FR2965929B1 - Microscope optique en champ proche - Google Patents

Microscope optique en champ proche

Info

Publication number
FR2965929B1
FR2965929B1 FR1058163A FR1058163A FR2965929B1 FR 2965929 B1 FR2965929 B1 FR 2965929B1 FR 1058163 A FR1058163 A FR 1058163A FR 1058163 A FR1058163 A FR 1058163A FR 2965929 B1 FR2965929 B1 FR 2965929B1
Authority
FR
France
Prior art keywords
near field
optic microscope
optic
microscope
field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1058163A
Other languages
English (en)
Other versions
FR2965929A1 (fr
Inventor
Benoit Cluzel
Jean Dellinger
Fornel Frederique De
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Universite de Bourgogne
Original Assignee
Centre National de la Recherche Scientifique CNRS
Universite de Bourgogne
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS, Universite de Bourgogne filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR1058163A priority Critical patent/FR2965929B1/fr
Priority to PCT/FR2011/052348 priority patent/WO2012045986A1/fr
Publication of FR2965929A1 publication Critical patent/FR2965929A1/fr
Application granted granted Critical
Publication of FR2965929B1 publication Critical patent/FR2965929B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22Probes, their manufacture, or their related instrumentation, e.g. holders
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/02Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
    • G01Q30/025Optical microscopes coupled with SPM
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G02B17/0605Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors
    • G02B17/061Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors on-axis systems with at least one of the mirrors having a central aperture
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Length Measuring Devices By Optical Means (AREA)
FR1058163A 2010-10-07 2010-10-07 Microscope optique en champ proche Expired - Fee Related FR2965929B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR1058163A FR2965929B1 (fr) 2010-10-07 2010-10-07 Microscope optique en champ proche
PCT/FR2011/052348 WO2012045986A1 (fr) 2010-10-07 2011-10-07 Microscope optique en champ proche

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1058163A FR2965929B1 (fr) 2010-10-07 2010-10-07 Microscope optique en champ proche

Publications (2)

Publication Number Publication Date
FR2965929A1 FR2965929A1 (fr) 2012-04-13
FR2965929B1 true FR2965929B1 (fr) 2012-12-14

Family

ID=43425829

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1058163A Expired - Fee Related FR2965929B1 (fr) 2010-10-07 2010-10-07 Microscope optique en champ proche

Country Status (2)

Country Link
FR (1) FR2965929B1 (fr)
WO (1) WO2012045986A1 (fr)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5473157A (en) * 1994-03-22 1995-12-05 At&T Corp. Variable temperature near-field optical microscope
EP0864846A3 (fr) * 1997-03-12 2000-12-13 Haines, Miles, Dr. Sonde-microscope de balayage.
DE19947287C2 (de) * 1999-09-30 2003-01-30 Surface Imaging Systems Gmbh Nahfeldmikroskop
DE10226801B4 (de) * 2002-06-15 2005-03-31 Bundesrepublik Deutschland, vertr. d. d. Bundesministerium für Wirtschaft und Arbeit, dieses vertr. d. d. Präsidenten der Physikalisch-Technischen Bundesanstalt Oberflächenmessvorrichtung und Verfahren zur mechanischen sowie berührungslosen-optischen Untersuchung von Objektoberflächen

Also Published As

Publication number Publication date
WO2012045986A1 (fr) 2012-04-12
FR2965929A1 (fr) 2012-04-13

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20140630