en
Priority to PCT/FR2015/051714 priority patent/WO2016001536A1/en
Publication of FR3023000A1 publication Critical patent/FR3023000A1/en
Application granted granted Critical
Publication of FR3023000B1 publication Critical patent/FR3023000B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/201—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/03—Investigating materials by wave or particle radiation by transmission
    • G01N2223/04—Investigating materials by wave or particle radiation by transmission and measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/045—Investigating materials by wave or particle radiation combination of at least 2 measurements (transmission and scatter)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
    • G01N2223/3037—Accessories, mechanical or electrical features calibrating, standardising standards (constitution)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/304—Accessories, mechanical or electrical features electric circuits, signal processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/316—Accessories, mechanical or electrical features collimators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
FR1456186A 2014-06-30 2014-06-30 METHOD AND SYSTEM FOR ANALYZING A DIFFRACTOMETRY OBJECT USING DIFFUSION SPECTRUM AND SPECTRUM IN TRANSMISSION Active FR3023000B1 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR1456186A FR3023000B1 (en) 2014-06-30 2014-06-30 METHOD AND SYSTEM FOR ANALYZING A DIFFRACTOMETRY OBJECT USING DIFFUSION SPECTRUM AND SPECTRUM IN TRANSMISSION
US15/322,611 US10352882B2 (en) 2014-06-30 2015-06-25 Method and system for analyzing an object by diffractometry using a scattering spectrum and a transmission spectrum
JP2016575883A JP6678602B2 (en) 2014-06-30 2015-06-25 Method and system for analyzing an object by diffraction using scattering and transmission spectra
EP15742349.2A EP3161461B1 (en) 2014-06-30 2015-06-25 Method and system for analysing an object by diffractometry using a scatter spectrum and a transmission spectrum
PCT/FR2015/051714 WO2016001536A1 (en) 2014-06-30 2015-06-25 Method and system for analysing an object by diffractometry using a scatter spectrum and a transmission spectrum

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1456186A FR3023000B1 (en) 2014-06-30 2014-06-30 METHOD AND SYSTEM FOR ANALYZING A DIFFRACTOMETRY OBJECT USING DIFFUSION SPECTRUM AND SPECTRUM IN TRANSMISSION

Publications (2)

Publication Number Publication Date
FR3023000A1 FR3023000A1 (en) 2016-01-01
FR3023000B1 true FR3023000B1 (en) 2016-07-29

Family

ID=51987205

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1456186A Active FR3023000B1 (en) 2014-06-30 2014-06-30 METHOD AND SYSTEM FOR ANALYZING A DIFFRACTOMETRY OBJECT USING DIFFUSION SPECTRUM AND SPECTRUM IN TRANSMISSION

Country Status (5)

Country Link
US (1) US10352882B2 (en)
EP (1) EP3161461B1 (en)
JP (1) JP6678602B2 (en)
FR (1) FR3023000B1 (en)
WO (1) WO2016001536A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3046241B1 (en) 2015-12-24 2018-01-26 Commissariat Energie Atomique METHOD FOR CALIBRATING AN X-DIFFRACTION ANALYSIS SYSTEM
FR3046240A1 (en) 2015-12-24 2017-06-30 Commissariat Energie Atomique METHOD OF ANALYZING AN OBJECT BY X DIFFRACTION
JP7221536B2 (en) * 2019-12-27 2023-02-14 株式会社リガク Scattering measurement analysis method, scattering measurement analysis apparatus, and scattering measurement analysis program

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0311177B1 (en) * 1987-10-05 1993-12-15 Philips Patentverwaltung GmbH System for examining a body with a radiance source
DE4101544A1 (en) * 1991-01-19 1992-07-23 Philips Patentverwaltung ROENTGENGERAET
US5428657A (en) * 1994-03-22 1995-06-27 Georgia Tech Research Corporation X-ray monitoring system
GB2297835A (en) * 1995-02-08 1996-08-14 Secr Defence Three dimensional detection of contraband using x rays
US5600700A (en) * 1995-09-25 1997-02-04 Vivid Technologies, Inc. Detecting explosives or other contraband by employing transmitted and scattered X-rays
US7092485B2 (en) * 2003-05-27 2006-08-15 Control Screening, Llc X-ray inspection system for detecting explosives and other contraband
US7366281B2 (en) * 2003-11-12 2008-04-29 Ge Invision Inc. System and method for detecting contraband
ATE385595T1 (en) * 2004-03-17 2008-02-15 Koninkl Philips Electronics Nv CORRECTION OF RADIATION HARDENING AND ATTENUATION IN COHERENT SCATTER COMPUTED TOMOGRAPHY (CSCT)
GB0500536D0 (en) * 2005-01-12 2005-02-16 Koninkl Philips Electronics Nv Coherent scatter computer tomography material identification
US7764764B2 (en) * 2007-12-28 2010-07-27 Morpho Detection, Inc. Method, a processor, and a system for identifying a substance
US20090168958A1 (en) * 2008-01-02 2009-07-02 Cristina Francesca Cozzini Apparatus and method for identifying components in a container
GB0823093D0 (en) * 2008-12-19 2009-01-28 Durham Scient Crystals Ltd Apparatus and method for characterisation of materials
CN102301226B (en) * 2009-01-27 2015-02-11 克罗梅克有限公司 Object prescanning when the object moves and subsequent local scanning when the object stays still
US7756249B1 (en) * 2009-02-19 2010-07-13 Morpho Detection, Inc. Compact multi-focus x-ray source, x-ray diffraction imaging system, and method for fabricating compact multi-focus x-ray source
US8582718B2 (en) * 2010-11-30 2013-11-12 Morpho Detection, Inc. Method and system for deriving molecular interference functions from XRD profiles
WO2013098520A1 (en) 2011-12-28 2013-07-04 Commissariat A L'energie Atomique Et Aux Energies Alternatives Method of analysing a sample of material by diffractometry and associated diffractometer
KR20170127412A (en) * 2015-01-16 2017-11-21 라피스캔 시스템스, 인코포레이티드 Non-invasive testing systems and methods for detection of substances of interest

