FR2965932B1 - Procede de caracterisation de defaut electrique affectant un circuit electronique, dispositif associe et support d'enregistrement d'informations. - Google Patents

Procede de caracterisation de defaut electrique affectant un circuit electronique, dispositif associe et support d'enregistrement d'informations.

Info

Publication number
FR2965932B1
FR2965932B1 FR1058224A FR1058224A FR2965932B1 FR 2965932 B1 FR2965932 B1 FR 2965932B1 FR 1058224 A FR1058224 A FR 1058224A FR 1058224 A FR1058224 A FR 1058224A FR 2965932 B1 FR2965932 B1 FR 2965932B1
Authority
FR
France
Prior art keywords
current
characterizing
recording medium
information recording
electronic circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1058224A
Other languages
English (en)
Other versions
FR2965932A1 (fr
Inventor
Fulvio Infante
Philippe Perdu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National dEtudes Spatiales CNES
Original Assignee
Centre National dEtudes Spatiales CNES
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National dEtudes Spatiales CNES filed Critical Centre National dEtudes Spatiales CNES
Priority to FR1058224A priority Critical patent/FR2965932B1/fr
Priority to US13/270,064 priority patent/US20120116734A1/en
Publication of FR2965932A1 publication Critical patent/FR2965932A1/fr
Application granted granted Critical
Publication of FR2965932B1 publication Critical patent/FR2965932B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/315—Contactless testing by inductive methods

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Recording Or Reproducing By Magnetic Means (AREA)
  • Television Signal Processing For Recording (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

Ce procédé consiste à réaliser une cartographie réelle (C_0) du champ magnétique rayonné par le circuit placé dans un état de fonctionnement prédéterminé. Il comporte les étapes consistant à : a) appliquer (170) une transformation (T_j) à une hypothèse initiale sur la nature du défaut, pour obtenir une hypothèse courante (Hyp_i) ; b) superposer (180) l'hypothèse courante à une topologie initiale (S_0) du circuit pour obtenir une topologie courante (S_i) ; c) simuler (190), le champ magnétique généré par la topologie courante, de manière à obtenir une cartographie courante (C_i) ; d) estimer (200) la valeur courante (Corr_i) d'une fonction de corrélation entre la cartographie réelle et la cartographie courante ; et, e) itérer les étapes a) à d) pour rechercher un maximum de la fonction de corrélation en modifiant la valeur d'un paramètre caractéristique du défaut.
FR1058224A 2010-10-11 2010-10-11 Procede de caracterisation de defaut electrique affectant un circuit electronique, dispositif associe et support d'enregistrement d'informations. Active FR2965932B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR1058224A FR2965932B1 (fr) 2010-10-11 2010-10-11 Procede de caracterisation de defaut electrique affectant un circuit electronique, dispositif associe et support d'enregistrement d'informations.
US13/270,064 US20120116734A1 (en) 2010-10-11 2011-10-10 Method of characterizing an electrical defect affecting an electronic circuit, related device and information recording medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1058224A FR2965932B1 (fr) 2010-10-11 2010-10-11 Procede de caracterisation de defaut electrique affectant un circuit electronique, dispositif associe et support d'enregistrement d'informations.

Publications (2)

Publication Number Publication Date
FR2965932A1 FR2965932A1 (fr) 2012-04-13
FR2965932B1 true FR2965932B1 (fr) 2014-04-11

Family

ID=44171117

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1058224A Active FR2965932B1 (fr) 2010-10-11 2010-10-11 Procede de caracterisation de defaut electrique affectant un circuit electronique, dispositif associe et support d'enregistrement d'informations.

Country Status (2)

Country Link
US (1) US20120116734A1 (fr)
FR (1) FR2965932B1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109992926B (zh) * 2019-04-23 2021-02-05 清华大学 轴承外圈缺陷角位置量化评估方法
US11372981B2 (en) 2020-01-09 2022-06-28 Rockwell Collins, Inc. Profile-based monitoring for dual redundant systems

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1151314A4 (fr) * 1998-10-05 2010-01-13 Univ Maryland Imagerie utilisant le masquage et le filtrage de frequence spatiale
US7019521B2 (en) * 2003-09-15 2006-03-28 Neocera, Inc. Fault isolation of circuit defects using comparative magnetic field imaging
US7262597B2 (en) * 2003-09-15 2007-08-28 Neocera, Llc Hybrid squid microscope with magnetic flux-guide for high resolution magnetic and current imaging by direct magnetic field sensing
FR2933200B1 (fr) * 2008-06-25 2010-09-10 Centre Nat Etd Spatiales Procede et machine de test multidimensionnel d'un dispositif electronique a partir d'une sonde monodirectionnelle

Also Published As

Publication number Publication date
US20120116734A1 (en) 2012-05-10
FR2965932A1 (fr) 2012-04-13

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