FR2959825B1 - METHOD AND DEVICE FOR CHARACTERIZING OR MEASURING A CAPACITY - Google Patents

METHOD AND DEVICE FOR CHARACTERIZING OR MEASURING A CAPACITY

Info

Publication number
FR2959825B1
FR2959825B1 FR1001964A FR1001964A FR2959825B1 FR 2959825 B1 FR2959825 B1 FR 2959825B1 FR 1001964 A FR1001964 A FR 1001964A FR 1001964 A FR1001964 A FR 1001964A FR 2959825 B1 FR2959825 B1 FR 2959825B1
Authority
FR
France
Prior art keywords
characterizing
capacity
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1001964A
Other languages
French (fr)
Other versions
FR2959825A1 (en
Inventor
Rosa Francesco La
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Rousset SAS
Original Assignee
STMicroelectronics Rousset SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Rousset SAS filed Critical STMicroelectronics Rousset SAS
Priority to FR1001964A priority Critical patent/FR2959825B1/en
Priority to PCT/FR2011/050578 priority patent/WO2011138529A1/en
Priority to PCT/FR2011/050579 priority patent/WO2011138530A1/en
Publication of FR2959825A1 publication Critical patent/FR2959825A1/en
Application granted granted Critical
Publication of FR2959825B1 publication Critical patent/FR2959825B1/en
Priority to US13/669,741 priority patent/US9506964B2/en
Priority to US13/669,732 priority patent/US9091713B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0416—Control or interface arrangements specially adapted for digitisers
    • G06F3/04166—Details of scanning methods, e.g. sampling time, grouping of sub areas or time sharing with display driving
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Human Computer Interaction (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
FR1001964A 2010-05-07 2010-05-07 METHOD AND DEVICE FOR CHARACTERIZING OR MEASURING A CAPACITY Expired - Fee Related FR2959825B1 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR1001964A FR2959825B1 (en) 2010-05-07 2010-05-07 METHOD AND DEVICE FOR CHARACTERIZING OR MEASURING A CAPACITY
PCT/FR2011/050578 WO2011138529A1 (en) 2010-05-07 2011-03-21 Method and device for characterizing or measuring a capacitor
PCT/FR2011/050579 WO2011138530A1 (en) 2010-05-07 2011-03-21 Method and device for characterizing or measuring a floating capacitor
US13/669,741 US9506964B2 (en) 2010-05-07 2012-11-06 Method and device for characterizing or measuring a floating capacitance
US13/669,732 US9091713B2 (en) 2010-05-07 2012-11-06 Method and device for characterizing or measuring a capacitance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1001964A FR2959825B1 (en) 2010-05-07 2010-05-07 METHOD AND DEVICE FOR CHARACTERIZING OR MEASURING A CAPACITY

Publications (2)

Publication Number Publication Date
FR2959825A1 FR2959825A1 (en) 2011-11-11
FR2959825B1 true FR2959825B1 (en) 2012-06-01

Family

ID=43434610

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1001964A Expired - Fee Related FR2959825B1 (en) 2010-05-07 2010-05-07 METHOD AND DEVICE FOR CHARACTERIZING OR MEASURING A CAPACITY

Country Status (1)

Country Link
FR (1) FR2959825B1 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10001129A1 (en) * 2000-01-13 2001-07-26 Infineon Technologies Ag Circuit for measuring capacitances of structures in an IC enables voltage-dependent, differential capacitance measurement - has test and reference structures connected to junctions of series transistors in parallel circuits connected between poles of controllable voltage supply
JP4257823B2 (en) * 2002-05-27 2009-04-22 パナソニック株式会社 Semiconductor device and capacitance measuring method
KR100834743B1 (en) * 2006-12-21 2008-06-05 삼성전자주식회사 Capacitance measurement circuit and capacitance measurement method thereof

Also Published As

Publication number Publication date
FR2959825A1 (en) 2011-11-11

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20150130