Also Published As

Publication number Publication date
EP3161461A1 (en) 2017-05-03
EP3161461B1 (en) 2020-05-06
WO2016001536A1 (en) 2016-01-07
US10352882B2 (en) 2019-07-16
JP6678602B2 (en) 2020-04-08
US20170153189A1 (en) 2017-06-01
JP2017520771A (en) 2017-07-27
FR3023000A1 (en) 2016-01-01

Similar Documents

Publication Publication Date Title
SG11201506229RA (en) Image analysis device, image analysis system, and image analysis method
HK1211452A1 (en) Image analysis device, image analysis method, and image analysis program
FR3022049B1 (en) METHOD FOR ANALYZING A DYNAMIC SCENE, ANALYSIS MODULE AND COMPUTER PROGRAM THEREOF
EP2948882A4 (en) Method and system for visualizing and analyzing a field area network
EP2838228A4 (en) Alarm correlation analysis method, apparatus, and system
GB2550631B (en) Analysis device and analysis method
EP2980755A4 (en) Method for partitioning area, and inspection device
FR3039023B1 (en) DEVICE AND METHOD FOR OPERATING A SYSTEM
GB201511334D0 (en) A method, apparatus, computer and system for image analysis
FR3016449B1 (en) AIRCRAFT AIRCRAFT GUIDING METHOD, COMPUTER PROGRAM, AND DEVICE THEREOF
BR112016022539A2 (en) method and apparatus for image collection.
EP2963552A4 (en) System analysis device and system analysis method
FR3016220B1 (en) SYSTEM AND METHOD FOR LOCATING AN OBJECT
BR112018007035A2 (en) exhaust collection apparatus
FR3009387B1 (en) METHOD AND DEVICE FOR ANALYZING A BIOLOGICAL SAMPLE
FR3029173B1 (en) DEVICE AND METHOD FOR UNLOCKING A FEEDING DEVICE
FR3022715B1 (en) METHOD AND SYSTEM FOR ACCOUSTIC COMMUNICATIONS
FR3023000B1 (en) METHOD AND SYSTEM FOR ANALYZING A DIFFRACTOMETRY OBJECT USING DIFFUSION SPECTRUM AND SPECTRUM IN TRANSMISSION
FR3044245B1 (en) METHOD AND DEVICE FOR OPTICALLY ANALYZING CITRUS BY DIFFUSION / TRANSMISSION
FR3036527B1 (en) DEVICE, SYSTEM AND METHOD FOR DEMATERIALIZING CHARGERS
SG11201607752QA (en) Analysis device and analysis method
FR3028695B1 (en) SYSTEM AND METHOD FOR BIDIRECTIONAL AND SIMULTANEOUS COMMUNICATION.
EP3065387A4 (en) Method and device for achieving matching between acquisition system and analysis system
FR3016103B1 (en) RADIO SPECTRUM SHARING METHOD AND SYSTEM
ZA201803323B (en) Systems and methods for tax collection, analysis and compliance

Legal Events

Date Code Title Description
PLFP Fee payment

Year of fee payment: 2

PLSC Publication of the preliminary search report

Effective date: 20160101

PLFP Fee payment

Year of fee payment: 3

PLFP Fee payment

Year of fee payment: 4

PLFP Fee payment

Year of fee payment: 5

PLFP Fee payment

Year of fee payment: 7

PLFP Fee payment

Year of fee payment: 8

PLFP Fee payment

Year of fee payment: 9

PLFP Fee payment

Year of fee payment: 10